Title: Robert F. Hodson, NASA LaRC
1Actel Compact PCI Signal Integrityfor RTSXS
SXA devices
- Robert F. Hodson, NASA LaRC
- Kevin Somervill, NASA LaRC
- Mark Jones, NASA LaRC
- Guy Gibson, Northrop Grumman
2Initial simulations
These initial simulation performed by Northrop
Grumman raised questions and concerns that
prompted this study.
3Actel Datasheet info (continued)
4Datasheet info (continued)
What about 3.3V operation?
5Datasheet info (continued)
6Datasheet info (continued)
7PCI Specifications
- PCI and Compact PCI designed for commercial
systems - Puts the onus on manufacturers to tolerate a
broad range of operating conditions - The following should be use to evaluate long term
device reliability
Appears to contradict the maximum ratings of
Actels devices
8cPCI Driver Simulations
- The following slides show HyperLynx simulations
performed at NASA LaRC to simulate an Actel
device (in slot 3) driving another Actel device
(in slot 7). - 3.3V PCI I/O is used
- 20 degrees C
- The simulation is done for both the RTSXS devices
and SXA commercial devices - Simulations with Spartan and Vertex II IBIS
models are also shown for comparison.
9HyperLynx Schematic
10RTSXS Model slot 3 driving slot 7
Note datasheet maximums exceeded
11Non-monotonic signal in transition region
12Sxacom Model slot 3 driving slot 7
Note datasheet maximums exceeded
13Spartan model slot 3 driving slot 7
Note similar undershoot, cleaner signal.
14Vertex II slot 3 driving slot 7
15Lab Test Setup
- Actel source board (Actel 3.3V PCI I/O) in slot 3
- A54SX32A device with Actel PCI core
- Actel destination board (Actel 3.3V PCI I/O) in
slot 7 - A54SX32A device with Actel PCI core
- Commercial PCI bus
- Commercial processor board in slot 1
- 33 MHz operation
16Data line showing under/overshhoot
17Non-Monotonic signal at receiver
18Actel Responses 8/18/04
- Actel has performed experiments on the PCI clamp
diodes of the RTSXS device. - In the 3.3V PCI configuration, the Power Clamp
diode effectively clamps any incoming voltage (up
to 7.1V) to about 4.6V. This is within Actels
maximum rating (5.75V). - The Ground Clamp diode clamps any incoming
undershoot (up to -3.5V) to 1.2V. This clamped
voltage is outside the maximum rating specified
by Actel (-0.5V) - PCI Reliability (260 hour stress test)
- Actel is performing a reliability experiment on
the RTSXS IO buffer in the PCI configuration to
test the effect of input voltage excursions
outside the normal operating rage. In this
experiment the RTSXS device with the IO buffers
configured as 3.3V PCI inputs are stressed
continuously to a switching signal that conforms
to PCI requirements (VIH7.1V and VIL-3.5V with
a pulse width of 11ns each). Preliminary pre and
post stress measurements were taken for Leakage
and VIH/VIL. The maximum IIL/IIH delta was of the
order of a few nanoamps and maximum VIH/VIL delta
of about 50mV. - Based on the reliability results so far, we dont
believe there is any issue with input voltages
switching beyond the rails, as long as it is
within PCI specifications. Upon completion of the
reliability testing the datasheet will be
updated. - The experiment was done on a MEC device. The same
experiment is being repeated on a UMC device
(RTSX-SU).
19Summary
- There appear to be inconsistencies between the
Actel data sheets and the PCI specification - Overshoot and undershoot in the simulations and
the lab appear to exceed maximum rating for Actel
3.3V PCI I/O - Non-monotonic behavior observed in simulations
and the lab. Did not affect operation in this
single test case, effect on other vendor devices
unknown. - Initial Actel over/undershoot testing has not
uncovered reliability issues with PCI - Actel plans to continue testing and update data
sheets