Ugur Kalay,

1
Universally Testable AND-EXOR Networks

• Ugur Kalay,
• Marek Perkowski, Douglas Hall

Speaker Alan Mishchenko
Portland State University
2
Agenda

• Introduction
• desired properties of a test set
• testing AND and EXOR gates
• test scheme proposed by Reddy
• Testing Two-level AND-EXOR Networks
• implementation of the new testing scheme
• experimental results
• Testing Multi-Level AND-EXOR Networks
• extending the scheme for multi-level circuits
• Conclusions and Directions of Future Research

3
Introduction
Requirements for a Test Set

• 100 Fault Coverage
• no fault simulation
• Minimal (as few tests as possible)
• shorter testing time
• Universal (does not depend on the circuit)
• portability of the pattern generator
• reduced engineering
• Regular (test patterns have certain structure)
• simpler pattern generator
• Good Scalability
• easy pattern generator expandability

4
Introduction
Testing AND gate
1
a
4
2
b
3
c
5
Introduction
Testing EXOR gate
a
g
b
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Introduction

• Reddys Positive Polarity Reed-Muller Testing
  Scheme
• Example f x1x2 Å x1x3 Å x1x2x3
• 
  x0 x1 x2
  x3 x0 x1
  x2 x3
• 
  0 0 0
  0 - 0 1 1
• 
  T1 0 1 1
  1 T2 - 1 0 1
• 
  1 0 0
  0 - 1 1 0
• 
  1 1 1
  1
• 
  
  - dont care

100 Single Stuck-at Fault Coverage
Minimal (C n 4)
Universal
Regular Patterns
Linear increase
Large expression leads to long EXOR cascade
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Introduction

• Other Reed-Muller Canonical Forms
• PPRM (Positive Polarity Reed-Muller)
• x1x2x3 Å x1x2
• FPRM (Fixed Polarity Reed-Muller)
• x1x2x3 Å x2x3
• GRM (Generalized Reed-Muller)
• x1 Å x2 Å x2x3
• Free Expression
• ESOP (EXOR-Sum-of-Products)
• x1x2x3 Å x1x2x3

ESOP
GRM
FPRM
PPRM
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Introduction

• Comparison of the Number of Product Terms

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Testing Two-level AND-EXOR Networks
100 single stuck at faults
Minimal C n 6
Universal
Regular
Linear size increase
Perfect for BIST !
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Testing Two-level AND-EXOR Networks
Advantages of deterministic testing for ESOP

• much shorter test cycle than pseudo-random and
  pseudo-exhaustive test sets
• better fault coverage than a pseudo-random test
  set
• no test point insertion required
• a fixed, simple, and easily expandable pattern
  generator

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Testing Two-level AND-EXOR Networks

• Built-in Self-Test Circuitry for ESOP Networks

PRPG
EDPG
Circuit Under Test
Easily Testable 2-level ESOP Network
MISR
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Testing Two-level AND-EXOR Networks

• ESOP Deterministic Pattern Generator

• Linearly expandable
• No initialization seed circuitry
• Much shorter cycle than a PRPG
• Comparable size to PRPG (see later)

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Testing Two-level AND-EXOR Networks

• FSM (Part II) for EDPG

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Testing Two-level AND-EXOR Networks
Experimental Results

• Comparisons of the number of test vectors for
  100 single stuck-at fault fault coverage

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Testing Two-level AND-EXOR Networks

• Comparisons of the number of test vectors for
  100 single stuck-at fault fault coverage (cont)

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Testing Two-level AND-EXOR Networks

• Area and delay comparisons (LSI Logic Corp., 0.5
  micron)

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Testing Two-level AND-EXOR Networks

• Area comparisons (Cont...)

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Testing Two-level AND-EXOR Networks

• Multiple Fault Simulation Results

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Testing Multi-level AND-EXOR Networks

• Two-level implementations
• easily testable
• large delay
• It is possible to factorize the two-level ESOP
  expression
• Universal testing of two-level ESOPs can be
  adopted for multi-level testing
• requires scan registers

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Testing Multi-level AND-EXOR Networks
Example The multi-output function, X acefg Å
acefg Å adefg Å adefg Å ajhi Å ajd Å
bcefg Å bcefg Å bdefg Å bdefg Å
bhij Å bdj Y bg Å acefg Å adefg Z
adj Å bdj Å ahij Å bhij can be factorized
as, X UV(efg Å efg) Å jW Y bg Å
aefgV Z jUW where, U a Å b V c Å
d W hi Å d
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Testing Multi-level AND-EXOR Networks

• Implementation without testability improvements

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Testing Multi-level AND-EXOR Networks

• Inserting Literal Part

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Testing Multi-level AND-EXOR Networks

• Inserting Check Part

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Testing Multi-level AND-EXOR Networks

• Creating cascade of EXOR gates at each level

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Testing Multi-level AND-EXOR Networks

• Identifying ESOP Planes

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Testing Multi-level AND-EXOR Networks

• Inserting specialized Scan Registers and Scan Path

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Testing Two-level AND-EXOR Networks

• TESTING SCHEME
• Each level is tested separately (can be improved)
• ESOP planes of the same level are tested in
  parallel
• Test vectors of the first level are applied from
  the primary inputs in parallel
• Test vectors of the internal levels are applied
  from the primary inputs and from the scan
  registers
• The bits applied from the scan registers are
  shifted into the scan path before applied in
  parallel
• The network results are collected by the scan
  registers and shifted out, and/or observed from
  the primary outputs

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Testing Multi-level AND-EXOR Networks

• Implementation of Scan Registers

• In normal circuit operation, only one mux delay
  added

• Inserted only at the output of internal ESOP
  planes

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Testing Multi-level AND-EXOR Networks

• Scan Register mode of operations

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Testing Multi-level AND-EXOR Networks

• Scan Register mode of operations

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Testing Multi-level AND-EXOR Networks

• Scan Register mode of operations

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Testing Multi-level AND-EXOR Networks

• Critical Path Delay 2.95 ns

vs. 4.33 ns of 2-level impl.
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Testing Multi-level AND-EXOR Networks

• (4 AND3 5 AND2 24 EXOR2) gates 5 SR

vs. (17 AND3 24 AND2 33 EXOR2) gates of
2-level impl.
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Future Directions

• Developing a universal test set for bridging and
  stuck-open faults
• Developing a factorization/decomposition method
  targeting EXOR-based multi-level synthesis and
  universal (deterministic) testability

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Advantages and Disadvantages of the New Scheme

• Test set is exponentially smaller than a
  pseudorandom test set and much smaller than
  algorithmically generated test set for 100
  coverage of single stuck-at faults
• Properties of deterministic pattern generator for
  BIST
• easy to implement (small area overhead)
• does not require seed generation
• guarantees 100 testability
• Detects significant fraction of multiple stuck-at
  faults and bridging faults
• Cascade of EXOR gates is relatively slow
• Area of the AND-EXOR circuit is relatively large
• ESOP factorization algorithm is computationally
  complex

36
Rereferences
1 Ugur Kalay, Douglas V. Hall, Marek A.
Perkowski. A Minimal Universal Test Set for
Self-Test of EXOR-Sum-of-Products Circuits. IEEE
Trans. Comp. Vol. 49, N3, March 1999,
pp.267-276.2 Ugur Kalay, Marek Perkowski.
Rectangle Covering Factorization of EXORs into
Scan-Based Levelized Circuits with Universal Test
Set. Proc. of International Workshop on
Application of Reed-Muller Expansion in Circuit
Design. 1999.