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zjqiu@fudan.edu.cn

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Title: Process integration Author: Shili Zhang Last modified by: MC SYSTEM Created Date: 1/31/2000 12:39:12 AM Document presentation format: – PowerPoint PPT presentation

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Title: zjqiu@fudan.edu.cn


1
????????
  • ???
  • zjqiu_at_fudan.edu.cn
  • ???????435?

2
??
??? ?? ??? ???? ??? ?????????? ???
?? ??? ??? ??? ??? ???
???? ??? ???? ??? ?? ???
????? ???? ??????? ???? ???????
3
  • MOS????
  • ?????????
  • ??CMOS????

4
MOS IC???????
  • MOS???????,MOS???????,?????????????
  • ?????VTF?,VTF???????3-4 V,????MOS??????1 pA?
  • ?????????????VTF???T?25??125 ?C,VTF??2 V?

5
MOS IC???????
  • ????VT???
  • ??????,??????7-10?
  • ????????????(Channel-stop implant,?????? )

6
1?LOCOS????????
(40nm)
(80nm)
7
LOCOS???????
2)????? ??????????
1)???? ????????
8
???LOCOS?? PBL(polybuffered LOCOS)
?LPCVD Si3N4?,????????,???????????????O???????0.1-
0.2mm?
9
PBL
????????? ??Si3N4???????
10
2?STI(Shallow Trench Insulation) ?????
LOCOS?PBL????????0.35-0.5 mmlt0.35 mm????STI
1)????
2)???? (20 nm)
11
3)LPCVD??? (100 nm)
4)?????
5)????? (0.5 mm)
12
6)????????? (20 nm)
7)????????
8)CVD ???????
13
9)CMP???
10)??????????CVD???
14
??STI??(CMOS)
1)?????????
USG(Un-doped Silicate Glass)SiH4O2Ar?USG
volatiles?
2)HDPCVD?????
15
3)CMP???
4)??????USG
16
?????????
???SiO2-???(Al?),????????,????VT
?Al?????????????? ?????????-???????
???????,VT????1.21.4 V
  • ?????????
  • ?????????MS??p-poly???VT??1.1 V,???????????dual-po
    ly(n p)???
  • ????????,???????????

17
1??????????
18
LDDspacer????????
1)LDD??
2)????
19
3)??????
???????
TiSi2,CoSi2,NiSi
20
??SOI CMOS????
SOI??Cu????
21
(No Transcript)
22
(No Transcript)
23
Wafer cleaning
24
Wafer cleaning
25
(No Transcript)
26
alignment, exposure, PEB, development and
inspection
mask0
27
Strip PR and Screen Oxide Wafer cleaning
28
Pad thermal oxidation LPCVD Nitride
29
(No Transcript)
30
PR coating and pre-baking
mask1
31
PEB, development inspection Etch pad oxide and
nitride
32
Strip PR etch Si
33
(No Transcript)
34
(No Transcript)
35
Strip nitride oxide Wafer cleaning
36
(No Transcript)
37
(No Transcript)
38
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask2
39
(No Transcript)
40
(No Transcript)
41
(No Transcript)
42
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask3
43
(No Transcript)
44
Strip PR sacrificial oxide Wafer cleaning
45
(No Transcript)
46
(No Transcript)
47
(No Transcript)
48
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
a-Si etching
mask4
49
Strip PR, wafer cleaning, a-Si annealing and
oxidation
oxide
50
(No Transcript)
51
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask5
52
(No Transcript)
53
(No Transcript)
54
(No Transcript)
55
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask6
56
(No Transcript)
57
(No Transcript)
58
(No Transcript)
59
(No Transcript)
60
(No Transcript)
61
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask7
62
(No Transcript)
63
(No Transcript)
64
(No Transcript)
65
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask8
66
(No Transcript)
67
(No Transcript)
68
(No Transcript)
69
Ar2 Sputtering etching(SiO2?????)
70
(No Transcript)
71
(No Transcript)
72
(No Transcript)
73
(No Transcript)
74
(No Transcript)
75
(No Transcript)
76
PR coating and pre-baking, mask alignment
exposure, PEB, development and inspection
mask8
77
(No Transcript)
78
(No Transcript)
79
Ar2 sputtering etching
80
(No Transcript)
81
(No Transcript)
82
(No Transcript)
83
Ar2 Sputtering etching
SODSpin On Dielectric
84
(No Transcript)
85
(No Transcript)
86
(No Transcript)
87
(No Transcript)
88
(No Transcript)
89
Mask 16?17
90
Mask 18?19
91
(No Transcript)
92
Mask 20
93
ship to testing
94
(No Transcript)
95
Ar2 sputtering etching
96
Mask 21
97
(No Transcript)
98
(No Transcript)
99
??Dicing????Flip-chip packaging
100
On-Time 2 Year Cycles
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