Title: Beam phase and intensity measurement
1Beam phase and intensity measurement
Grzegorz Kasprowicz Richard Jacobsson
2BPMs
Button Feedthrough
Beam Screen
Liquid Helium Cooling Capillary
3Pick-ups at IPs (BPTXs)
- Located 150m from the IP in front of the D2
Magnet - One BPTX either side of the IP on the incoming
beam - Exclusively used by the experiments
- Monitoring phase of the beam with respect to LHC
clock - Monitoring bunch intensity
4BPTXs
- Use Button Electrode BPM type
- Peak voltage (one button) of 5V after 200m of
cable for nominal bunch - Sum voltage from all buttons ? Independent of
beam position - Acquisition and processing?
5 BPIM specifications M - Measuring beam
intensity C - Collecting intensity results
per bunch and averaging them -Â Â Â Â Â - Outputting
intensity measurement at 40 MHz via LVDS
interface -Â Â Â Â Â -Â Resolution of intensity
measurement - 8 bits -Â Â Â Â Â -Â Measuring phase
between incoming bunch signal and bunch
clock -Â Â Â Â Â -Â Collecting delay results for
every bunch and averaging them -Â Â Â Â Â -Â Digital
approximation of converter characteristics -Â Â Â Â Â -
  Resolution of phase measurement better than
50ps -Â Â Â Â Â -Â Data processing in FPGA -
Ethernet based control interface -Â Â Â Â Â -Â All the
adjustments via the Ethernet - 6U VME
board
6 Beam intensity measurement
L
FPGA
ADC
Coefficients RAM
LPF
Linearization Block
Result 40MB/s
Delay Line 1
Delay Line 2
Pulse detect
Histogram Calculation Block
Threshold
RAM
Credit Card PC
Glue Card
Local Bus
Ethernet
7Beam phase measurement
FPGA
Coefficients RAM
LPF
Pulse detect
Threshold
Linearization Block
ADC
Flip Flop
12 bit
BCLK
Histogram Calculation Block
Delay Line 3
Delay Line 4
RAM
Credit Card PC
Glue Card
Local Bus
Ethernet
8Simulation results beam intensity measurement
rectified input signal integrators output
ADC sampling moment
input signal
9Simulation results beam phase measurement
Â
input signal integrators output
D flip-flop output BCLK ADC
sampling moment
rectified input signal
10Approximation  A first order polynomial
approximation is used All ADC range (0 to 4095)
is divided into 32 sub ranges In each of them,
measured value is described by equation
Ym aXreal b
where Xreal real measured value, Ym
measured value with error, a scaling
coefficient, b shift value  In order to
obtain a real value, circuit must realize
following equation
Xreal (Ym b) / a Â
Implementation of this needs only one multiplier
and adder
11BPIM PCB design