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The Empirical Mode Decomposition Method Sifting

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To define joint frequency-energy distribution as a function ... A prelude to the true Ensemble EMD. Data: 2 Coincided Waves. IMF from Data of 2 Coincided Waves ... – PowerPoint PPT presentation

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Title: The Empirical Mode Decomposition Method Sifting


1
The Empirical Mode Decomposition Method Sifting
2
Goal of Data Analysis
  • To define time scale or frequency.
  • To define energy density.
  • To define joint frequency-energy distribution as
    a function of time.
  • To do this, we need a AM-FM decomposition of the
    signal. X(t) A(t) cos?(t) , where A(t)
    defines local energy and ?(t) defines the local
    frequency.

3
Need for Decomposition
  • Hilbert Transform (and all other IF computation
    methods) offers meaningful Instantaneous
    Frequency for IMFs.
  • For complicate data, there should be more than
    one independent component at any given time.
  • The decomposition should be adaptive in order to
    study data from nonstationary and nonlinear
    processes.
  • Frequency space operations are difficult to track
    temporal changes.

4
Why Hilbert Transform is not enough?
  • Even though mathematicians told us that the
    Hilbert transform exists for all functions of
    Lp-class.

5
Problems on Envelope
  • A seemingly simple proposition but it is not so
    easy.

6
Two examples
7
Data set 1
8
Data X1
9
Data X1 Hilbert Transform
10
Data X1 Envelopes
11
Observations
  • None of the two envelopes seem to make sense
  • The Hilbert transformed amplitude oscillates too
    much.
  • The line connecting the local maximum is almost
    the tracing of the data.
  • It turns out that, though Hilbert transform
    exists, the simple Hilbert transform does not
    make sense physically.
  • For envelopes, the necessary condition for
    Hilbert transformed amplitude to make sense is
    for IMF.

12
Data X1 IMF
13
Data x1 IMF1
14
Data x2 IMF2
15
Observations
  • For each IMF, the envelope will make sense.
  • For complicate data, we have to decompose it
    before attempting envelope construction.
  • To be able to determine the envelope is
    equivalent to AM FM decomposition.

16
Data set 2
17
Data X2
18
Data X2 Hilbert Transform
19
Data X2 Envelopes
20
Observations
  • Even for this well behaved function, the
    amplitude from Hilbert transform does not serve
    as an envelope well. One of the reasons is that
    the function has two spectrum lines.
  • Hilbert Transform represents higher frequency
    better.
  • Complications for more complex functions are
    many.
  • Here, the empirical envelope seems reasonable.

21
Empirical Mode Decomposition
  • Mathematically, there are infinite number of ways
    to decompose a functions into a complete set of
    components.
  • The ones that give us more physical insight are
    more significant.
  • In general, the fewer the number of representing
    components, the higher the information content
    Sparse representation.
  • The adaptive method will represent the
    characteristics of the signal better.
  • EMD is an adaptive method that can generate
    infinite many sets of IMF components to
    represent the original data.

22
Empirical Mode Decomposition Methodology Test
Data
23
Empirical Mode Decomposition Methodology data
and m1
24
Empirical Mode Decomposition Methodology data
h1
25
Empirical Mode Decomposition Methodology h1
m2
26
Empirical Mode Decomposition Methodology h2
m3
27
Empirical Mode Decomposition Methodology h3
m4
28
Empirical Mode Decomposition Methodology h2
h3
29
Empirical Mode Decomposition Methodology h4
m5
30
Empirical Mode DecompositionSifting to get one
IMF component
31
Empirical Mode DecompositionSifting to get one
IMF component
32
Empirical Mode Decomposition Methodology IMF
c1
33
Definition of the Intrinsic Mode Function

34
Empirical Mode DecompositionSifting to get all
the IMF components
35
Empirical Mode DecompositionSifting to get all
the IMF components
36
Empirical Mode DecompositionSifting to get all
the IMF components
37
Empirical Mode DecompositionSifting to get all
the IMF components
38
Observations
  • All IMF components are the sums of spline
    functions.
  • We selected cubic natural spline tomaintain the
    maximum smoothness.
  • We will discuss spline function next time.

39
Empirical Mode Decomposition Methodology data
r1
40
Empirical Mode Decomposition Methodology
data, h1 r1
41
Empirical Mode Decomposition Methodology IMFs
42
Definition of Instantaneous Frequency
43
Definitions of Frequency
44
The Effects of Sifting
  • The first effect of sifting is to eliminate the
    riding waves to make the number of extrema
    equals to that of zero-crossing.
  • The second effect of sifting is to make the
    envelopes symmetric. The consequence is to make
    the amplitudes of the oscillations more even.

45
Singularity points for Instantaneous Frequency
46
Critical Parameters for EMD
  • The maximum number of sifting allowed to extract
    an IMF, N.
  • The criterion for accepting a sifting component
    as an IMF, the Stoppage criterion S.
  • Therefore, the nomenclature for the IMF are
  • CE(N, S) for extrema sifting
  • CC(N, S) for curvature sifting

47
The Stoppage Criteria S and SD
A. The S number S is defined as the
consecutive number of siftings, in which the
numbers of zero-crossing and extrema are the
same for these S siftings. B. If the mean is
smaller than a pre-assigned value. C. Fixed
sifting (iterating) time. D. SD is small than a
pre-set value, where
48
Curvature Sifting
  • Hidden Scales

49
Empirical Mode Decomposition Methodology Test
Data
50
Hidden Scales
51
Hidden Scales
52
Observations
  • If we decide to use curvature, we have to be
    careful for what we ask for.
  • For example, the Duffing pendulum would produce
    more than one components.
  • Therefore, curvature sifting is used sparsely.
    It is useful in the first couple of components to
    get rid of noises.

