Noise Modeling at Quantum Level for Multi-Stack Gate Dielectric MOSFETs. Zeynep elik-Butler Industrial Liaisons: Ajit Shanware, Luigi Colombo, Keith Green, TI ...
Angle Resolved x-ray Photoelectron Spectroscopy, ARXPS Experience in the Wafer Processing Industry so far C.R. Brundle, C.R. Brundle & Associates, Soquel, CA
... occurs primarily via the generation of (photo) electrons in the metal and the ... Scanning probe microscopy topography, surface damage, electrical defects ...