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An Architectural Exploration of Via Patterned Gate Arrays

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Title: An Architectural Exploration of Via Patterned Gate Arrays


1
An Architectural Exploration of Via Patterned
Gate Arrays
  • Chetan Patel, Anthony Cozzie, Herman Schmit,
    Larry Pileggi
  • Center for Silicon Systems Implementation
    Carnegie Mellon University

2
Outline
  • Overview of VPGA
  • Exploring the area between ASICs and Programmable
    ICs.
  • CLB exploration of Look-Up Table sizes
  • Area Model
  • Delay Model
  • Results
  • Interconnect exploration
  • Switch Block
  • Crossbar
  • Results
  • Conclusion

3
The future of ASIC designs?
eFPGA ICCAD 2002
4
Manufacturability issues
  • Becoming more difficult to anticipate all
    potential failures
  • Cannot simply increase design rules to prevent
    all possible manufacturing failures
  • As optical wavelengths approach critical
    distances, problems arise with the physical
    geometries
  • Manufacturability and timing are greatly affected
    by process variations

130 nm lithography without optical proximity
correction IBM Corp
5
Programmable ICs
  • Programmable ICs combat the problem facing ASICs
    by offering numerous advantages
  • Regular geometrical patterns
  • Predictability
  • Built-in testability
  • Reprogrammability
  • With advantages comes critical disadvantages
  • Lower performance
  • Higher power
  • Larger chip area

6
New Circuit Fabrics
  • VPGA attempts to explore the middle ground
    between ASICs and FPGAs
  • Leverages the regularity and predictability of
    FPGAs with the performance and power consumption
    of an ASIC
  • Regular patterns for address the issues facing
    manufacturability
  • Regular logic blocks allow predictability in
    timing and power
  • Prefabrication of wafers up to Metal 2
  • Allows for shared mask costs across an
    application domain

7
VPGA
  • Via Patterned Gate Array
  • Regular logic blocks that are via configurable
  • Wafers prefabricated up to Metal 2 layer and
    customization done during BEOL (back end of line)
    manufacturing
  • Regular power distribution and clock like an FPGA
  • Fixed regular interconnect architecture
  • Talk primarily aims at what determining the
    composition of the CLB and also the fixed
    interconnect architecture

8
Architectural Decisions
  • Look-Up Table Experiment
  • Architecture of VPGA very similar to that of an
    FPGA (regular logic blocks connected by a fixed
    interconnect architecture)
  • Because of these similarites, reconstruct LUT
    size experiments conducted on FPGAs
  • Using a simple CLB configuration, replace the
    FPGA components with their VPGA counterparts

9
Experimental Flow
10
LUT Area Model
  • Assume each LUT is a k-1 level tree with
    complimentary pull up and pull down network
  • Each of the leaf nodes can connect directly to
    VDD, ground, or another kth input or its
    compliment
  • Area model must account for customization
  • Customization done between Metal 2 and Metal 3
    layers
  • Extra area required for local interconnect

11
continued
12
LUT Delay Model
  • To keep consistency with Area Model, all
    transistors were minimum size
  • Using STs 0.13 mm technology, we simulated each
    of the LUTs in HSPICE
  • Each LUT configured to perform NAND function for
    ease of testing

13
CLB Area/Delay Model
  • The CLB area must also include the area taken up
    by the I/O buffers as well as the DFF.

3 LUT 4 LUT 5 LUT
LUT area (mm2) 45.02 113.36 260.70
LUT delay (ps) 88.70 118.60 152.60
CLB area (mm2) 125.18 207.04 369.45
14
Results
15
LUT size conclusions
  • LUT size of 4 superior in terms of Total area and
    also critical path delay
  • LUT size of 3 is comparable to a 4 LUT in terms
    of critical path delay
  • May warrant further investigation about which LUT
    is more beneficial in terms of a heterogeneous CLB

16
Interconnect Structures
  • Determine an interconnect structure suitable for
    VPGA that sits atop CLB
  • Can use vpr to model the interconnect with slight
    variations

VPGA
17
Switch Block architecture
18
Crossbar architecture
19
Tradeoffs
  • Routing architecture constrained to fit atop CLB
  • Switch block architecture much large and less
    dense than crossbar
  • Crossbar architecture has extra vias to segment
    wires
  • Crossbar architecture also has dangling
    capacitance problem

20
Experimental Flow
21
Results
22
continued
23
Conclusions
  • Switch Block architecture superior in terms of
    critical path
  • Crossbar architecture travels through many more
    vias
  • Vias add up with large fan-out nets
  • Crossbar architecture benefits
  • Increase flexibility which allows less routing
    tracks
  • Increased density also allows for more available
    tracks then then Switch Block
  • May be useful when routing congestion is a
    problem
  • May improve delay in crossbar architecture by
    segmenting wires, thus longer wires pass through
    less vias
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