Title: On-Line Adjustable Buffering for Runtime Power Reduction
1On-Line Adjustable Buffering for Runtime Power
Reduction
- Andrew B. Kahng?
- Sherief Reda
- Puneet Sharma?
- ?University of California, San Diego
- Brown University
2Outline
- Introduction
- Adjustable Buffering Methodology
- Experiments Results
- Conclusions
3Power First-Class Objective
- Power bottleneck to Moores law
- Power-frequency tradeoff exists in CMOS circuits
- Much higher power required to operate at high
frequency
- Techniques to exploit power-frequency tradeoff
are of interest - Allow high freq. operation
- Can give significant power reduction when max.
performance not required - Mainstream approach Dynamic voltage and
frequency scaling (DVFS)
Power-frequency tradeoff with VDD scaling
4Dynamic VDD Freq. Scaling
- Scale down VDD and freq. when high performance
not needed
- Limitations of DVFS
- VDD cannot be scaled down indefinitely
- Range of VDD scaling is small and diminishing
- Extremely high power at high VDD ? reduce max.
VDD - High Vth to reduce leakage, noise margins,
variability, soft errors ? increase min. VDD - Discrete allowed voltages
- Our objective enable additional modes to exploit
frequency-power tradeoff - Useable when VDD cannot be scaled further
- Useable without DVFS
5Proposal Adjustable Buffering
- Our approach, like DVFS, provides
runtime-selectable low-power modes ? supplement
or replace DVFS - Key idea Lot of logic added for performance, not
functionality ? Turn this logic off when
high-performance not needed - Poor interconnect scaling ? large number of
repeaters - 20-30 of cells are repeaters
- Fat repeaters are used to improve delay but
consume a lot of power - We modify repeaters to dynamically adjust their
driving capacity
6Outline
- Introduction
- Adjustable Buffering Methodology
- Experiments Results
- Conclusions
7Adjustable Repeater Design
We add PMOS-NMOS pair to turn half the devices
off dynamically
Control Gate
Control Gate
LPM ON ? only half devices operational
(low-power mode). LPM OFF ? all devices
operational (high-performance mode).
- What power components are likely to reduce in
low-power mode? - Short-circuit power during switching, PMOS
NMOS ON momentarily ? short circuit between VDD
and VSS - High when transition time (slew) is large
- Subthreshold leakage when one of PMOS-NMOS pair
between VDD and VSS ON
8Adjustable Repeater Requirements
- Low area overhead
- Added PMOS-NMOS pair (LPM devices) takes area
- LPM signal to be routed or locally generated
- Layout of the new cell must be simple and low
area overhead - High performance in high-performance mode
- On-resistance of LPM devices may reduce
performance - Good power reduction in low-power mode
9Area Overhead
- Problem High performance needed when LPM signal
OFF - ? use large control gates ? large area overhead
Delay overhead increase in delay of adjustable
repeater over traditional repeater
Solution Share control gates among multiple
repeaters
10Control Gate Sharing
- Fewer control gates but virtual VDD (VDD) and
VSS (VSS) need routing
- How many control gates needed?
- Compute simultaneous switching rate (SSR) by
finding the max. repeaters that have overlapping
timing windows. Time O(RlogR) (R repeaters) - Find total width of all repeater devices
controlled by CGs (WR) - For good performance, width of control gates 4
x SSR x WR - Typical SSR10 ? small area overhead
11Ensuring High Performance
- Problem Adjustable repeaters 5 slower when LPM
signal OFF - ? Up to 5 reduction in circuit performance
- Solution do not use adjustable repeaters on
timing-critical paths - Additional constraint slew constraints not
violated when LPM signal is OFF or ON. - We characterize adjustable repeaters (i.e., find
delay, slew, power, input capacitance) and then
substitute traditional repeaters with adjustable
repeaters subject to delay and slew constraints. - ? No loss in circuit performance no slew
violations
12Power Reduction in Low-Power Mode
Short-circuit energy and leakage reduce
OFF
OFF
Traditional Inverter
Adjustable Inverter
Reduction in short-circuit energy and leakage for
INVX8
Short-Circuit Energy Leakage
LVT 43 28
SVT 35 26
HVT 22 22
13Outline
- Introduction
- Adjustable Buffering Methodology
- Experiments Results
- Conclusions
14Experimental Validation
- Circuits s38417 (8,890 cells), AES (15,272),
OpenRisc (46,732) - Tools Synopsys HSPICE (SPICE), Design Compiler
(synthesis, timing and power analysis) Cadence
SoC Encounter (PR), SignalStorm (library
characterization) Artisan TSMC 90nm library
models - Other settings power and timing analysis at slow
corner, VDD of 1.1V and 0.9V, activity factor of
0.01.
15Results Power Reduction
- We perform comparative analysis of
- Circuit with DVFS
- Circuit with DVFS LPM
VDD0.9 LPM0
VDD1.1 LPM0
VDD0.9 LPM1
VDD1.1 LPM1
- Both dynamic and leakage power reduce
- 6-12 reduction in total power at low-power mode
16Results Area Overhead
- Logic area overhead due to control gates
- Depends on SSR
- Smaller if control gates can be placed in
whitespace
17Outline
- Introduction
- Adjustable Buffering Methodology
- Experiments Results
- Conclusions
18Conclusions
- Presented a novel technique that dynamically
trades off power and performance by turning off
devices not needed at less than max. performance - Both leakage and dynamic power reduce total
power reduction is 6-12 on our testcases - By sharing of control gates, area overhead
reduced to lt5.57 - No adverse affect on performance of the circuit
when LPM signal OFF - Future work
- Actual layout of adjustable repeaters with
routing of VDD, VSS, LPM nets to accurately
estimate power, performance, area impacts - Customization of more cells especially clock
repeaters to further improve power-performance
tradeoff
19Thank You