ICDD Conference Services Activities

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ICDD Conference Services Activities

• February 2003

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X-ray Clinics

• 2002 in Review

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2002 ICDD CLINICS

• X-ray Fluorescence Spectrometry Clinic
• Session I Practical XRF, April 29 - May 3, 2002
• X-ray Powder Diffraction Clinic
• Session I - Fundamentals, June 2-6, 2002
• Session II - Advanced Methods, June 9-13, 2002

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2002 CLINIC ATTENDEES

• XRF 21 Attendees
• XRD, Session I 28 Attendees
• XRD, Session II 22 Attendees
• (4 attended both Sessions I II )

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XRF Faculty

• John Anzelmo, Bruker AXS, Inc.
• Larry Arias, Bruker AXS, Inc.
• Eugene Bertin, Emeritus, RCA Labs.
• Richard Bostwick, Spex CertiPrep
• Larry Creasy, TIMET
• John Croke, Emeritus, PANalytical
• Tim Fawcett, ICDD
• Mary Ann Zaitz, IBM Microelectronics

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XRD Faculty

• Thomas Blanton, Eastman Kodak Company
• Harlan Clark, ICDD
• Holger Cordes, Bruker AXS, Inc.
• John Faber, ICDD
• Tim Fawcett, ICDD
• C.M. Foris, DuPont Central Research Development
• Richard Hamilton, Emeritus, Air Products and
  Chemicals .
• Suri Kabekkodu, ICDD
• Jim Kaduk, BPAmoco
• W. Frank McClune, ICDD
• Fangling Needham, ICDD
• Sue Quick, The Pennsylvania State University
• Mark Roderiguez, Sandia National Labs.
• Earle Ryba, The Pennsylvania State University
• Bernie Squires, Rigaku/USA, Inc.
• Charles Weth, ICDD

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Reduced Registrations

• Tuition Waivers
• XRF Oludare Adeluyi Sr. and Jr., Nigeria
  (no show)
• XRD-1 James Connolly, Univ. of New Mexico
• Werner Randall, Bruker AXS
• Kenneth Takeuchi Amy Marschilok, Univ. of
  Buffalo
• XRD-2 Lori Fields, Rigaku/USA, Inc.
• James Connolly, Univ. of New Mexico
• Minga Song, Univ. of Louisiana at Monroe
• Deane K. Smith Tuition Waiver Recipients
• Halfprice Discounts
• XRD-1 Bruker AXS ICDD (Staff member)

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Software Demonstrations (evening sessions)

• Bruker AXS, Inc. XRF
• Rigaku/MSC, Inc. XRD-1

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CustomersCompanies that utilized ICDDs
Clinics for their training needs in 2002

• Eastman Chemical Company
• Lockheed Martin
• The US Navy
• Praxair
• General Electric
• University of New Mexico
• Johnson Johnson Pharmaceutical RD
• The Dow Chemical Company

• The Federal Bureau of Investigations
• Eli Lilly and Co.
• Schering-Plough
• Wyeth Consumer Healthcare
• Bureau of Alcohol, Tobacco and Firearms
• Aventis
• Merck
• Procter and Gamble

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Spread the WordICDDs 2003 Clinics!

• Practical XRF
• Training in only 1 week
• New in 2003 Sample Analysis Exercise
• Live Instruments-EDS WDS
• Two free textbooks
• Evening specialized sessions

• XRD
• Large faculty from industry and academia
• Live Instruments
• Two free textbooks
• Evening software demonstrations
• Forum for discussion with peers seasoned
  professionals

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Historical Attendance
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Off-Site Educational Events2002
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2002-2003 Workshops

• EPDIC-8 Advances in Powder Diffraction
• University of Uppsala, Sweden, 23 May 2002
• ICDD Reps Bob Snyder, Tim Fawcett, John Faber
• Attendance 40
• 2002 Denver X-ray Conference Antlers Adams Mark
  Hotel, Colorado Springs, 29 July
• 1. Advances in DB Technology
• ICDD Reps John Faber Suri Kabekkodu
• Attendance 30
• 2. Methods of Phase ID
• ICDD Reps Tim Fawcett John Faber
• Attendance 35
• SARX 2002, Rio de Janeiro, 24-29 November, Mostly
  GiA.

