Title: Reactive Ion etching
1Reactive Ion etching
Advantages of dry etching no dangerous liquid
(but, toxic corrosive gases) anisotropic etch
profile high resolution, faithful pattern
transfer
Basic configuration of RIE
RF(13.56MHz)
2Reactive Ion etching
Etch species for specific materials
Si fluorine/chlorine SiO2 CF4 Organics
O2 Metals compound semiconductor Cl-based
Effect of process parameters on etch behavior in
RIE anisotropiy etch rate uniformity
selectivity damage RF power ?
? ? ?
? ? Pressure
? ? ?
? ? ?
Gas flow rate greater the better (limited by
pumping system)
3Reactive Ion etching
- Some selected etch recipes (PlasmaTherm RIE in
MRL) - (anisotropic etch, if pressure is below 50mTorr
and DC voltage is larger than 200V) - SF6, 40sccm, 50mTorr, 100W 1um/min. Si
- 150W
1.5um/min. Si - SF6 isotropic etch for Si (similar to wet
chemical etching) - mix with O2 for anisotropic
sidewall - high selectivity over SiO2
(almost no etch of SiO2 at low power) - SF6/O2, 20/20sccm, 150mTorr, 300W 1um/min. Si
- 20nm/min. SiO2
- CF4, 40sccm, 50mTorr, 100W 12nm/min. SiO2
- 30nm/min. Si
- CHF3/CF4, 15/5sccm, 150mTorr, 300W, 100nm/min.
SiO2 - CHF3/O2, 40/5 sccm, 20mTorr, 150W 15nm/min.
SiO2 - O2, 10sccm, 20mTorr, 100W 80nm/min. PR
(anisotropic etching ? de-scum) - O2, 20sccm, 50mTorr, 200W for PR ashing
- O2, 20sccm, 100mTorr, 100W 40nm/min.
- SF6/O2, 10/10sccm, 20mTorr, 200W 25nm/min. Ta
(sputtered) - CF4/O2, 25/5sccm, 100mTorr, 200W 40nm/min. Mo
(evaporated)