PowerPointPrsentation

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G. Kaupp, M. R. Naimi-Jamal Powerpoint
Presentation, ECM22 Budapest, August 26-31, 2004
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G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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loading FN k h3/2 k µN/nm3/2
indentation coefficient
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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The relation of normal force and normal
displacement
FN kh3/2 (k µN/nm3/2 indentation
coefficient)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Crystalline SiO2 and SrTiO3
trigonal a-quartz monoclinic coesite (gt2.2
GPa) tetragonal stishovite (gt8.2 GPa)
cubic SrTiO3(Pm-3m) tetragonal (I4/mcm) ?
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Anthracene, coefficients and work of indentation

G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Isotropic and anisotropic indentation responce
Far-reaching phenomena with crystals
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Face anisotropy in nanoindentations
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Appearances of nanoscratches by AFM
Z range 50 nm
ramp experiment
constant normal force
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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The relation of lateral force and (fixed) normal
force
FL KFN3/2 (K scratch coefficient
N-1/2)
The value for the lateral force gives the scratch
work µNµm for 1 µm scratch length
Fused quartz and cube corner indentation tip,
edge in front
Linear plot through the origin only with exponent
1.5 (not 1 or 2)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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The relation of lateral force and (fixed) normal
force
SrTiO3 (100), 0, cube corner edge in front
exponent 1.5 (not 1 or 2) the steep line in (b)
corresponds to phase transformed SrTiO3
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Angular and facial dependence of specific scratch
work on strontium titanate at different normal
loads (WSc, spec FL.1 µNµm)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Angular dependence of specific scratch work on
(1-100) of a-quartz and crystal packing
spec.WSc FL.1 µNµm work for 1 µm scratch
length of the indented tip
(1-100), scratch work per µm scratch length
(FN1482 µN) Angle
µNµm 90 206
45 223
0 225
c-direction alternation of 0.5405nm Si-Si rows
the other directions are less distant and the
skew (10-11) cleavage plane is cutting in
c-direction
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Molecular migrations under (110) of thiohydantoin
(a) 0
(b) 90
(c) 180
(d) 270
   


(P21/c)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Reason for the orientational specifity on (110)
of thiohydantoin
cleavage planes between steep (66) monolayers
Geometric model for the understanding of the
marked anisotropies upon scratching over skew
cleavage planes in four orthogonal directions
In all directions FL K.FN3/2 is valid
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Nanoscratching of anthracene on (110)
(110) on top
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Nanoscratching on the layers
(001) on top anthracene
ramp nanoscratching at 0-150 µN on (001)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Tetraphenylethene (P21) on (10-1)
Poor vertical (010) cleavage planes between
monolayers of bulky molecules
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Nanoscratching along the polar axis of ninhydrin
edge in front
180
(P21)
180
side in front
180
Cube corner scratches on ninhydrin (110) along
the polar axis
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004
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Thiourea, anisotropic nanoscratching on (100)
b
a
(100)
c
(image rotated by 10 around x and y)
(Pbnm)
a) along 010 (b)
b) along 001 (c)
ramp nanoscratching at 0-150 µN
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest,
August 26-31, 2004