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Achievements

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Title: Achievements


1
Achievements Perspectives of MIMOSA Sensors
(MAPS) for Vertexing ApplicationsChristine
Hu-Guo (IPHC)on behalf of IPHC (Strasbourg)
IRFU (Saclay) collaboration
  • Outline
  • Achieved MAPS (Monolithic Active Pixel Sensors)
    performances
  • RD for improving MAPS performances
  • Increase readout speed ? Fast readout
    architecture
  • Applications and perspectives
  • Improve radiation tolerance
  • Projection beyond present (2D sensors)
    perspectives
  • Conclusion

2
Development of MAPS for Charged Particle Tracking
  • In 1999, the IPHC CMOS sensor group proposed the
    first CMOS pixel sensor (MAPS) for future vertex
    detectors (ILC)
  • Numerous other applications of MAPS have emerged
    since then
  • 10-15 HEP groups in the USA Europe are
    presently active in MAPS RD
  • Original aspect integrate sensitive volume (EPI
    layer) and front-end readout electronics on the
    same substrate
  • Charge created in EPI, excess carries propagate
    thermally, collected by NWELL/PEPI , with help
    of reflection on boundaries with P-well and
    substrate (high doping)
  • Q 80 e-h / µm ? signal lt 1000 e-
  • Compact, flexible
  • EPI layer 1015 µm thick
  • thinning to 3040 µm permitted
  • Standard CMOS fabrication technology
  • Cheap, fast multi-project run turn-around
  • Room temperature operation
  • Attractive balance between granularity, material
    budget, radiation tolerance, read out speed and
    power dissipation
  • BUT
  • Very thin sensitive volume ? impacts signal
    magnitude (mV!)
  • Sensitive volume almost un-depleted ? impacts
    radiation tolerance speed
  • Commercial fabrication (parameters) ? impacts
    sensing performances radiation tolerance

R.T.
3
Achieved Performances with Analogue Readout
  • MAPS provide excellent tracking performances
  • Detection efficiency 100
  • ENC 10-15 e-
  • S/N gt 20-30 (MPV) at room temperature
  • Single point resolution µm, a function of pixel
    pitch
  • 1 µm (10 µm pitch), 3 µm (40 µm pitch)

4
Radiation tolerance (preliminary)
  • Ionising radiation tolerance
  • O(1 M Rad) (MIMOSA15, test cond. 5 GeV e-, T
    -20C, tint180 µs)
  • tint ltlt 1 ms, crucial at room temperature
  • Non ionising radiation tolerance depends on
    pixel pitch
  • 20 µm pitch 2x1012 neq /cm2 , (Mimosa15, tested
    on DESY e- beams, T - 20C, tint 700 µs)
  • 5.81012neq/cm² values derived with standard and
    with soft cuts
  • 10 µm pitch 1013 neq /cm2 , (MIMOSA18, tested at
    CERN-SPS , T - 20C, tint 3 ms)
  • parasitic 12 kGy gas ? N ?
  • Further studies needed
  • Tolerance vs diode size, Readout speed, Digital
    output, ... , Annealing ??

Integ. Dose Noise S/N (MPV) Detection Efficiency
0 9.0 1.1 27.8 0.5 100
1 Mrad 10.7 0.9 19.5 0.2 99.96 0.04
Fluence (1012neq/cm²) 0 0.47 2.1 5.8 (5/2) 5.8 (4/2)
S/N (MPV) 27.8 0.5 21.8 0.5 14.7 0.3 8.7 2. 7.5 2.
Det. Efficiency () 100. 99.9 0.1 99.3 0.2 77. 2. 84. 2.
Fluence (1012neq/cm²) 0 6 10
Q cluster (e-) 1026 680 560
S/N (MPV) 28.5 0.2 20.4 0.2 14.7 0.2
Det. Efficiency () 99.93 0.03 99.85 0.05 99.5 0.1
5
System integration
  • Industrial thinning (via STAR collaboration at
    LBNL)
  • 50 µm, expected to 30-40 µm
  • Ex. MIMOSA18 (5.55.5 mm² thinned to 50 µm)
  • Development of ladder equipped with MIMOSA chips
    (coll. with LBNL)
  • STAR ladder (lt 0.3 X0 ) ? ILC (lt0.2 X0 )
  • Edgeless dicing / stitching ? alleviate material
    budget of flex cable

