Title: Deposition of Coatings by PECVD
1Deposition of Coatings by PECVD
- Jung-Hyun Park
- EE7730
- Department of Electrical Engineering
- Auburn University
- Fall 2003
2Review of CVD
- Film deposition by initiating a chemical reaction
inside a chamber filled with reagents vaporized
in an inert carrier gas - Energy supplied by the surroundings causes the
diffused reagents to react thus forming the
desired material film across the target surface
3Growing Steps of CVD
- Gas phase Diffusion
- Gas phase Reaction
- Absorption
- Surface Reaction
- Surface Diffusion
- Incorporation into the crystal lattice
- Desorption
- Gas phase Diffusion
Reactant gases
Exhaust gases
(a)
(h)
(b)
(g)
(c)
(f)
(d)
(e)
Surfase
http//www.postech.ac.kr/mse/tfxs/lecture_2000_1/
chapter4.ppt http//cape.uwaterloo.ca/che100projec
ts/vapourdep/sld001.htm
4CVD Process Types
- APCVD (simply CVD, atmospheric pressure CVD)
elevated temperature but at near atmospheric
pressures (105 Pa) - LPCVD (low pressure CVD) utilizes vacuum (lt
10 Pa) to increase deposition rate and uniformity - PECVD (plasma enhanced CVD) enhancing the
reactions and permitting very low deposition
temperatures
5Question
- What are the advantages/disadvantages of PECVD
compared to other types of CVD process ?
6APCVD Reactor
- Advantages
- High throughput
- Good uniformity
- Handle large wafers
- Disadvantages
- Fast gas flows
- Needs frequent cleaning
http//www.timedomaincvd.com/CVD_Fundamentals/Fund
amentals_of_CVD.html
7LPCVD Reactor
- Advantages
- Excellent uniformity
- Large load size
- Hold large wafers
- Disadvantages
- Low deposition rates
- Toxic, corrosive or flammable gases
http//www.timedomaincvd.com/CVD_Fundamentals/Fund
amentals_of_CVD.html
8PECVD Reactor
- 50 kHz 13.56 MHz power source
- Vacuum 0.15 torr
- Advantages
- Low deposition temperature
- Low power source
- Disadvantages
- Limited capacity
- Individual wafer loading
- Easily contaminated
http//www.timedomaincvd.com/CVD_Fundamentals/Fund
amentals_of_CVD.html
9Why PECVD? (1)
- encourage deposition at much lower
temperatures and pressures than would be required
for thermal CVD.
TEOS tetraethyl orthosilicate, Si(OC2H5)4
http//www.batnet.com/enigmatics/semiconductor_pro
cessing/CVD_Fundamentals/plasmas/plasma_deposition
.html
10Why PECVD? (2)
- The second reason to use plasma deposition is
that surfaces exposed to a plasma are subject to
bombardment by energetic ions, whose kinetic
energy can vary from a few eV to 100's of
electron volts. - Ion bombardment of this nature has very
significant effects on the properties of the
deposited film. Increasing ion bombardment tends
to make films denser and cause the film stress to
become more compressive - However, excessive compressive stress can also
lead to impaired reliability. The ability to
adjust stress, through changes in process
conditions, chamber geometry, or excitation
http//www.timedomaincvd.com/CVD_Fundamentals/plas
mas/plasma_deposition.html
11Why PECVD? (3)
- A final important benefit of plasma deposition is
the ability to easily clean the reactor. For
example, by introducing a fluorine-containing gas
(e.g. CF4) and igniting a plasma, one can clean
silicon, silicon nitride, or silicon dioxide from
the electrodes and chamber walls. - Chamber cleaning is of great practical
importance thick films built up on the parts of
a chamber may create particles which can fall
onto the substrates and cause defects in circuit
patterns in semiconductor
12Disadvantages of PECVD
- Limited capacity PECVD systems
require wafers to lie flat on the bottom wafer.
Only one wafer side can be coated at a time
unlike LPCVD (wafers loaded vertically). PECVD
can coat 14 wafers at one time whereas LPCVD can
coat up to 25 wafers
13Deposition of Organic Film
Deposition of Inorganic Film
- Amorphous Hydrogenated Silicon (a-SiH)
- Silicon Dioxide (SiO2)
- Silicon Nitride (SiN)
- Silicon Carbide (SiC)
- Poly Silicon (poly-Si)
- Diamond Like Carbon (DLC)
Alfred Grill, Cold Plasma in Materials
Fabrication, IEEE press
14Plasma Polymerization
- Atomic process
- Polymers are most case highly branched and highly
cross-linked - Strongly system-dependent process
- Controlled under parameters pressure, plasma,
gas flow and applied electrical output
http//www.eurobonding.org/Englisch/Oberflaechen/P
lasma_polymerization.htm
15Plasma Polymerization
- characteristics - excellent coating adhesion on
almost all substrates - - chemical, mechanical and thermal
stability - - high chemical barrier effect
- Applications - scratch resistant coatings
- - corrosion protection
- - anti-bonding, anti-soiling coatings
- - barrier layers
http//www.vergason.com/pdfDocs/VTI20papers,20Pl
asma20Polymerization,20Theo.20Prac..pdf
16Deposition of Inorganic Film
- Diamond Like Carbon (DLC)
capping material which exhibits
radiation-hardening characteristics. devices
developed for the military - Amorphous Silicon (A-Si)
production of solar cells - Poly Silicon (poly-Si) Silicon Nitride (SiN)
A-Si and poly-Si are
conductive and depending upon their quantities
having varying conductive properties
http//www.plasmaequip.com/WHAT20IS20PECVD.pdf
17Dielectric and Poly-Si Films
- Most commonly used films
- Poly-Si, SiO2, Si3N4 and SiNx
- Most commonly deposition methods
- APCVD, LPCVD, PECVD
- Most common applications
- Doped poly-Si as MOS gates
- SiO2 as interlevel dielectric
- Si3N4 as diffusion and sodium barrier
- SiNx as chip passivation layer
18Deposition Processes
19Poly-Si Deposition
- Reactor pressure can be controlled by
- Pumping speed
- Nitrogen flow
- Total gas flow with constant ratio
- Deposition reproducibility is best when the
pressure is controlled by pumping speed
http//www.engr.sjsu.edu/lhe/lectures/lecture205(
chap2011-20II).pdf
20Poly-Si Deposition
- Poly-Si films deposited below 580C is amorphous
- Poly-Si films deposited above 625C is
polycrystalline and has a columnar structure
http//mmadou.eng.uci.edu/Classes/MSE621/MSE62101(
14).pdf
21SiO2 Step Coverage
- TEOS at 700C
- Silane-O2 at 450C and low P
- Silane-O2 at 480C and Atm. P
file///C/Documents20and20Settings/joshua/Local
20Settings/Temporary20Internet20Files/Content.I
E5/SX0PO7AF/445,7,Step Coverage over Trench
22Properties of Deposited Oxides
23Properties of Deposited Nitrides
- LPCVD nitride is stoichiometric and a good
barrier against oxidation and sodium diffusion - PECVD nitride contains a large amount of hydrogen
and can be etched with HF
24Low-Temperature Deposited Dielectrics
25Summary
26Answer
- Advantages
Lower substrate temperatures, Faster
deposition rate, Good adhesion, Good step
coverage, Low pinhole density - Disadvantages
Chemical and particulate contamination, limited
capacity