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MSN 510 Imaging Techniques in Materials Science and Nanotechnology

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Title: MSN 510 Imaging Techniques in Materials Science and Nanotechnology


1
MSN 510 Imaging Techniques in Materials Science
and Nanotechnology
  • Instructor Aykutlu Dana
  • UNAM Institute of Materials Science and
    Nanotechnology,
  • Bilkent, Ankara-Turkey

2
Course Organization
  • Class outline
  • Homeworks
  • Extensive Matlab Simulations
  • Laboratory Work
  • Preparations
  • Laboratory
  • Laboratory Report
  • Groups of 4 People

3
Why is microscopy important ?
  • The International Technology Roadmap for
    Semiconductors
  • Scanning probe microscopes
  • Giant magnetoresistive effect
  • Semiconductor lasers and light-emitting diodes
  • National Nanotechnology Initiative
  • Carbon fiber reinforced plastics
  • Materials for Li ion batteries
  • Carbon nanotubes
  • Soft lithography
  • Metamaterials

4
Why is microscopy important ?
The other nine advancements heavily rely on
microscopy Or are enabled by microscopy and
related techniques
  • The International Technology Roadmap for
    Semiconductors
  • Scanning probe microscopes
  • Giant magnetoresistive effect
  • Semiconductor lasers and light-emitting diodes
  • National Nanotechnology Initiative
  • Carbon fiber reinforced plastics
  • Materials for Li ion batteries
  • Carbon nanotubes
  • Soft lithography
  • Metamaterials

5
Why is microscopy so important ?
The other nine advancements heavily rely on
microscopy Or are enabled by microscopy and
related techniques
  • Example Carbon Nanotubes (Iijima, 1991)

6
Some history (EM)

DATE NAME EVENT
1897 J. J. Thompson Discovers the electron
1924 Louis deBroglie Identifies a wavelength to moving electrons lh/mv where l wavelength h Planck's constant m mass v velocity (For an electron at 60kV l  0.005 nm)
1926 H. Busch Magnetic or electric fields act as lenses for electrons
1929 E. Ruska Ph.D thesis on magnetic lenses
1931 Knoll Ruska First electron microscope built
1931 Davisson Calbrick Properties of electrostatic lenses
1934 Driest Muller Surpass resolution of the LM
1938 von Borries Ruska First practical EM (Siemens) - 10 nm resolution
1940 RCA Commercial EM with 2.4 nm resolution
1945   1.0 nm resolution

7
Nobel Prizes
  • 1903 Richard Zsigmondy develops the
    ultramicroscope and is able to study objects
    below the wavelength of light.The Nobel Prize in
    Chemistry 1925  
  • 1932 Frits Zernike invents the phase-contrast
    microscope that allows the study of colorless and
    transparent biological materials.The Nobel Prize
    in Physics 1953  
  • 1938 Ernst Ruska develops the electron
    microscope. The ability to use electrons in
    microscopy greatly improves the resolution and
    greatly expands the borders of exploration.The
    Nobel Prize in Physics 1986  
  • 1981 Gerd Binnig and Heinrich Rohrer invent the
    scanning tunneling microscope that gives
    three-dimensional images of objects down to the
    atomic level.The Nobel Prize in Physics 1986 

To get a feeling http//nobelprize.org/educationa
l_games/physics/microscopes/1.html
8
What is an Image?
  • Sample has a property distribution M(x,y,z)
  • An image is a map of M(x,y,z) , or a 2D
    cross-sectional map of M(x,y,z)
  • A microscope is an instrument that generates a
    data map from the small spatial scale property
    distribution M(x,y,z).
  • Resolution is a measure of dx, dy or dz of the
    generated map for distinct points providing
    complementary information (nonredundant)

9
What is an Image?
  • Sample has a property distribution M(x,y,z)
  • The property distribution may be related to
  • Density
  • Atomic number
  • Optical refractive index variation
  • Luminescent properties
  • Phonon density or energy
  • ..... etc.
  • We can image some specific property using an
    appropriately chosen probe by measuring the
    interaction of the probe with the sample at
    different x,y and z locations.
  • The dominant interaction of the probe with the
    specific property will be instrumental in imaging
    that property.

10
Example Optical Light Microscope
  • Probe Light of certain spectral distribution
  • Property to be imaged
  • Optical absorption of the sample
  • Optical phase shifts due to refractive index
    variations of the sample
  • Luminescence properties of the sample

11
Parallel vs. Sequential Imaging
  • In parallel imaging, generally the sample or the
    probe is not scanned
  • The whole sample area to be imaged is illuminated
    by the probing wave in a uniform way.
  • Scattering, absorption or other perturbations of
    the wave take place at the sample.
  • Probe signal, now carrying information about the
    sample, propagates through the optical system
    which reconstructs the image at the detector
    plane.
  • Since image formation is done by fundamental
    physics laws governing propagation of the probe
    wave, for each point of the sample
    simultaneously, we refer to this imaging method
    as parallel imaging.

12
Parallel vs. Sequential Imaging
  • In sequential imaging, the sample or the probe is
    scanned
  • The probe has small diameter and interacts
    locally with the sample.
  • Interaction of the sample with the probe is
    recorded as a function of x,y or z.
  • Image formation is done by recording the probe
    signal by secondary means (computers etc.).

13
Parallel Imaging uses waves
  • Acustic, Electromagnetic (Light), Electron waves
  • Wave equation (EM)
  • Helmholtz Equation
  • Harmonic waves Separate in time and space

The paraxial approximation further simplifies
math.
14
Huygens Principle (Approximation)
  • Each point on a wavefront acts as a point source

15
Near Field and Far field
  • Near field Right at the source
  • Far field (Fraunhofer) At infinity (many
    wavelengths away from the source)

propagation
We detect energy of the EM wave
square
Sinc squared (Fourier transform?)
16
Near Field and Far field
  • Huygens' principle when applied to an aperture
    simply says that the far-field diffraction
    pattern is the spatial Fourier transform of the
    aperture shape, and this is a direct by-product
    of using the parallel-rays approximation, which
    is identical to doing a plane wave decomposition
    of the aperture plane fields

propagation
Sinc (Sin x)/x squared
square
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