Title: MSN 510 Imaging Techniques in Materials Science and Nanotechnology
1MSN 510 Imaging Techniques in Materials Science
and Nanotechnology
- Instructor Aykutlu Dana
- UNAM Institute of Materials Science and
Nanotechnology, - Bilkent, Ankara-Turkey
2Course Organization
- Class outline
- Homeworks
- Extensive Matlab Simulations
- Laboratory Work
- Preparations
- Laboratory
- Laboratory Report
- Groups of 4 People
3Why is microscopy important ?
- The International Technology Roadmap for
Semiconductors - Scanning probe microscopes
- Giant magnetoresistive effect
- Semiconductor lasers and light-emitting diodes
- National Nanotechnology Initiative
- Carbon fiber reinforced plastics
- Materials for Li ion batteries
- Carbon nanotubes
- Soft lithography
- Metamaterials
4Why is microscopy important ?
The other nine advancements heavily rely on
microscopy Or are enabled by microscopy and
related techniques
- The International Technology Roadmap for
Semiconductors - Scanning probe microscopes
- Giant magnetoresistive effect
- Semiconductor lasers and light-emitting diodes
- National Nanotechnology Initiative
- Carbon fiber reinforced plastics
- Materials for Li ion batteries
- Carbon nanotubes
- Soft lithography
- Metamaterials
5Why is microscopy so important ?
The other nine advancements heavily rely on
microscopy Or are enabled by microscopy and
related techniques
- Example Carbon Nanotubes (Iijima, 1991)
6Some history (EM)
DATE NAME EVENT
1897 J. J. Thompson Discovers the electron
1924 Louis deBroglie Identifies a wavelength to moving electrons lh/mv where l wavelength h Planck's constant m mass v velocity (For an electron at 60kV l 0.005 nm)
1926 H. Busch Magnetic or electric fields act as lenses for electrons
1929 E. Ruska Ph.D thesis on magnetic lenses
1931 Knoll Ruska First electron microscope built
1931 Davisson Calbrick Properties of electrostatic lenses
1934 Driest Muller Surpass resolution of the LM
1938 von Borries Ruska First practical EM (Siemens) - 10 nm resolution
1940 RCA Commercial EM with 2.4 nm resolution
1945 1.0 nm resolution
7Nobel Prizes
- 1903 Richard Zsigmondy develops the
ultramicroscope and is able to study objects
below the wavelength of light.The Nobel Prize in
Chemistry 1925 - 1932 Frits Zernike invents the phase-contrast
microscope that allows the study of colorless and
transparent biological materials.The Nobel Prize
in Physics 1953 - 1938 Ernst Ruska develops the electron
microscope. The ability to use electrons in
microscopy greatly improves the resolution and
greatly expands the borders of exploration.The
Nobel Prize in Physics 1986 - 1981 Gerd Binnig and Heinrich Rohrer invent the
scanning tunneling microscope that gives
three-dimensional images of objects down to the
atomic level.The Nobel Prize in Physics 1986
To get a feeling http//nobelprize.org/educationa
l_games/physics/microscopes/1.html
8What is an Image?
- Sample has a property distribution M(x,y,z)
- An image is a map of M(x,y,z) , or a 2D
cross-sectional map of M(x,y,z) - A microscope is an instrument that generates a
data map from the small spatial scale property
distribution M(x,y,z). - Resolution is a measure of dx, dy or dz of the
generated map for distinct points providing
complementary information (nonredundant)
9What is an Image?
- Sample has a property distribution M(x,y,z)
- The property distribution may be related to
- Density
- Atomic number
- Optical refractive index variation
- Luminescent properties
- Phonon density or energy
- ..... etc.
- We can image some specific property using an
appropriately chosen probe by measuring the
interaction of the probe with the sample at
different x,y and z locations. - The dominant interaction of the probe with the
specific property will be instrumental in imaging
that property.
10Example Optical Light Microscope
- Probe Light of certain spectral distribution
- Property to be imaged
- Optical absorption of the sample
- Optical phase shifts due to refractive index
variations of the sample - Luminescence properties of the sample
11Parallel vs. Sequential Imaging
- In parallel imaging, generally the sample or the
probe is not scanned - The whole sample area to be imaged is illuminated
by the probing wave in a uniform way. - Scattering, absorption or other perturbations of
the wave take place at the sample. - Probe signal, now carrying information about the
sample, propagates through the optical system
which reconstructs the image at the detector
plane. - Since image formation is done by fundamental
physics laws governing propagation of the probe
wave, for each point of the sample
simultaneously, we refer to this imaging method
as parallel imaging.
12Parallel vs. Sequential Imaging
- In sequential imaging, the sample or the probe is
scanned - The probe has small diameter and interacts
locally with the sample. - Interaction of the sample with the probe is
recorded as a function of x,y or z. - Image formation is done by recording the probe
signal by secondary means (computers etc.).
13Parallel Imaging uses waves
- Acustic, Electromagnetic (Light), Electron waves
- Wave equation (EM)
- Helmholtz Equation
- Harmonic waves Separate in time and space
The paraxial approximation further simplifies
math.
14Huygens Principle (Approximation)
- Each point on a wavefront acts as a point source
15Near Field and Far field
- Near field Right at the source
- Far field (Fraunhofer) At infinity (many
wavelengths away from the source)
propagation
We detect energy of the EM wave
square
Sinc squared (Fourier transform?)
16Near Field and Far field
- Huygens' principle when applied to an aperture
simply says that the far-field diffraction
pattern is the spatial Fourier transform of the
aperture shape, and this is a direct by-product
of using the parallel-rays approximation, which
is identical to doing a plane wave decomposition
of the aperture plane fields
propagation
Sinc (Sin x)/x squared
square