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Implication Graphs and Logic Testing

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Title: Implication Graphs and Logic Testing


1
Implication Graphs and Logic Testing
  • Vishwani D. Agrawal
  • James J. Danaher Professor
  • Dept. of ECE, Auburn University
  • Auburn, AL 36849
  • vagrawal_at_eng.auburn.edu
  • www.eng.auburn.edu/vagrawal
  • Joint research with M. L. Bushnell, Rutgers
    University, Piscataway, NJ
  • K. K. Dave, ATI Research, Yardley, PA

2
Implication Graph
  • An implication graph (IG) represents the
    implication relations between pairs of Boolean
    variables.

a
b
an implication
contrapositive implication
a
b
3
Implication Graph of a Logic Gate
c ab
Boolean false function ab c 0
ac bc abc 0
a
c
b
c
a
b
  • Chakradhar et al. -- IEEE-DT, 1990

4
Global Implications and Transitive Closure
a
c
b

a
c
b
Transitive closure edge
c
a
b
c 0
5
Transitive Closure
  • Transitive closure (TC) of a directed graph
    contains the same set of nodes as the original
    graph.
  • If there is a directed path from node a to b,
    then the transitive closure contains an edge from
    a to b.

A Graph
Transitive Closure
a
a
b
b
a b c d a 0 1 0 0 b 0 0 1 0 c
0 0 0 1 d 0 0 0 0
a b c d a 0 1 1 1 b 0 0 1 1 c
0 0 0 1 d 0 0 0 0
d
d
c
c
A graph
6
Transitive Closure Warshalls Algorithm
procedure Warshall (var A array1n, 1n of
boolean C array1n, 1n of boolean)
Warshall makes A the transitive closure of C
var i, j, k integer begin for i 1
to n do for j 1 to n do Ai, j
Ci, j for k 1 to n do O(n3) for i
1 to n do for j 1 to n do if Ai,
j false then Ai, j Ai, k and Ak,
j end Warshall
S. Warshall, A Theorem on Boolean Matrices, J.
ACM, vol. 9, no. 1, pp. 11-12, 1962. A. V. Aho,
J. E. Hopcroft and J. D. Ullman, Data Structures
and Algorithms, Reading, Massachusetts
Addison-Wesley, 1983, p. 213.
7
Transitive Closure Update Algorithm
  • Start constructing transitive closure (TC) by
    placing all nodes and no edges. This edge-less
    graph is its own TC.
  • Add edges to TC in any arbitrary order
  • For each edge i ? j find
  • P set of parent nodes of i
  • C set of child nodes of j
  • Add edges P, i ? C, j

K. Dave, Using Contrapositive Rule to Enhance
the Implication Graphs of Logic Circuits,
Masters Thesis, Rutgers University, Dept. of
ECE, Piscataway, New Jersey, May 2004.
8
Update Algorithm
p2
p1
P, i
Edges before i? j is added
i
Edges after i? j is added
j
C, j
c1
9
Update Algorithm Example
b
a
a
b
c
d
c
d
A directed graph
a
a
a
b
b
b
c
c
c
d
d
d
Transitive closure
10
Logic Testing Stuck-at Fault
  • A type of fault, which causes a line to hold a
    constant logic value, irrespective of change of
    state at previous stages.
  • There are two types of stuck-at-faults
  • Stuck-at-1
  • Stuck-at-0
  • Detection of a fault requires the fault to be
    activated and its effect observed at a primary
    output (PO).
  • Fault a s-a-1 is detectable, if following
    conditions are simultaneously satisfied
  • a 0 fault is activated
  • Oa 1 observability is true

11
Observability Variables
  • Observability variable of a signal represents
    whether or not that signal is observable at a PO.
    It can be true or false.

