Title: Multilevel Interconnect Architectures
1Multilevel Interconnect Architectures for
Gigascale Integration (GSI)
A thesis proposal Raguraman Venkatesan Advisor
Prof. James D Meindl Co-advisor Prof. Jeffrey A
Davis
Georgia Institute of Technology, Atlanta April
29th, 2002 Sponsored by SRC and DARPA
2Outline
- Problem Statement
- Origin and History of the Problem
- Proposed Research and Current Status
- Work remaining to be done
- List of Contributions
- List of Publications
3Outline
- Problem Statement
- Origin and History of the Problem
- Proposed Research and Current Status
- Work remaining to be done
- List of Contributions
- List of Publications
4Problem Statement
- Interconnects are the bottleneck, not transistors
- Key technology metrics
- Speed
- Power
- Cost
Source Meindl et al., IEDM, 2001
5Power Density Gets Worse
Source Shekhar Borkar, Intel Corporation
6Interconnect Power Dissipation
- Interconnect power
- 30-60 of total power dissipation !
- Power-aware interconnect design methodology
strongly needed
Source Chandra, Kapur and Saraswat, IITC, 2002
(in press)
7Multilevel Interconnect Layers
- Lower cost gt Optimal design of metal layers
Source International Technology Roadmap for
Semiconductors (ITRS), 1998
8Bottomline
- Design multilevel interconnect system properly !!
9Outline
- Problem Statement
- Origin and History of the Problem
- Proposed Research and Current Status
- Work remaining to be done
- List of Contributions
- List of Publications
10Origin and History of the Problem
- Rents rule
- T Number of I/Os
- N Number of logic gates
- p Rents exponent
p0.6, k4, N1E9 - k Rents coefficient T 1E7
Source Landman Russo, IEEE Trans. Computers,
Dec 1971
11- Stochastic Interconnect Wiring Distribution
- a priori prediction of wire length and number of
wires
Source Davis, De and Meindl, Trans. Electron
Devices, Mar 1998
12- Wire Sizing
- Reverse scaling
- 2 wire widths Local global
- 3 wire widths Local, semi-global and global
- Double pitches for every 2 metal layers
- 30 scaling rule
- Linear dimensions
30 - Area
50
Source Sai-Halasz Proc. IEEE, Jan 1995
13- Wire layer assignment
- Input Wire pitches
- Delay dependent layer assignment
- Optimum number of repeaters
- Cost function Number of metal layers
- Computationally inefficient algorithm
- Requires several iterations
- Area-inefficient solution
Source Kahng and Stroobandt, SLIP Workshop, 2000
14Origin and History of the Problem
- Developed 3-tier interconnect design methodology
- Local
- Semi-global
- Global
- Using
- Wire length information (Stochastic Distribution)
- Pitch information (rc time delay models)
Source Davis, De and Meindl, Trans. Electron
Devices, Mar 1998
15Outline
- Problem Statement
- Origin and History of the Problem
- Proposed Research and Current Status
- Work remaining to be done
- List of Contributions
- List of Publications
16Proposed Research Tasks
- Task I Optimum n-tier methodology
- Task II Repeater insertion in n-tier
methodology - Task III Complete physical models for
transient - response of distributed rlc
lines - Task IV Compact physical models for time
delay, - crosstalk and repeater
insertion - Task V Impact of inductance on multilevel
- interconnect architectures
- Task VI Impact of parameter variations on
clock skew - Task VII Develop MINDS (Multilevel
Interconnect Network - Design Simulator)
17Task I Optimal n-tier multilevel
interconnect methodology
- New n-tier methodology
- ASIC case study from ITRS 100nm generation
- Three optimizations
- Macrocell Area
- Clock Frequency
- Number of metal levels
18Some definitions
Level single layer of parallel interconnects
Pair Two adjacent orthogonal levels having same
dimensions
Tier Collection of Pairs having same dimensions
19Optimal Multilevel Architecture
Available area Area required
for wiring
20- rc models for interconnect time delay
- clock frequency, wire length wire
pitch
Source Sakurai, Trans. Electron Devices, 1993
21n Tier Interconnect Network
22ITRS 100nm Case Study
- 100 nm technology
- ASIC macrocell with 11.3M logic gates
- ( 68M transistors)
- Copper interconnects
- n8 metal levels
Source International Technology Roadmap for
Semiconductors (ITRS), 1998
23Conventional design
Double pitches for every pair of layers
24Optimum n-tier architecture
A Min. area B Max. freq C Min. levels
25Optimization results
- compared to doubling of pitches design
26Task II Repeater insertion in
n-tier methodology
- Repeater insertion models and methodology
- ASIC case study from ITRS 100nm generation
- Four optimizations
- Macrocell Area
- Power dissipation
- Clock Frequency
- Number of metal levels
27Advantages of Repeaters
- Single driver (No repeaters)
Source Bakoglu and Meindl, Trans. Electron
Devices, May 1985
28Sub-optimal repeater design
29Top-down Repeater Insertion Methodology
30Minimizing Macrocell Area
31Minimizing Macrocell Area
32Minimizing Power Dissipation
Area and power are minimized simultaneously!
