Title: Synchronous%20Digital%20Design%20Methodology%20and%20Guidelines
1Synchronous Digital Design Methodology and
Guidelines
2Synchronous Design
- All flip-flops clocked by one common clock
- Reset only used for initialization
- Races and hazards are no problem
3Synchronous Design
- Three things must be ensured by the designer
- Minimize and determine clock skew
- Account for flip-flop setup and hold times
- Reliably synchronize asynchronous inputs
4Timing Analysis
5Clock skew
6Example
- Determine the maximum frequency of the following
circuit with and without skew
7Clock Jitter
8Clock Gating
- Clock gating is done to disable the clock for low
power consumption using a clken signal - It is wrong to gate the clock in the following
way, instead use a synchronous load (enable)
signal
9Asynchronous Inputs
It is impossible to guarantee setup and hold
timing constraints on inputs synchronized with a
clock unrelated to the system clock
10Asynchronous inputs
- Synchronize only in one place
11(No Transcript)
12Metastability
- Metastability is a phenomenon that may occur if
the setup and hold time requirements of the FF
are not met, leading in the output settling in an
unknown value after unspecified time.
13MTBF
14Reliable synchronizer design
15Multi-cycle synchronizer
16Example
- Design a synchronizer that synchronizes two
inputs async1 and async2 generated with a 50 MHz
clock CLK1, to a system with a 33 MHz clock CLK2
totally independent of CLK1. Draw appropriate
timing diagrams.
17Multi-cycle synchronizer with deskewing
18Cascaded synchronizer
19Example
- Design a digital synchronizer to capture valid
data according to the following timing diagram
20Solution
21Synchronizing high-speed data transfers
- What happens when the asynchronous inputs are
clocked faster than the system clock?
22Case study Ethernet receiver
23Byte holding register
24SCTRL circuit
25Testing Basics
Defect A difference between intended design and
actual hardware Error A wrong output produced
through a defect Fault A defect in a higher
abstraction level
26Example
27Controllability and observability
- Controllability The difficulty of setting a
specific signal to 0 or 1 - Observability The difficulty of reading a
specific signal - Electron beam testing is too expensive
- Must set signal through primary inputs and
observe through primary outputs
28Design For Testability (DFT)
29Boundary scan
- In boundary scan, all flip-flops enter a test
mode where they are controllable and observable - After functional verification, normal flip-flops
are replaced by scan flip-flops - Only D flip-flops must be used
- Clocks must not be generated internally
30Built-In Self-Test (BIST)