Title: A NUCLEAR SPIN QUANTUM COMPUTER IN SILICON
1A NUCLEAR SPINQUANTUM COMPUTERIN SILICON
- National Nanofabrication Laboratory, School of
Physics, University of New South Wales - Laser Physics Centre, Department of Physics,
University of Queensland - Microanalytical Research Centre, School of
Physics, University of Melbourne
2MOTIVATION
- Quantum Computers will be the worlds fastest
computing devices, e.g. decryption (prime factors
of a composite number)- Factor a 400 digit
number 108 times faster - Spin-off technology development for conventional
silicon processing at the sub-1000Ã… scale
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4QUANTUM MECHANICAL COMPUTATION
5QUANTUM LOGIC
- Any quantum computation can be reduced to a
sequence of 1 and 2 qubit operations - H ingt H1 H2 H3 .... Hn ingt
- Conventional operations NOT, AND
Quantum operations NOT, CNOT
6QUANTUM ALGORITHMS
- Superposition and entanglement enables massive
parallel processing - Shors prime factorization algorithm (1994)
relevant to cryptography - Grovers exhaustive search algorithm (1996)
7EXPERIMENTAL QUANTUM COMPUTATION
- Bulk spin resonance (Stanford, MIT) 1-10?
qubits - Trapped cooled ions (Los Alamos, Oxford)
1-100? qubits - True quantum computer may require 106 qubits
- Solid state (semiconductor) quantum computer
architectures - Proposed using electron and nuclear spin to store
qubits - Electrons D. Loss and D. DiVincenzo, Phys. Rev.
A 57, 120 (1998). - Nuclei V. Privman, I. D. Vagner, and G.
Kventsel, Phys. Lett. A in press,
quant-ph/9707017.
8In SiP at Temperature (T)1K electron
relaxation time 1 hour nuclear relaxation time
1013 hours
9A Silicon-based nuclear spin quantum computerB.
E. Kane, Nature, May 14, 1998
10A J GATES
11Fabrication Pathways
- Fabrication strategies
- (1) Nano-scale lithography
- Atom-scale lithography using STM H-resist
- MBE growth
- EBL patterning of A, J-Gates
- EBL patterning of SETs
- (2) Direct 31P ion implantation
- Spin measurement by SETs or magnetic resonance
force microscopy - Major collaboration with Los Alamos National
Laboratory, funded through US National Security
Agency
12(1) Nano-scale Lithography
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14SINGLE ELECTRON TRANSISTORS
15ELECTRON BEAM LITHOGRAPHY
Sub-300Ã… AuPd gates on GaAs
16UNSW 3-CHAMBER UHV STM / AFM, MBE, ANALYSIS
- 25K - 1500K Variable T
- 3-Chamber UHV
- Plus Si-MBE, RHEED, LEED, Auger
17SRC MANAGEMENT STRUCTURE
18PROJECT TIMETABLE
19SUMMARY
- Quantum Computers have enormous potential
- Solid-state quantum computation is the best
candidate for scalability - Offers integration with existing Si technology
- UNSW strategy to use qubits stored on nuclear
spins (concept by Kane)
20The Melbourne Node
Node Team Leader Steven Prawer
Test structures created by single ion implantation
Atom Lithography and AFM measurement of test
structures
Theory of Coherence and Decoherence
21Key Personnel
- Students
- Paul Otsuka
- MatthewNorman
- Elizabeth Trajkov
- Brett Johnson
- Amelia Liu
- Leigh Morpheth
- David Hoxley
- Andrew Bettiol
- Deborah Beckman
- Jacinta Den Besten
- Kristie Kerr
- Louie Kostidis
- Poo Fun Lai
- Jamie Laird
- Kin Kiong Lee
- Geoff Leech DeborahLouGreig
- Ming Sheng Liu
- Glenn Moloney
- Julius Orwa
- Arthur Sakalleiou
- Russell Walker
- Cameron Wellard
- Academic Staff
- David Jamieson
- Steven Prawer
- Lloyd Hollenberg
- Postdoctoral Fellows
- Jeff McCallum
- Paul Spizzirri
- Igor Adrienko
- 2
- Infrastructure
- Alberto Cimmino
- Roland Szymanski
- William Belcher
- Eliecer Para
22Single Ion Implantation Fabrication Strategy
Etch latent damage metallise
Read-out state of qubits
MeV 31P implant
Resist layer
Si substrate
23MeV ion etch pits in track detector
- Single MeV heavy ions are used to produce latent
damage in plastic - Etching in NaOH develops this damage to produce
pits - Light ions produce smaller pits
3. Etch
2. Latent damage
1. Irradiate
From B.E. Fischer, Nucl. Instr. Meth. B54 (1991)
401.
24Single ion tracks
Depth
- Latent damage from single-ion irradiation of a
crystal (Bi2Sr2CaCuOx) - Beam 230 MeV Au
- Lighter ions produce narrower tracks!
1 mm
3 mm
5 mm
7.5 mm
3 nm
From Huang and Sasaki, Influence of ion velocity
on damage efficiency in the single ion target
irradiation system Au-Bi2Sr2CaCu2Ox Phys Rev B
59, p3862
25Project Management - A distributed system
Director Clark
Deputy Director Milburn
Theory/Modelling
Array fabrication
Readout
SET Dzurak
Magnetic Resonance (LANL)
Quantum Optics Rubeinstein-Dunlop
Single Ion Implantation Jamieson
Atom Lithography Prawer
Silicon MBE Simmons