33Maximizing Clock Frequency
34Minimizing Number of Levels
35Optimization Results
- compared to n-tier design without
repeaters
36SWOT Analysis
- Strengths Novel layer width estimator
- Weaknesses System level tool makes
approximations - Opportunities Enables technology forecasting
for any future generation - Threats Unless the future generation uses
wireless interconnects !
37Task III Complete Transient Model for
Distributed rlc Lines with Cload
- Previous Work
- Model derivation
- Single and two coupled line transients
38Previous Work
- Rochesters model- Time delay and repeater
insertion in rlc lines. Expressions are curve
fitted, not analytical.
Source Ismail and Friedman, Trans. VLSI, Apr
2000
39Previous Work
- Georgia Tech - Compact models for distributed rlc
lines - Use modified Bessel functions
- Time domain response of finite, open-ckt
distributed rlc line - Compact expressions for time delay and crosstalk
Source Davis and Meindl, Trans. Elec. Dev,
Nov 2000
40Problem Definition
- Transmission line theory Multiple reflections
at - load
and source ends
41Basis Variables
42Single Line Transients
432 Coupled Line Transients
44Task IV Compact Models for
Time Delay, Crosstalk
Repeater Insertion
- Unified time delay model
- Unified crosstalk model
- Optimum repeater insertion models
- New design plane
45Unified Time Delay Model
- Unified Applicable to rc and rlc lines
46Unified Time Delay Model
Source Ismail and Friedman, T. VLSI, Apr 2000
47Unified Crosstalk Model
Source Cao et al. IEDM 2000
48Repeater Models
49Repeater Models
50Repeater Models
51Can Repeaters Reduce Crosstalk?
- Inserting repeaters
- Thinner wires, same delay
- More RC gt less LC behaviour
- Repeaters increase
- more grounding
- Inserting repeaters
- might decrease crosstalk
- without increasing time delay!
52Design Plane
53Design Plane
54Design Plane
55Outline
- Problem Statement
- Origin and History of the Problem
- Proposed Research and Current Status
- Work remaining to be done
- List of Contributions
- List of Publications
56Task V Effects of Inductance on n-tier Design
- Investigate effects of inductance on repeater
insertion in multilevel interconnect
architectures - Optimum aspect ratio for different tiers
- Impact of non-ideal ground return paths on
repeater-inserted multilevel interconnect systems
Source Naeemi et al., IEDM 2001
57Task VI Effects of Parameter Variations
on Clock Skew
- Previous work Used rc models
- Model a high speed clock distribution network
- Use new compact rlc models to investigate clock
skew
Source Kowalczyk et al., ISSCC 2001
Anderson et al., ISSCC 2002
58Task VII MINDS
- Multilevel Interconnect Network Design Simulator
- Current capabilities
- n-tier design, with repeaters, using rc models
- Via blockage, power/ground blockage
- Variable pitches, variable wiring efficiency
- Enhancements
- Include rlc models
- Optimum aspect ratio
- Non-ideal return paths
59Timeline of Work Left
60Outline
- Problem Statement
- Origin and History of the Problem
- Proposed Research and Current Status
- Work remaining to be done
- List of Contributions
- List of Publications
61List of Contributions
62List of Publications
- Conference papers
- R.Venkatesan, J.A.Davis and J.D.Meindl,
Performance enhancement through optimal n-tier
multilevel interconnect architectures,
Proceedings of the Twelfth International IEEE
ASIC/SOC conference, Washington DC, Sept. 15-18
1999, pp. 19-23. - J.A.Davis, R.Venkatesan, K.A.Bowman and