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2002Denver X-ray Conference

• Colorado Springs, Colorado

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51st Annual Denver X-ray Conference
Colorado Springs, Colorado, July 29 August 2,
2002
Antlers Adams Mark Hotel
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Conference Services Team
Left to right Terry Maguire Donna Barry John
Getty Eileen Jennings Leah Mooney Denise Flaherty
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Attendance Figures
290 Registrations Representing 16 countries 75
US 25 non-US
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Exhibit Figures
Exhibit Booths 58 Tabletops 2 Exhibiting
Companies 42 Exhibitors gt200
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Conference Stats

• Attendees 287 (26 non-USA, 74 USA)
• Exhibits 58
• Tabletops 2
• Exhibiting Companies 42
• Exhibit Personnel gt200

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16 Workshops

• W-1 Texture Analysis I (Schaeben)
• W-2 Methods of Phase ID (Faber/Fawcett)
• W-3 Fundamentals of XRF (Gilfrich/Croke)
• W-4 Analysis of Layered Materials by XRF (Dirken)
• W-5 Texture Analysis II (Schaeben)
• W-6 Advances in Database Technology
  (Faber/Kabekkodu)
• W-7 Specimen Prep I (Broton)

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16 Workshops (cont)

• W-8 Polarized X-ray Optics (Chappell)
• W-9 Optics (Havrilla/Al-Mosheky)
• W-10 Rietveld Applications I (Kaduk)
• W-11 Specimen Prep II (Broton)
• W-12 Mathematical Methods of Quantitative XRF
  (Mantler)
• W-13 Rietveld Applications II (Kaduk)
• W-14 Line Broadening (Makinson)
• W-15 Quantitative Analysis- Standardless Methods
  (Anzelmo)
• W-16 TXRF (Zaitz)

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Plenary Session
Applications of X-ray Analysis to Forensic
Materials
Chaired by David Rendle
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Applications of X-ray Analysis to Forensic
Materials
X-RAY ANALYSIS IN THE U.S. CUSTOMS LABORATORIES
M.H. Liberman, US Customs Laboratories, San
Francisco, CA UNDERKARAT JEWELRY THE PERFECT
CRIME? INVESTIGATIONS ANALYSIS OF JEWELRY USING
XRF D. Kloos, Industry Consultant,
Westminister, CA X-RAY DIFFRACTION ANALYSIS IN
THE FORENSIC SCIENCE LABORATORY OF STUTTGART,
GERMANY THE LAST RESORT IN MANY CRIMINAL CASES
W. Kugler, Forensic Science Laboratory,
Landeskriminalamt Baden-Wuerttemberg, Stuttgart,
Germany PORTABLE XRF FOR FORENSIC
INVESTIGATIONS D.C. Ward, Federal Bureau of
Investigation, Microanalysis Laboratory,
Washington, D.C. USE OF X-RAYS IN THE UNITED
KINGDOM FORENSIC SCIENCE SERVICE D.F. Rendle,
The Forensic Science Service, Metropolitan
Laboratory, London, UK XRD AT THE FBI THE THREE
Cs OF FORENSIC SCIENCE M.C. Bottrell, Federal
Bureau of Investigation, Geologist/Forensic
Examiner, Washington, D.C.
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15 Sessions

• C-1 New Developments in XRD XRF Instrumentation
  (Commercial) (Buhrke)
• C2 C3 Synchrotron Applications I II
  (Lavoie/Ludwig)
• C-4 Microbeam Analysis (Havrilla)
• C-5 X-ray Optics (Gao/Havrilla)
• D-1 D3 Rietveld Applications I II (Kaduk)
• D-2 Thin Films (Huang)
• D-4 D5 Industrial Applications of XRD I II
  (Snyder/Hubbard)
• D-6 Neutron Diffraction (Üstündag/Bourke)

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15 Sessions (cont)

• D-7 Stress Analysis (Goldsmith)
• F-1 Quantitative XRF (Gilfrich/Vrebos)
• F-2 Polarized X-ray Optics (Chappell/Ryon)
• F-3 Problem Solving/Industrial Applications of
  XRF (Broton)

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Awards Presented
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Birks Award
Yohichi Gohshi presented the to Michael
Mantler Vienna Institute of Technology, Austria
2002 Birks Award
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Cohen Award
Cev Noyan announced the awarding of the to
Jay C. Hanan The California Institute of
Technology, Pasadena, CA For his work X-RAY
STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC
UNIDIRECTIONAL FIBER COMPOSITES
2002 Cohen Award
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McMurdie Award
Bob Snyder presented the to Cam Hubbard Oak
Ridge National Laboratory, TN
2002 McMurdie Award
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PPXRD-2

