Exchange Bias and Coercivity of thin film Bi-Layers

1
Exchange Bias and Coercivity of thin film
Bi-Layers

• Investigation of Magnetic properties of Thin
  films
• Preparation of sample
• Evaporation of material using electron beam
  evaporation
• All work done in High Vacuum systems
• Measurement
• X-Ray Characterization of crystal structure
• SQUID measurements of sampleInvestigation of
  Magnetic properties of Thin films
• Applications
• Nano Structures and fabrication
• Provides insight for further nano-fabrication

Fe
FeF2
substrate
By Vincent Cerimele
9/23/2002