Summer '07 at CLS

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Summer '07 at CLS

• Small Angle X-Ray Scattering

Peter Chen
Chithra Karunakaran Konstantine Kaznatcheev
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Purpose
(Feser/Jacobsen)

• to provide an alternative imaging technique to
  STXM to understand structural information of
  sample

(Miao, Charalambous, Kirz, Sayre, Nature 400, 342
(1999))
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Reconstruction
diffraction pattern
hologram
image
SEM image of letters, fabricated by gold dots,
(100 nm in diameter each) diffraction pattern
(middle) and reconstructed image (Miao,
Charalambous, Kirz, Sayre, Nature 400, 342
(1999)).
Only intensity is obtained, phase information is
lost.
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Purpose
Mie polar diagrams

• to image smaller samples

• to test stability and integrity of the optics and
  the microscope

small xpa/l large
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Tasks

• Tasks
• create software
• determine camera setup in the STXM
• experimentation
• take data with respect to different variables
• orientation
• geometry
• nature of samples

Andor Vacuum supported CCD. 512 x 512 12.3 x
12.3 mm
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Software

• Software
• Visual Basic .NET 2003
• Requirements
• basic single imaging, video, exposure settings,
  etc.
• long exposure
• aXis readable data and header output
• beamline read and control

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Mechanics

• Implementation
• external placement

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SAXS
camera
OSA
sample
1st order beam
detector
focus
zone plate
incident beam
scattered wave
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Scans on the Mesh
x
x
x
Exposure 100 secEnergy 710 eV
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Change in Focus

• Defocusing of beam

by 10 um
by 30 um
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Change in Energy
Energy 709 eV
Energy 705 eV
Energy 703 eV
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Change in Slit Size
20 um x 20 um slit size
50 um x 50 um slit size
100 um x 100 um slit size
10 um x 10 um slit size
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Consistency

• Iron Particles

Exposure 100 secEnergy 710 eV Background
Corrected 10 nm particle.
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Camera Placement Issue