Engineering issues for FPCCD VTX Detector - PowerPoint PPT Presentation

1 / 12
About This Presentation
Title:

Engineering issues for FPCCD VTX Detector

Description:

Deformation by self-weight is calculated by. FEA program COMSOL. 10. FEA of Ladders ... Maximum deformation: Without gap : vmax=0.536 mm. With 0.2mm gap : vmax ... – PowerPoint PPT presentation

Number of Views:33
Avg rating:3.0/5.0
Slides: 13
Provided by: sug56
Category:

less

Transcript and Presenter's Notes

Title: Engineering issues for FPCCD VTX Detector


1
Engineering issues for FPCCD VTX Detector
  • Y. Sugimoto
  • KEK
  • July 24, 2007

2
FPCCD
  • 5mm pixel size, 15mm epi-layer
  • Accumulate signal during a train and read out
    between trains
  • Moderate readout speed 10Mpix/s
  • No power cycling
  • Two wafers make a doublet, and three doublets
    make the detector
  • Operate at low temperature 220K ?ladders are put
    inside a cryostat

3
Readout channels
  • One readout channel covers 128x13000(L1-L2)/128x20
    000(L3-L6) pixels
  • For outer layers, larger pixel size may be
    acceptable and could be 128x13000

4
Engineering challenge
  • Power consumption and cooling method
  • Wafer thinning and the ladder design
  • Installation method
  • .
  • .
  • .

5
Power consumption
  • Heat source
  • Ohmic loss in gate electrode (probably
    negligible)
  • CCD source follower and load resister
  • Readout ASIC
  • Clock driver
  • CCD and ASIC must be inside the cryostat
  • Clock driver may be put outside the cryostat
  • Most of power is consumed by drivers
  • No heat source in the image area

Our RD goal Electronics lt 100 W in the
cryostat Mechanics Compatible with 100W
6
Power consumption
  • RD status
  • Sensor RD
  • First custom CCD in FY2007
  • 4ch/chip, 4 different source follower designs
  • Smallest power consuming channel 10mW/ch
  • Readout ASIC
  • Amp, CDS, and charge-sharing SAR ADC
  • Design completed, submission in September
  • 4ch/chip
  • lt 10mW/ch if output is not connected (driving
    100W load with 1V pulse consumes 10mW!)

7
Wafer thinning
  • Two methods are considered
  • Partial thinning by etching (like DEPFET collab)
  • Easy to handle
  • More material (thick frame)
  • Total thinning by etching or mechanical method
  • Less material
  • Hard to handle (wire bonding OK?)
  • Flatness ?

8
Partial thinning
  • Sample CCDs Front side processed
  • 300mm thick frame and 20mm thick image area
  • Flatness is poor ? 20mm looks too thin

9
FEA of Ladders
RVC (Reticulated Vitreous Carbon)
Epoxy
Si (CCD wafer)
10 cm
Deformation by self-weight is calculated by FEA
program COMSOL
10
FEA of Ladders
  • Parameters (assumption)
  • Geometry

0.08X0/layer
11
FEA of Ladders
  • Results
  • Maximum deformation
  • Without gap vmax0.536 mm
  • With 0.2mm gap vmax0.723 mm
  • For longer ladders
  • vmax l4 ? 8.6 mm for 20cm ladder without gap

12
Summary and future prospect
  • Among many engineering issues to be studied for
    FPCCD vertex detector, we have started study for
  • Power consumption (sensor/ASIC RD)
  • Wafer thinning and ladder design
  • Due to lack of resources, these studies are at
    very primitive stage
  • As a long term goal (2012?), construction of
    full size engineering model (dummy detector)
    would be necessary
Write a Comment
User Comments (0)
About PowerShow.com