53
Intermittence Test
  • To alleviate the Mode Mixing

54
Sifting with Intermittence Test
  • To avoid mode mixing, we have to institute a
    special criterion to separate oscillation of
    different time scales into different IMF
    components.
  • The criteria is to select time scale so that
    oscillations with time scale shorter than this
    pre-selected criterion is not included in the IMF.

55
Intermittence Sifting Data
56
Intermittence Sifting IMF
57
Intermittence Sifting Hilbert Spectra
58
Intermittence Sifting Hilbert Spectra (Low)
59
Intermittence Sifting Marginal Spectra
60
Intermittence Sifting Marginal spectra (Low)
61
Intermittence Sifting Marginal spectra (High)
62
Critical Parameters for Sifting
  • Because of the inclusion of intermittence test
    there will be one set of intermittence criteria.
  • Therefore, the Nomenclature for IMF here are
  • CEI(N,S n1, n2, )
  • CCI(N, S n1, n2, )
  • with n1, n2 as the intermittence test criteria.

63
The mathematical Requirements for Basis
  • The traditional Views

64
IMF as Adaptive Basis
  • According to the established mathematical
    paradigm, we should check the following
    properties of the basis
  • Convergence
  • completeness
  • orthogonality
  • Uniqueness

65
Convergence
66
Convergence Problem
  • Given an arbitrary number, e, there always exists
    a large finite number N, such that Nth envelope
    mean, mN , satisfies mN e

67
Convergence Problem
  • Given an arbitrary number, e, there always exists
    a large finite number N, such that N- th sifting
    satisfies

68
Convergence
  • There is another convergence problem we have
    only finite number of components.
  • Complete proof for convergence is underway.
  • We can prove the convergence under simplified
    condition of linear segment fitting for sifting.
  • Empirically, we found all cases converge in
    finite steps. The finite component, n, is less
    than or equal to log2M, with M as the total
    number of data points.

69
Convergence
  • The necessary condition for convergence is that
    the mean line should have less extrema than the
    original data.
  • This might not be true if we use the middle
    points and a single spline the procedure might
    not converge.

70
Completeness
71
Completeness
  • Completeness is given by the algebraic equation
  • Therefore, the sum of IMF can be as close to the
    original data as required.
  • Completeness is given.

72
Orthogonality
73
Orthogonality
  • Definition Two vectors x and y are orthogonal if
    their inner product is zero.
  • x y (x1 y1 x2 y2 x3 y3 ) 0.

74
The need for an orthogonality check
  • Orthogonal is required for

75
Orthogonality
  • Orthogonality is a requirement for any linear
    decomposition.
  • For a nonlinear decomposition, as EMD, the
    orthogonality should not be a requirement, for
    nonlinear waves of different scale could share
    the same harmonics.
  • Fortunately, the EMD is basically a Reynolds type
    decomposition , U ltUgt u, orthogonality is
    always approximately satisfied to the degree of
    nonlinearity.
  • Orthogonality Index should be checked for each
    cases as a goodness of decomposition
    confirmation.

76
Orthogonality Index
77
Length Of Day Data
78
LOD IMF
79
Orthogonality Check
  • Pair-wise
  • 0.0003
  • 0.0001
  • 0.0215
  • 0.0117
  • 0.0022
  • 0.0031
  • 0.0026
  • 0.0083
  • 0.0042
  • 0.0369
  • 0.0400
  • Overall
  • 0.0452

80
Uniqueness
81
Uniqueness
  • EMD, with different critical parameters, can
    generate infinite sets of IMFs.
  • The result is unique only with respect to the
    critical parameters and sifting method selected
    therefore, all results should be properly named
    according to the nomenclature scheme proposed
    above.
  • The present sifting is based on cubic spline.
    Different spline fitting in the sifting procedure
    will generate different results.
  • The ensemble of IMF sets offers a Confidence
    Limit as function of time and frequency.

82
Some Tricks in Sifting
83
Some Tricks in Sifting
  • Sometimes straightforward application of sifting
    will not generate good results.
  • Invoking intermittence criteria is an alternative
    to get physically meaningful IMF components.
  • By adding low level noise can improve the
    sifting.
  • By using curvature may also help.

84
An Example
  • Adding Noise of small amplitude only,
  • A prelude to the true Ensemble EMD

85
Data 2 Coincided Waves
86
IMF from Data of 2 Coincided Waves
87
Data 2 Coincided Waves NoiseThe Amplitude of
the noise is 1/1000
88
IMF form Data 2 Coincided Waves Noise
89
IMF c1 and Component2 2 Coincided Waves
90
IMF c2c3 and Component1 2 Coincided Waves
91
A Flow Chart
Ensemble EMD
sifting
Data
IMF
OI
With Intermittence
IF
Hilbert Spectrum
Marginal Spectrum
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