IEEE 1450 Working Group - A Status Report -

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IEEE 1450 Working Group- A Status Report -

• Name Tony Taylor
• Title Co-Chairman

2
STIL Conception

• Dec 1994 first ad-hoc meeting called to create
  the ToolsltgtTesters Interface consortium, with the
  identified goals
• to address the megabyte problem of transporting
  test vectors from CAD to ATE
• intended to be a Test format
• to provide a solution quickly

EDA vendors
ATE vendors
customers
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STIL Delivery

• June 1996
• IEEE accepted the Project
• Authorization Request (PAR) P1450
• October 1997
• First IEEE ballot returns
• March 1999
• P1450 Approved as IEEE Std 1450-1999
• Aug 1999
• IEEE Std 1450 in print

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STIL Resources available on web

• Clarifications document to 1450-1999
• Recommended usage document to 1450-1999
• Basic lex/yacc parsing rules for STIL
• Source code for STIL examples in 1450-1999
• Web http//grouper.ieee.org/groups/1450/index.html
  
• Mail reflector stds-1450_at_majordomo.ieee.org

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STIL working group - how to participate

• Bi-weekly conference calls
• Informal draft review
• Formal IEEE ballot
• IEEE is an open process
• All information about our work is available on
  the IEEE web site

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STIL Overview

• Definition of terms
• STIL Standard Test Interface Language
• CTL Core Test Language
• TRC Test Resource Constraints
• Set of standards
• IEEE Std. 1450-1999 Basic STIL
• p1450.1 Design extension to STIL (90 complete)
• p1450.2 DC Level extension to STIL (Ballot
  complete)
• p1450.3 Tester Targeting (75 complete)
• p1450.4 Flow extension to STIL (re-activated)
• p1450.5 Test Method extension to STIL (not
  started)
• p1450.6 Core Test Language extension to STIL
  (90 complete)
• p1500 Core Test Hardware Definition (75
  complete)

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STIL Standards
1450-1999
P1450.2
P1450.1
P1450.6
P1450.3
P1450.4
P1450.5
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STIL Partitioning - Test Reqs
UserKeywords Functions
Pragma
Signals
SignalGroups
Spec
Selector
ScanStructures
BistStructures
CoreType
CoreInstance
CellGroups
Environment
Timing
DCLevels
DCSets
DCSequence
PatternBurst
PatternExec
Procedures
MacroDefs
Pattern
test
0
1
2
3
6
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STIL Partitioning ATPG Tool
UserKeywords Functions
Pragma
Signals
Single global
SignalGroups
Spec
Selector
Single global
ScanStructures
BistStructures
CoreType
CoreInstance
CellGroups
Environment
Single global, constant times
Timing
DCLevels
DCSets
DCSequence
Single named, single pattern ref
PatternBurst
Single global, single Timing and PatternBurst ref
PatternExec
Single global, possibly multiple Shifts
Procedures
Single global
MacroDefs
Single named, C,V, W, MacroProc calls
Pattern
test
atpg
0
1
2
3
6
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STIL Partitioning - Core Test
UserKeywords Functions
Pragma
Signals
Multiple named
SignalGroups
Spec
Selector
Multiple named
ScanStructures
BistStructures
CoreType
CoreInstance
CellGroups
Environment
Multiple named, constant times
Timing
DCLevels
DCSets
DCSequence
Multiple named, multiple parallel pat ref
PatternBurst
Possibly Multiple
PatternExec
Multiple named
Procedures
MacroDefs
Multiple named
Pattern
Multiple named, MacroProc calls
ctl
test
atpg
0
1
2
3
6