Title: Agenda
1Agenda
- Design Flow
- Circuit Design
- Process Design
- What is semi custom design?
- Example
- Device physics
2Circuit Design Flow
- Receive/develop logic, power, timing, area
specification (gain, bandwidth ) - Get logic working in verilog or vhdl
- Size transistors by hand
- Verify in schematic spice adjust W/L
appropriately - Layout and re-verify all specifications
- Fabricate
- Test
3Process Design Flow
- Determine rough thickness of oxides and junction
depth pick process and supply Voltages and VT - Use hand calculations to pick doping levels
- verify that the oxide will be thick enough for
the voltage range - Xj does not violate Break down rules
- Design Process with athena cad tool
- Verify the process in silicon
- Develop tech file so a design can use your
process - spice deck, DRC LVS checks, VT ,RS
- Keep process under control
4Sample Layout Design Rules
- Make sure that we have a high yield on our
fabrication process. - How many transistors meet specification out of
how many we made. - This need to be as close to one as possible.
- If there is no duplication of functionality one
bad transistor can make a 10 million transistor
CPU fail! - Low yields force you to test more of your
circuits. - Testing represents a significant amount of the
fabrication costs
5Alignment Errors
We need to have a minimum overlap of the metal to
contact to take into account the inherent
errors in alignment.
- A- No Errors
- B- Worst Case x misalignment
- C- Worst Case y misalignment
- D- Worst case x and y
6Minimum Feature Size
- The smallest
- gate length we can manufacture reliably
- Depends on PL and Etch
- smallest diffusion region
- Depends on PL and Etch
- minimum separation of diffused regions
- Depends on how far junctions diffuse during
processing - minimum separation of metal lines
- Depends on PL, Etch and electrical
characteristics - minimum contact width
- Depends on Etch, PL and contact resistance
7Design Rules for Our NMOS Process
- For high yields we need to have a process that
can withstand large process variations - ½ of our smallest feature size is equal to l.
- l is equal to 8 mm
8Design Rules for Our NMOS Process
9Transistor
10Resistor
11Alignment Rules
- Source/Drain Resistors- First Mask
- Thin oxide mask- Align to level 1
- Contact window mask- Align to level 1
- Metal mask- Align to level 2
12(No Transcript)
13Review
- Oxide Thickness
- For Field oxide solve for minimum thickness to
achieve a large VT - Choose a growth method and temperature and solve
for time - For Gate Oxide solve for an oxide thickness to
achieve a VT of around a volt - Choose a growth method (wet or dry) and growth
temp and solve for time
14Review
- Diffusion
- Pick a sheet resistance
- Pick a junction depth, and temp, solve for time
- (for now assume that the sheet resistivity will
be correct)
15Review
- Process
- Field oxide
- S/D Diffusion
- Gate oxide
- Contact
- Metalization
16Electrical Calculations
17Electrical Calculations
18Semi Custom IC design
- The most expensive and time consuming layers are
pre-processed - S/D diffusion, Gate oxide, contact, and
metalization - Circuits are made by wiring together the pre laid
out transistors. - One mask is made and PL done on wafers.
- Since the wafers are predone the turn around time
is very short. - Since the transistors are pre laid out design
time is reduced!
19Resistor Pass-through
20MOSFET
21Blank Logic Cell Schematic
22Blank Logic Cell Layout
Metal1 and S/D diffusion are connected by the
contact layer, otherwise they pass over each
other. Metal1 crossing a Metal1is a short as is a
S/D cross.
Green S/D Diffusion Red Gate Oxide Orange
Contact Blue Metal1
23INV Schematic
24INV Layout
25NAND3 Schematic
26NAND3 Layout
27NOR3 Schematic
28NOR3 Layout
29Cells Snap Together
30AND3 Layout
31Can you do a two input mux?
32Modeling the MOSFET
33VT0
34VT short channel
35VT
This will cause trouble later.
36Mobility
- Mobility changes with electric field
- The constant KNP, is never constant
- We use an average
37l
- This is due to the channel length narrowing.
- The reversed biased diodes depletion region gets
bigger with VDS, and thus the length of the
channel gets smaller, and thus the ID goes up.
38What does the circuit design engineer control?
- How big W and L are.
- How the wires are connected.
- This does not sound like much is it is a lot.
39What does the process design engineer control?
- Tox
- Na
- Junction Depth
- Qi (kind of)
40What doe we have to do?
- We need to finalize the process so we have
reasonable VT, l, g and KNP values. - We really need a positive threshold VT.
- Gate oxide experiments.
- Try and find out l, g and KNP from the current
process so we can finalize mask design. (testing) - Finalize mask design.
41What doe we have to do?
- Verify design environment (drc, lvs etc.)
- Verify logic cell
- Develop analog leaf cell
- Think about cool things we can put on the mask.
- Develop Cox, Rs test structures.
42What do we have to do?
- Learn fabrication equipment
- Learn test equipment
- Develop automated l, g and KNP extraction
routines. - Develop Athena run deck to match process
- Write Traveler linked to run deck