6
MAPS performance Improvement
RD organisation 4 (5) simultaneous prototyping
lines
  • ?Architecture of pixel array organised in //
    columns read out
  • Pre-amp and CDS in each pixel
  • A/D 1 discriminator / column (offset
    compensation)
  • Power vs Speed
  • Power ? Readout in a rolling shutter mode
  • Speed ? Pixels belonging to the same row are read
    out simultaneously
  • MIMOSA8 (2004), MIMOSA16 (2006), MIMOSA22
    (2007/08)
  • ?Zero suppression circuit
  • Reduce the raw data flow of MAPS
  • Data compression factor ranging from 10 to 1000,
    depending on the hit density per frame
  • SUZE-01 (2007)
  • ?45 bits ADCs (103 ADC per sensor)
  • Potentially replacing column-leveldiscriminators
  • 5 bits ?sp 1.71.6 µm 4 bits ?sp lt 2 µm for
    20 µm pitch
  • Next step integrate column-level ADC with pixel
    array
  • ?Serial link transmission with clock recovery
  • Prototype (2008-2009)

?Voltage regulator DC-DC converter
7
MIMOSA22 SUZE-01 Test Results
  • MIMOSA22 (15 µm EPI) 136 x 576 pixels 128
    column-level discriminators
  • SUZE-01
  • Lab. test
  • Laboratory test
  • Temporal Noise 0.64 mV ? 12 e-
  • FPN 0.22 mV ? 4 e-
  • Beam test at CERN SPS (120 GeV pions)
  • Threshold 4 mV ? 6 x s noise
  • Detection Efficiency gt 99.5
  • Single point resolution lt 4 µm
  • Fake rate lt 10-4

8
MIMOSA26 1st MAPS with Integrated Ø
CMOS 0.35 µm OPTO technology, Chip size 13.7 x
21.5 mm2
  • Pixel array 576 x 1152, pitch 18.4 µm
  • Active area 10.6 x 21.2 mm2
  • In each pixel
  • Amplification
  • CDS (Correlated Double Sampling)
  • Integration time 100 µs
  • ? R.O. speed 10 k frames/s
  • Hit density 106 particles/cm²/s
  • Testability several test points implemented all
    along readout path
  • Pixels out (analogue)
  • Discriminators
  • Zero suppression
  • Signal transmission
  • Row sequencer
  • Width 350 µm
  • 1152 column-level discriminators
  • offset compensated high gain preamplifier
    followedby latch
  • Zero suppression logic
  • Reference Voltages Buffering for 1152
    discriminators
  • I/O PadsPower supply PadsCircuit control
    PadsLVDS Tx Rx
  • Memory management
  • Memory IP blocks
  • Readout controller
  • JTAG controller
  • Current Ref.
  • Bias DACs
  • PLL, 8b/10b optional

9
Test MIMOSA26 (Lab. beam test)
  • Measured temporal noise 0.6-0.7 mV and FPN
    0.3-0.4 mV for pixel array with its associated
    discriminators.
  • These values are equivalent to those obtained
    with Mimosa22.
  • It shows a good uniformity of the whole 576 x
    1152 pixels with the 1152 discriminators
  • 30 MIMOSA26 chips are tested (only 1 "dead")
  • The characterization of Mimosa26 is complemented
    by the beam tests (Sept. 2009)
  • 6 MIMOSA26 chips running simultaneously at
    nominal speed
  • Tracking successful
  • data analysis is underway, preliminary results
    show similar performances as MIMOSA22

10
MIMOSA26 Final Sensor for EUDET Beam Telescope
  • EUDET supported by the European Union in the 6th
    Framework Programme
  • Provide to the scientific community an
    infrastructure aiming to support the detector RD
    for the ILC
  • JRA1 (Joint Research Activity) High resolution
    pixel beam telescope (BT)
  • Two arms each equipped with three layers of pixel
    sensors (MIMOSA)
  • DUT is located between these arms and moveable
    via X-Y table
  • EUDET beam telescope specifications
  • High extrapolated resolution lt 2 µm
  • Large sensor area 2 cm2
  • High read-out speed 10 k frame/s
  • Hit density up to 106 hits/s/cm2

