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David T. Read, Materials Reliability Division
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Title: David T. Read, Materials Reliability Division Author: David T. Read Last modified by: David T. Read Created Date: 2/13/2003 6:33:48 PM Document presentation format – PowerPoint PPT presentation
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Title: David T. Read, Materials Reliability Division
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David T. Read Physicist, Microscale Measurements
group 303 497 3853 david.read_at_nist.gov NIST
853.08 325 Broadway Boulder CO 80305-3328 USA
Research interests Microelectronics
reliability Thin film mechanical properties Metal
thin films Microtensile testing Molecular dynamics
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