• Pharmaceutical Powder X-ray Diffraction Symposium

9-12 December 2002 Best Western Concordville
Hotel Conference Center
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Organizing Committee

• John Faber, Chair
• Tom Blanton, Eastman Kodak Company, NY
• Harry Brittain, Centre for Pharmaceutical
  Physics, NJ
• Noriaki Hirayama, Tokai University, Japan
• Arnt Kern, Bruker-AXS GmbH, Germany
• Daniel Louer, Universite de Rennes I, France
• Peter Munk, PANalytical B.V., The Netherlands
• Fangling Needham, ICDD, PA
• Richard Ortega, Rigaku/MSC, Inc., TX
• Peter Stephens, SUNY- Stony Brook, NY
• Greg Stephenson, Eli Lilly, IN
• Peter Varlashkin, GlaxoSmithKline, NC

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Format

• 3 days of sessions, 1 day workshop
• Exhibits
• Poster session
• Reception

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Sessions

1. Acquisition Use of Diffraction Data
2. Powder Pattern Indexing
3. Polymorph Characterization by XRPD
4. Structure Determination, Molecular Modeling,
   Pattern Matching
5. Regulatory Patent Issues

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Invited Speakers

• Peter Stephens, SUNY-Stony Brook, NY
• John Faber, ICDD
• Daniel Louer, Univ. de Rennes I, France
• Bill David, Rutherford Appleton Lab., UK
• Chris Gilmore, Univ. of Glasgow, Scotland
• Ken Shankland, Rutherford Appleton Lab., UK
• Harry Brittain, Center for Pharmaceutical
  Physics, NJ
• Wilson DeCamp, FDA, MD
• Steven Lee, Kenyon Kenyon, NY
• Rex Hjelm, Los Alamos National Lab, NM

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Workshop

• Instrument Calibration and Indexing
• Instructors John Faber, Jim Kaduk, Daniel Louer,
  Peter Stephens and Peter Varlashkin
• Location Headquarters
• Attendees 17

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Stats

• Overall attendance 70
• Attendees 58
• 25 attended symposium only
• 17 attended symposium workshop
• 12 no charge (speakers)
• 4 student registrations
• Exhibits 13
• Sponsorships 2 (Bruker AXS and PANalytical)

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International Representation

• Attendees represented 11 different countries
• USA 34
• UK 7
• The Netherlands 4
• India 3
• Austria 2
• Croatia 2
• Germany 2
• Belgium 1
• France 1
• Japan 1
• Sweden 1

40 from outside of the US
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Specimen Measurement

• Attendees were given the option to receive
  samples for measurement in their own labs.
• Results were discussed in an open forum during
  the symposium and later in the workshop.

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Manufacturers Participation

• Tabletop Exhibits 13
• Exhibiting Companies 12
• Exhibits held on Monday Tuesday
• Dedicated exhibit session on Monday evening,
  along with the Poster Session ICDD reception
• Bruker AXS and PANalytical sponsored breaks

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Looking aheadFuture Educational Events

• XRF Clinic Practical XRF, ICDD, April 29-May 2,
  2003
• XRD Clinics Fundamentals, ICDD, June 2-6, 2003
• Advanced Methods, ICDD, June 9-13, 2003
• 52nd Annual Denver X-ray Conference
• August 4-8, 2003
• Denver Marriott Tech Center Hotel, Denver,
  Colorado
• Workshop Rietveld Applications (J. Faber A.
  Kern)
• Papers
• PPXRD-3 in 2004, Location TBD

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Future Educational Events (cont)

• BCA Spring Meeting, 14-17 April 2003, York Univ.
• John Faber to present a Plenary talk and teach
  a workshop on Phase ID.
• 8th National Conference on XRD, 12-18 May 2003,
  Nanning, China.
• Workshop, mostly GiA.
• ECM-21, 24-30 August 2003, Durban, South Africa.
  
• Technical talk planned.
• PACRIM-5, 29 Sept 2 October 2003, Nagoya,
  Japan.
• Workshop and symposium planned.
• ISRP-9 The Ninth International Symposium of the
  International Radiation Physics Society,
  Capetown, South Africa, October 27-31, 2003.
• Workshop held in conjunction with symposium.

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