Pixel Sensor
MIMOSA26
13.7 mm
(DUT)
21.5 mm
Being Mounted on EUDET beam telescope
  • Preliminary test results from the EUDET
    collaboration
  • 3 MIMOSA26 chips mounted as DUT in BT
    demonstrator in July
  • BT tracks reconstructed in the 3 planes ?
    residues compatible with ssp 3.5-4 µm

11
Extension of MIMOSA-26 to STAR
  • Final HFT (Heavy Flavour Tracker) - PIXEL sensor
  • MIMOSA-26 with active surface 1.7
  • 1088 col. of 1024 pixels ? 1.1 million pixels
  • Pitch 18.4 µm ? (20.0 x 18.8 mm²)
  • Integration time 200 µs
  • Design from now ? fab. Feb. 2010
  • 1st physics data expected in 2011/12
  • Critical points
  • Reduction of power consumption
  • Radiation tolerance improvement
  • Also
  • Integrated voltage reference
  • High speed transmission

Pixel Vx Detector
22.4 mm
Inner Layer 10 ladders
Outer Layer 30 ladders 10 sensors / ladder
20.4 mm
STAR Detector Upgrade
12
Extension of MIMOSA-26 to CBM/FAIR ILC
  • Micro Vertex Detector (MVD) of the CBM H.I. fixed
    target expt
  • 2 double-sided stations equipped with MIMOSA
    sensors
  • MIMOSA-26 with double-sided read-out ? readout
    speed !
  • Active surface 2 x 1152 columns of 256 pixels
  • 21.2 x 9.4 mm2
  • tint. 40 µs
  • lt 25 µs in lt 0.18 µm techno.
  • Prototyping until 2012 ? start of physics in
    2013/14 (?)
  • Vertex detector of the ILC
  • tint. 25 µs (innermost layer) ? double-sided
    readout
  • tint. 100 µs (outer layer) ? Single-sided
    readout
  • 2 µm (4-bit ADC, 20 µm) lt ?sp lt 3 µm (discri. 14
    µm pitch)
  • Pdiss lt 0.11 W/cm² 1/50 duty cycle

ILD design 2 options
  • Critical points
  • Power pulsing
  • Design for the innermost layer
  • Small pixel pitch
  • Faster readout speed

3 double layers
5 single layers
13
Radiation Tolerance Improvement
  • Ionising radiation tolerance 1. Special layout
  • Diode level (already realized) Remove thick
    oxide surrounding N-well diode by replacing with
    thin-oxide? without design rule violation!!
  • Pixel circuit level ELT for the transistors
    connected to the detection diode
  • 2. Minimise integration time ? Increase readout
    speed
  • Minimise leakage current

14
Radiation Tolerance Improvement
  • Non ionising radiation toleranceHigh resistivity
    sensitive volume ? faster charge collection
  • Exploration of a VDSM technology with depleted
    (partially 30 µm) substrate
  • Project "LePix" driven by CERN for SLHC trackers
    (attractive for CBM, ILC and CLIC Vx Det.)
  • Exploration of a technology with high resistivity
    thin epitaxial layer
  • XFAB 0.6 µm techno 15 µm EPI (? O(103)?.cm),
    Vdd 5 V (MIMOSA25)
  • ? Benefit from the need of industry for
    improvement of the photo-sensing elements
    embedded into CMOS chip

TCAD Simulation 15 µm high resistivity EPI
compared to 15 µm standard EPI
For comparison standard CMOS technology, low
resistivity P-epi
high resistivity P-epi size of depletion zone
size is comparable to the P-epi thickness!
15
MIMOSA25 in a high resistivity epitaxial layer
MIMOSA25
saturation -gt gt90 of charge is collected is 3
pixels -gt very low charge spread for depleted
substrate
16x96 Pitch 20µm
To compare standard non-depleted EPI
substrate MIMOSA15 Pitch20µm, before and after
5.8x1012 neq/cm2
  • 20 µm pitch, 20C, self-bias diode _at_ 4.5 V, 160
    µs read-out time
  • Fluence (0.3 / 1.3 / 3)1013 neq/cm2
  • Tolerance improved by gt 1 order of mag.
  • Need to confirm ?det (uniformity !) with beam
    tests