J.D.Meindl, Gigascale integration (GSI)
interconnect limits and n-tier multilevel
interconnect architectural solutions, Proceedings
of the International Workshop on System Level
Interconnect Prediction (SLIP), San Diego, April
8-9 2000, pp. 147-148. - R.Venkatesan, J.A.Davis, K.A.Bowman and
J.D.Meindl, Optimal repeater insertion for n-tier
multilevel interconnect architectures,
Proceedings of the Third International
Interconnect Technology Conference, San
Francisco, June 5-7 2000, pp. 132-134. - R.Venkatesan, J.A.Davis, K.A.Bowman and
J.D.Meindl, Minimum power and area n-tier
multilevel interconnect architectures using
optimal repeater insertion, Proceedings of the
International Symposium on Low Power Electronics
and Design, Rapallo/Portofino Coast, Italy, July
26-27 2000, pp. 167-172. - J.D.Meindl, R.Venkatesan, J.A.Davis, J.W.Joyner,
A.Naeemi, P.Zarkesh-Ha, M.Bakir, T.Mule, P.A.Kohl
and K.P.Martin, Interconnecting device
opportunities for gigascale integration (GSI),
International Electron Devices Meeting (IEDM),
Washington D.C., Dec 2001, pp. 525-528. - R.Venkatesan, J.A.Davis and J.D.Meindl, A
complete physical model for distributed RLC
interconnects - transient voltage, time delay and
crosstalk, to be published in the proceedings of
the Design Automation Conference, New Orleans,
June 2002. - A.Naeemi, R.Venkatesan and J.D. Meindl,
System-on-a-chip global interconnect
optimization, submitted to the ASIC/SOC
Conference, Rochester, Sept 2002. - R.Venkatesan, J.A.Davis and J.D.Meindl, Time
delay, crosstalk and repeater insertion models
for high performance SOCs, submitted to the
ASIC/SOC Conference, Rochester, Sept 2002.
63List of Publications
- Journal papers
- J.A.Davis, R.Venkatesan, A.Kaloyeros, M.Bylansky,
S.J.Souri, K.Banerjee, K.C.Saraswat, A.Rahman,
R.Reif and J.D.Meindl, Interconnect limits on
Gigascale integration (GSI) in the 21st century,
Proceedings of the IEEE - special issue on limits
to semiconductor technology, Vol. 89, No. 3,
March 2001, pp. 305-324. - R.Venkatesan, J.A.Davis, K.A.Bowman and
J.D.Meindl, Optimal n-tier multilevel
interconnect architectures for gigascale
integration, IEEE Transactions on VLSI Systems -
special issue on System Level Interconnect
Prediction, Vol. 9, No. 6, Dec 2001, pp. 899-912.
- J.W.Joyner, R.Venkatesan, P.Zarkesh-Ha, J.A.Davis
and J.D.Meindl, Impact of three dimensional
architectures on homogenous digital circuits ,
IEEE Transactions on VLSI Systems - special issue
on System Level Interconnect Prediction, Vol. 9,
No. 6, Dec 2001, pp. 922-928. - R.Venkatesan, J.A.Davis and J.D.Meindl, A
complete physical model for distributed rlc
interconnects with capacitive load Part 1
Single line transients and coupled line
crosstalk, to be submitted to the Trans. Electron
Devices. - R.Venkatesan, J.A.Davis and J.D.Meindl, A
complete physical model for distributed rlc
interconnects with capacitive load Part 2
Unified models for time delay, crosstalk and
repeater insertion, to be submitted to the Trans.
Electron Devices. - Book chapter
- J.A.Davis and J.D.Meindl, Interconnect design
issues and opportunities for Gigascale
Integration, Kluwer Academic Publishers, in
press.
64Acknowledgements
- Prof. James Meindl
- Prof. Jeff Davis
- Prof. Scott Wills
- Jennifer Tatham
- Dr. Keith Bowman
- Dr. Payman Zarkesh-Ha
- Dr. Azeez Bhavnagarwala
- Dr. Chirag Patel
- Azad Naeemi
- James Joyner
- Qiang Chen
- Tony Mule
- Raghunath Murali
- Hiren Thacker
65Thank You!