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Solutions For Design Verification

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Title: Solutions For Design Verification


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2
  • Test Program Generation Verification and
  • Release Management


3
Corporate Overview
  • Founded in 1987
  • Headquarters in Milpitas, CA
  • Over 200 Customers Doing IC System Design
  • Close Relationships With CAE ATE Vendors
  • Offers full range of design-to-test and
    manufacturing productivity improvement solutions

4
Partial Customers List
  • LSI logic
  • Motorola
  • Schlumberger
  • Infineon
  • Silicon graphics
  • Sun Microsystems
  • Silicon magic
  • Texas instruments
  • Xilinx
  • Advanced Micro Devices
  • Agilent
  • ATI
  • Cisco Systems
  • Credence Systems Corp
  • Cypress Semiconductor
  • Dallas Semiconductor
  • Fujitsu Microelectronics
  • Hewlett-Packard
  • Hitachi

5
Test Program Generation Verification
Challenges
  • Shortening development and post-silicon debug
    time
  • Verifying ATE test programs pre-silicon w/o
  • tester
  • Simulation pattern compatibility with the
    production tester
  • Improving design-test communication

6
Release Management Challenges
  • Managing test program releases in multiple tester
    environment at many global sites for multiple
    family of devices
  • Reducing paperwork and time to process program
    change requests
  • Authorization, validation and tracking of test
    program changes
  • Uniform methods of test program generation
  • Automated Revision Control Procedures

7

Simutest Solutions
  • Test Program Generation Verification
  • Verifier
  • Fabless/IP companies Tester ready vectors
  • TestWare
  • Test Program Release Management
  • Release Manager
  • DFT/ATPG, Pay-per-use services
  • Consulting Services

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Verifier Features
  • Analyze to verify tester compatibilty
  • Translator to create ATE test programs
  • Playback to compare ATE test program and design
    test-bench
  • Convert ATE test programs to VCD
  • Support for most ATE
  • All off-line and Pre-silicon

10
Verifier Components
  • Verifier
  • Simulation log file reader/Test-bench Writer
  • Tester format writer
  • Tester format reader
  • Verilog Playback
  • Rule Analyzer/Tester Rule Checker
  • Conditioners
  • Waveform display (sim vs.tester)
  • Compare
  • Verilog driver, Java GUI, batch-mode scripts

11
Analyze
  • Identify tester compatibility issues early in
    design
  • Reduce simulation iterations
  • Tester ready vectors in fabless/IP environment
  • Identify proper target tester to suite your
    simulation
  • Comprehensive Analysis of simulation vectors
  • Datasheet timing checks
  • Tester resource compliance
  • Test strategy compliance
  • Provides detailed error messages to allow
    correction of simulation artifacts reports
    output Violation

12
Translate
  • Generate optimized test programs for target
    tester from simulation/ATPG log files
  • Vector compression by repeats, loops and
    subroutines
  • Extract timing from simulation or super-impose
    datasheet timings
  • Process multiple simulation files to derive
    incremental timings
  • Single-pass dynamic conditioners to remove
    simulation artifacts

13
Translate
Log File
Pre Processor
Cyclization
Translator
SIF State
SIF Event
Definition File
Test Program
Simulation log file to ATE test program
14
Playback
  • Playback ATE Test program to Verilog using tester
    model. Let Verilog compare expected vs.
    re-simulated results
  • Convert Test program into Verilog test bench
  • Convert test program into VCD format

15
Playback
Device Model
VCD
Verilog Simulator
Test Program
Verifier
Test bench
Test Bench
Compare
Compare
16
Playback
Test Program
SIF
Playback
VCD
Compare
Waveform
Log file
Model
Simulation
Test Bench
Text Report
17
Verilog Compare
Tick 0 info simulation invoked at Thursday jun
1st 16.27.49 2000
570 state changes on observable nets in 0.32
seconds. 1781 Events/second. Simulation stopped
at the end of time 60020.000ns.
18
Static Compare
Inputs
Outputs
Original simulation file
Compare mismatch waveform display
Test program or re-simulated trace file
Compare
Compare mismatch text report
Compare spec file
- At-strobe, timing, cycle-cross-over, Compare
19
Verifier Summary
  • Innovative solutions
  • Concurrent design and test program verification
  • Pre-silicon and without tester
  • Utilizes familiar and proven Verilog environment
  • Improves design and test communication
  • Reduces test cost
  • Cost-effective, modular and expandable
    architecture
  • Full functionality of pattern translation, Rule
    checking, displaying, editing and comparing