16
Using 3DIT to improve MAPS performances
  • 3DIT are expected to be particularly beneficial
    for MAPS
  • Combine different fabrication processes
  • Resorb most limitations specific to 2D MAPS
  • Split signal collection and processing
    functionalities, use best suited technology for
    each Tier
  • Tier-1 charge collection system ? Epitaxy
    (depleted or not), deep N-well ? ? ultra thin
    layer? X0 ?
  • Tier-2 analogue signal processing? analogue, low
    Ileak, process (number of metal layers)
  • Tier-3 mixed and digital signal processing
  • Tier-4 data formatting (electro-optical
    conversion ?)
  • Run in Chartered - Tezzaron technology
  • 130 nm, 2-Tier run with "high"-res substrate
    (allows m.i.p. detection)
  • Tier A to tier B bond? Cu-Cu bond
  • 3 D consortium coordinated by FermiLab
  • FermiLab
  • INFN
  • IN2P3-IRFU
  • Univ. of Bonn
  • CMP

17
IPHC IRFU 3D MAPS
  • Delayed R.O. Architecture for the ILC Vertex
    Detector
  • Try 3D architecture based on small pixel pitch,
    motivated by
  • Single point resolution lt 3 µm with binary output
  • Probability of gt 1 hit per train ltlt 10
  • 12 µm pitch
  • ?sp 2.5 µm
  • Probability of gt 1 hit/train lt 5
  • Split signal collection and processing
    functionalities
  • Tier-1 A sensing diode amplifier, B shaper
    discriminator
  • Tier-2 time stamp (5 bits) overflow bit
    delayed readout
  • ? Architecture prepares for 3-Tier perspectives
    12 µm
  • Tier-1 CMOS process adapted to charge collection
  • Tier-2 CMOS process adapted to analogue mixed
    signal processing
  • Tier-3 digital process (ltlt 100 nm ????)

18
IPHC 3D MAPS Self Triggering Pixel Strip-like
Tracker (STriPSeT)
  • Combine Tezzaron/Chartered 2-tiers process with
    XFAB high resistivity EPI process
  • Tier-1 XFAB, 15 µm depleted epitaxy ? ultra thin
    sensor!!!
  • Fully depleted ? Fast charge collection (5ns) ?
    should be radiation tolerant
  • For small pitch, charge contained in less than
    two pixels
  • Sufficient (rather good) S/N ratio defined by the
    first stage
  • charge amplification ( gtx10) by capacitive
    coupling to the second stage
  • Tier-2 Shaperless front-end (Pavia Bergamo)
  • Single stage, high gain, folded cascode based
    charge amplifier, with a current source in the
    feedback loop ? Shaping time of 200 ns very
    convenient good time resolution
  • Low offset, continuous discriminator
  • Tier-3 Digital Data driven (self-triggering),
    sparsified binary readout, X and Y projection of
    hit pixels pattern
  • Matrix 256x256 ? 2 µs readout time
  • DBI Direct Bond Interconnect, low temperature
    CMOS compatible direct oxide bonding with
    scalable interconnect for highest density 3D
    interconnections (lt 1 µm Pitch, gt 108/cm /cm²
    Possible)

19
IRFU IPHC 3D MAPS RSBPix
  • FAST R.O. architecture aiming to minimise power
    consumption
  • Subdivide sensitive area in small matrices
    running INDIVIDUALLY in rolling shutter mode
  • Adapt the number of raws to required frame r.o.
    time
  • ? few µs r.o. time may be reached (???)
  • Planned also to connect this 2 tier circuit to
    XFAB detector tier

20
Conclusion
  • 2D MAPS have reached necessary prototyping
    maturity for real scale applications
  • Beam telescopes allowing for ?sp few µm 106
    particles/cm²/s
  • Vertex detectors requiring high resolution very
    low material budget
  • The emergence of fabrication processes with
    depleted epitaxy / substrate opens the door to
  • Substantial improvements in read-out speed and
    non-ionising radiation tolerance
  • "Large pitch" applications ? trackers (e.g. Super
    LHC )
  • Translation to 3D integration technology
  • Resorb most limitations specific to 2D MAPS
  • T type density, peripheral insensitive zone,
    combination of different CMOS processes
  • Offer an improved read-out speed O(µs) !
  • Many difficulties to overcome (ex. heat, power)
  • RD in progress ? 2009/10 important step for
    validation of this promising technology
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