Oa
Oc 1
Oc
a b
Oa
c
b
(PO)
Ob
Agrawal, Bushnell and Lin, Redundancy
Identification using Transitive Closure, Proc.
Asian Test Symp., 1996, pp. 5-9.
12
Redundant Faults
  • A fault that has no test is called an untestable
    fault.
  • Any untestable fault in a combinational circuit
    is a redundant fault because it does not cause
    any change in the input/output logic function of
    the circuit.
  • Identification of redundant faults is useful
    because they can be removed
  • from testing consideration, or
  • from hardware
  • Fault a stuck-at-1 is redundant if
  • either a 1 no controllability
  • or Oa 0 no observability
  • or a 0 ? Oa 0 no drivability
  • or Oa ? a no drivability

13
Limitation of Implication Graph
c
a
b
c
a
d
s-a-0
e
s-a-0
b
d
Circuit with two redundant faults
Implication graph (some nodes and edges not shown)
Implication graph shows no implications of c and
d on their observabilities.
14
Adding Partial Implications
c ab
Boolean false function ab c 0
ac bc abc 0
a
c
b
Henftling and Wittmann, AEÜ, 1995 (? node)
?
Dave, Masters Thesis, 2004 (V node)
c
a
b
? and V nodes represent partial implications
V
15
Using Partial Implications
c
a
b
c
a
d
s-a-0
e
s-a-0
b
d
Circuit with two redundant faults
Implication graph (some nodes and edges not shown)
Implication Partial implication
Transitive closure edge
16
Another Example
s-a-0 s-a-1
a
c
b
s-a-0
e
s-a-0 s-a-1
d
Contrapositive of d ? e
e
a
c
d
b
?1
?2
?3
a
e
c
d
b
e 0
?4
V1
V2
17
Results on ISCAS Circuits
aSun SPARC5 CPU Sec.
bSun SPARC2 CPU Sec.
18
Referenced Methods
  • TRAN ATPG
  • S. T. Chakradhar, V. D. Agrawal and S. G.
    Rothweiler, A Transitive Closure Algorithm for
    Test Generation, IEEE Trans. CAD, vol. 12, no.
    7, pp. 1015-1028, July 1993.
  • FIRE Implication analysis
  • M. A. Iyer and M. Abramovici, FIRE A
    Fault-Independent Combinational Redundancy
    Identification Algorithm, IEEE Trans. VLSI
    Systems, vol. 4, no. 2, pp. 295-301, June 1996.
  • Implication Graph
  • V. J. Mehta, Redundancy Identification in Logic
    Circuits using Extended Implication Graph and
    Stem Unobservability Theorems, Masters Thesis,
    Rutgers University, Dept. of ECE, New Brunswick,
    NJ, May 2003.
  • K. K. Dave, Using Contrapositive Rule to Enhance
    the Implication Graphs of Logic Circuits,
    Masters Thesis, Rutgers University, Dept. of
    ECE, New Brunswick, NJ, May 2004.

19
C1908 Unidentified Redundancies
Redundant faults (s-a-1)
952
949
0/1
0
979
953
887
926
0
74
Total redundant faults 7 identified 5
20
C5315 Unidentified Redundancy
Redundant fault (s-a-1)
PI
1
0
0
0/1
0/1
1
1
PI
1
0/1
0/1
PO
0
0
0
1
1
1
1
1
Total redundant faults 59 identified 58
21
C5315 Continued . . .
Redundant fault (s-a-1)
PI
1
1
0/1
0/1
0/1
1
1
PI
0
0
0/1
PO
1
1
1
0
1
0
0
1
22
Conclusion
  • Partial implications improve fault-independent
    redundancy identification present results are
    the best known.
  • Transitive closure computation run times are
    empirically linear in the number of nodes for
    benchmark circuits -- the known worst-case
    complexity is O(N3) for N nodes.
  • Update algorithm can efficiently compute
    transitive closure when implication graph has
    sparse connectivity.
  • Weakness of implication method Observability of
    fanout stems. Recent work has shown that some
    unobservable fanout stems can be identified from
    transitive closure analysis.

Observability of a has no direct relation to
observabilities of b and c, but can be related
to that of d
b
Dominator
Reconvergent gate
a
d
c
23
Our Students
  • Srimat Chakradhar, NEC
  • Qing Lin, Sun Microsystems
  • Philip Stanley-Marbell, CMU Graduate Program
  • Vivek Gaur, Synopsys
  • Vishal Mehta, UCSB PhD Program
  • Kunal Dave, ATI
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