20
Verifier Benefits
  • Reduces the design-to-test transfer time
  • Fewer design iteration
  • Improves design test engineers communication
  • Improves the quality of test
  • Verifies the original design intent
  • Increases first-pass silicon verification success
  • Proven methodology

21
Testware For fabless/IP Developer
  • Transfer tester ready vectors to foundries
  • Testware components
  • Simulation log-file reader
  • Built-in Cyclization
  • Rule Analyzer
  • Conditioners
  • Verilog Playback
  • Output in WGL, VCD formats

22
Test Pattern Conversion Utilities
Source Tester
Target Tester
Test Program
Writer
Test Program
SIF Database
Reader
Tester To Tester
Target Simulator
Source Simulator


Stimulus-Response
Writer
Simulation File
SIF Database
Reader
Simulator To Simulator
23
Simulators Testers Support
  • Simulators
  • VCD
  • WGL
  • STIL
  • SCAN
  • TDL
  • ..
  • Others
  • Testers
  • Credence
  • Agilent
  • LTX
  • Nextest
  • Teradyne
  • Others

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Release Manager
  • Integrated Framework
  • Program Change Request
  • Automated Customized Test Program Generator
  • Revision Control System
  • Commercial Database
  • Authorize, validate, track program change
    requests at global sites electronically
  • Maintain uniform Revision Control at global sites
    for multiple testers, devices, program types and
    process technology

26
Release Manager Architecture
Database
E D I T O R S
Baseline
Test Fragments
Device
Valid ?
Change Request
Test Program Generator
Test Data Summary
Check out
Match ?
Revision Control
Yes
No
Compare
Compile/ Test
Datalog
Vesrsions
Binary Check in
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Release Manager Architecure
Test Programs/Reports/History/Versions
C-TPG
Validate
PCR
RCS
Oracle Database
  • Product family
  • Datasheet specs
  • ProgramTemplates
  • Program flow
  • Tester info
  • Site info
  • Authorization
  • Revisions


Create/Update/Retrieve/Request
Device/Test data

28
Automated Test Program Generator
C-TPG
Test Program
Data
Flow
History
Oracle Database
  • Product family
  • Datasheet specs
  • ProgramTemplates
  • Program flow
  • Tester info
  • Site info
  • Authorization
  • Revisions

29
Program Change Request (PCR)
Site
PCR
Valid?
Request
Report
  • User
  • Approval
  • Product
  • Program
  • Release
  • Site
  • Changes
  • Reason

Approval
  • E-mail
  • Print-outs

Oracle Database
Update
  • Authorization
  • Hierarchy
  • History
  • Specs
  • Device Config

Is change valid?, Notify to approving
authority, Get approval, Record history
30
Revision Control System
Test Programs
RCS
Versions
  • Control releases for
  • Multiple global sites
  • Multiple testers
  • Multiple device family
  • Automated file transfers


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Revision Control System Menu
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Test Program Validator
Test Program Validator
Valid ?
Mis-matches
Oracle Database
AC/DC Parameters Tester timings/limits
Given a set of specs and tester timing
restrictions which it should meet, validate and
report all mis-matches in a test program
33
Release Manager Summary
  • Integrated set of tools for
  • Automated Test Program generation
  • Revision control
  • Authorization, validation and tracking of changes
  • Reusable methods for any tester
  • Uniform procedures for global manufacturing sites

34
Release Manager Benefits
  • Significant productivity improvements over
    current methods
  • Greater management visibility and control on
    process
  • Improved inter-departmental communication
  • Uniform procedures for multiple devices and
    multiple testers
  • Reduce learning time and dependency on tester
    environment for routine tasks

35
Consulting Services
  • Test vector conversions
  • Pay-per-use
  • Process improvements for manufacturing test
    program generation/management
  • DFT/ATPG services

36
Visit us at Booth 1136
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