Final Presentation

1
Final Presentation

• Survey on Stochastic Leakage Modeling
• Wenyao Xu
• Fengbo Ren

2
Outline

• Process Variation
• Leakage Modeling
• Paper Survey

3
Outline

• Process Variation
• Leakage Modeling
• Paper Survey

4
Source of Process Variation

• Gate oxide thickness (tox)

5
Source of Process Variation

• Doping variation

6
Source of Process Variation

• Channel length variation

7
Source of Process Variation

• Gate oxide thickness (tox)
• Doping variation
• Channel length variation

Vth Variation
Spatial correlation closely located devices
have higher probability to take same values of
process parameters
8
Outline

• Process Variation
• Leakage Modeling
• Paper Survey

9
Type of Leakage
Variation

• Subthreshold leakage
• Gate oxide leakage
• Junction tunneling leakage

Variation
10
Other Stochastic Variables for Leakage Modeling

• Different Devices
• BULK-FET, FinFET, Tri-gate, GP-SOI FET, DG-SOI
  FET, DG-VFET
• Circuit Topology
• Stack Effect
• Input vector

11
Stochastic Leakage Modeling
Process Variation Process Variation Process Variation Process Variation Other Viration
Doping variation Vth Variation Within Die With Spatial correlation Devices
Doping variation Vth Variation Within Die With Spatial correlation Circuit Topology
Channel length variation Vth Variation Within Die W/O Spatial correlation Input Vector
Channel length variation Vth Variation Die to Die    
Gate Thickness Variation Vth Variation Die to Die    
12
Modeling Classification
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Variation Type
Channel length
Inter Die
Input Vector
Circuit Topology
Device
13
Rao etc. DAC04
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device
14
Amit etc. ICCAD05
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device
15
Chang etc. DAC05
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device
16
Hari etc. DAC06
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device
17
Xin etc. DAC06
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device
18
Li etc. DAC07
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device
19

• Question

20
Heloue etc. DAC07
Subthreshold Leakage
Log
Leakage Type
Gate Tunneling Leakage
Spatial Correlation
Junction Tunneling Leakage
Doping
Non-Log
Intra Die
w/o Spatial Correlation
Gate Oxide Thickness
Vth Variation
Inter Die
Variation Type
Channel length
Input Vector
Circuit Topology
Device