A BiCMOS Synchronous Pulse Discriminator for the LHCb Calorimeter System' - PowerPoint PPT Presentation

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A BiCMOS Synchronous Pulse Discriminator for the LHCb Calorimeter System'

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Linearity error 5%. Robust to temperature variations (band gap reference) ... Linearity error is 0.5 % full scale. Power consumption: 140 mW ... – PowerPoint PPT presentation

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Title: A BiCMOS Synchronous Pulse Discriminator for the LHCb Calorimeter System'


1
A BiCMOS Synchronous Pulse Discriminator for the
LHCb Calorimeter System.
  • Introduction.
  • Requirements.
  • System architecture
  • Design of the components
  • Results
  • Conclusions



S. Bota, A. Diéguez, D. Gascón, R. Graciani -
LECC Workshop- September 2002 Colmar
2
I. Introduction
3
II. Requirements (Energy measurement)
Energy deposition in a SPD cell (electrons and
photons).
  • Energy deposition
  • Random signal shape (20-30 phe/MIP)
  • Shaping methods discarded

Single event MIP signal
Integrate
BW?100 MHz
4
II. Requirements (Timing)
Average MIP signal
  • Only about 80 of signal in 25 ns
  • No dead time on integration
  • Response to consecutive events

?d ?12 ns
  • Dual channel synchronous system
  • Pile-up correction

Normalized integral of Cosmic ray signals in main
and secondary period
5
II. Requirements (Other)
  • PMT gain limited by aging (DC current) ?
    100fC/MIP in central cells.
  • Resolution ? 0.05 MIP (ltlt resolution given by
    photostatistics).
  • 5-10 MIP range to perform tail correction.
  • Bandwidth gt 100MHz.
  • Linearity error lt 5.
  • Robust to temperature variations (band gap
    reference).
  • Small cavity ? Power consumption lt 1W.

6
III. System architecture
7
IV. Components (Input stage Preamplifier)
8
IV. Components (Input stage Integrator)
9
IV. Components (Input stage Noise and Offset)
Transfer function of a system that integrates for
?T?
  • Noise
  • Offset

Approx. transient response for tltlt
10
IV. Components (Pile-up compensation variable Gm)
Common mode offset VbiasDVbiasH-VbiasL
11
IV. Components (Pile-up compensation Track
Hold)
12
IV. Components (Comparison input stage)
13
IV. Components (Comparison latched comparator)
Acquisition
Latch
14
IV. Components (DAC)
7 bits floating DAC 1b for sign 6b for
modulus Multiplying R-2R architecture
15
V. Results (Introduction)
  • Design not tested yet (received last week).
  • Results exist for previous versions
  • 5V supply
  • Gain is 1/3
  • Same system architecture
  • Same operation principle for the majority of the
    blocks.

16
V. Results (Input stage)
17
V. Results (Cross coupled transconductor)
Tolerance lt2
  • Input common mode range 1V to 0.8V
  • Input differential range ?2 V.
  • Linearity error lt1
  • Bandwidth 100MHz
  • Offset ltViogt 5 mV ?Vio6 mV r.m.s.
  • Noise voltage (Eno) lt 1 mV r.m.s

18
V. Results (DAC)
  • INL lt0.6 LSB
  • DNL lt0.8 LSB
  • Offset lt2 mV
  • Settling time 110 ns

19
V. Results (Discriminator channel general)
  • Offset (Output Zero Error)
  • ltOZEgt 35 mV
  • ?OZE 63 mV r.m.s.
  • Output range is gt?1V
  • Linearity error is lt 0.5 full scale.
  • Power consumption 140 mW

20
V. Results (Discriminator channel noise)
  • Conditions to study the sensitivity of a
    discriminator channel to noise and interference
  • Different conditions for noise sources (other
    channels)
  • ECL and CMOS outputs
  • Differential and single ended outputs.
  • Switching and fixed output.
  • Socket and soldered on PCB
  • Combination of pick-up and random noise.
  • In any case ?Thresholdlt 1.5 mV r.m.s. (in lab.
    test bench).

21
V. Results (Discriminator channel test beam)
  • High energy electron signal.
  • PMT High Voltage 750 V.
  • Threshold 3? above pedestal noise (THlt0.1 MIP).

22
VI. Conclusions
  • Design of 3.3 V full-custom synchronous
    discriminator.
  • Total dose lt 7 Krad (10 year). Protection for
    single event phenomena
  • SEU triple voting
  • SEL extra guard rings.
  • Requirements are fulfilled by previous versions
    (5 V) except for consumption and gain (new
    requirements).
  • Functional and radiation tests will be performed
    during autumn and winter.
  • Offset could limit the dynamic range of the
    system due to the higher gain of the system.
  • External offset cancellation (input bias
    current).
  • Programmable offset trimming.

23
VI. Conclusions
  • 8 ch. Prototype
  • Area 30 mm2
  • To be submitted after radiation tests.

24
IV. Components (Input stage OpAmp)
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