Title: ECEL304 Lecture 6
1ECE-L304 Lecture 6
- Review of Step 5
- Introduction to Step 6 and 7
- Final Lecture
- Quiz Next Week
2Up to now
- ADC is running
- What is your sampling rate?
- DAC is running
- What is your resolution?
- 555 Timer is running (or close to running)
- What is the frequency and duty cycle?
3The final stretch - What remains?
- Build 17 bit address generator for RAM
- Using 2 8 bit counters ?
- Build Control Circuitry to
- Take a reading on the ADC
- Store it to RAM
- Once RAM is filled, output recorded waveform
4Step 6 and 7
- Prelab
- Read the datasheets for the 74LS08 AND gate,
74LS112 JK flipflop, 74LS590 8-bit counter - Complete the Step 6 Prelab Worksheet
- Review RAM and ADC control logic
5Project CircuitProgress to Date
6Project CircuitStep 7 Blocks
7Step 6
- Part 1
- Assemble the 16-bit address generator
- Place the circuitry according to your floorplan
- Use the 555 counter as the clock for now
- Design and build a circuit that will provide a
17th bit - This step is required to get full hardware credit
- Confirm functionality using the logic analyzer
8Step 674LS590 Description
- 8-Bit Counter With Register
- Parallel Register Outputs
- Choice Of 3 State Or Open Collector Register
Outputs - Guaranteed Counter Freq DC To 20 MHz
9Step 674LS590 Description
- Multi-chip applications
- For cascading, a ripple carry output RCO is
provided. Expansion is easily accomplished for
two stages by connecting RCO of the first stage
to CCKEN of the second stage. Cascading for
larger count chains can be accomplished by
connecting RCO of each stage to CCK of the
following stage.
10Step 6Cascaded 74LS590 Chips
11Step 674LS590 Description
- Both the counter and register clocks are
positive edge triggered. If the user wishes to
connect both clocks together, the counter state
will always be one count ahead of the register.
12Part 2 - Measure AND Time Delay
- Wire the clock signal into two AND gates in
series to create a delay - Measure the delay and use this signal as the
input for your control circuitry - Use the oscilloscope to measure delay by placing
the input and output signals on the screen
simultaneously, trigger on the input signal and
use the cursors to measure the delay between
edges
13Step 6 Prelab
- Analyze the control circuit used in the Step 4
simulation
from Address Generator
Q
TC Terminal Count
Q
14Step 6 Prelab
- Graph the expected outputs
RE Read Enable OE Output Enable WE Write
Enable
Draw these curves
15Step 6 Prelab
- In your Prelab Workbook
- Sketch the schematic
- Sketch your control circuitry and timing diagrams
needed to control circuit
16What should the circuit do?
- The circuit should have two stages
- 1- Take 217 readings from the ADC and store then
in the RAM - 2- Take the ADC offline and write the recorded
signals from the RAM to the bus for output - Note - The ADC output and the RAM input/output
are all on the same bus, meaning that the ADC
cannot write outputs to the bus at the same time
as the RAM
17Part 3 - Control Circuitry
- First - decide which signals are involved in the
control circuitry - 555 Timer
- ADC controls
- RAM controls
- Second - create a timing diagram that describes
what the signals need to look like in order to
control the circuit properly
18Board Center Connectors
- ADC Control
- CS_, RD_, WR_, INTR_
- Power, GND
- RAM Control
- CE1_, CE2, OE_, WE_
- RAM Addresses
- A16 - A0
19RAM Controls
- Subset of NEC RAM (uPD431000A) Control
TableWe also have CS1 and CS2 to deal
with
WE
OE
Mode
L
X
WRITE
H
L
READ
Active Low Logic
20ADC Control
- Get the ADC off-line
- Our acquisition system has only one data bus,
which is shared by the ADC and the DAC - We have to take the ADC off-line during the RAM
READ cycle so we do not have the ADC and RAM
writing to the bus simultaneously
21ADC Control
- Specify when to get new data
- Take the ADC out of its current free-running mode
- In free-running mode, the INTR pin signal
initiates a new data conversion when it falls - Synchronize the system
- Generate a new memory address every clock cycle
- Put new data on the bus every clock cycle
22ADC ControlADC0804 Pins
CS Chip Select RD Read WR Write INTR
Interrupt
23ADC ControlFree-Running Circuit
CS Chip Select RD Read WR Write INTR
Interrupt
24ADC ControlFree-Running Circuit
- While CS is low, acquisition starts whenever WR
drops - How can this happen?
- Start switch is grounded
- INTR output falls
25ADC ControlFree-Running Circuit
- While CS and RD are low, data will appear at the
outputs DB7DB0 as soon as it is ready - About 72 internal clock cycles
26ADC ControlFree-Running Circuit
100 ns min
Rising transition on WR begins the conversion
27ADC ControlFree-Running Circuit
RD must be low for data to appear at outputs.
When RD is high, outputs are Hi-Z.
28ADC Control
- Redesign the connections to the ADC control pins
to get the results you want - Details of the pin functions are on the data
sheet - Diagrams of control sequences are on the data
sheet
29(No Transcript)
30The first task is to make sure the 555 clock and
the ADC internal clock are coordinated.
31If WE_ never rises, no conversions will occur.
32If there are no conversions, INTR_ will stay high.
33There should be no pulses on WR_ in READ mode.
34When RD_ is high the ADC output is high-impedance.
35OE_ is low in READ mode.
36Draw a Timing Diagram for the Control Circuitry
- Which signals are involved
- Which ones are inputs and which are outputs
- What should the signals look like in order to get
the correct behavior - Try writing the sequence of steps down in words
first, then creating the timing diagram - Keep in mind which signals are active low and
active high, what state does a signal need to be
in during a stage where it is not switching?
37Timing Diagram
- Complete a timing diagram and circuit schematic
for the controls - Have Eric check your results before you begin
construction, and be ready to answer questions
about your decisions
38Hints
- Dont connect power supplies incorrectly now, if
your RAM goes you will not be happy - Remove your ADC chip during control signal
testing - Check your ADC internal clock - is it fast
enough?
39Optimizing the Circuit
- Goal Record audio to your specs
- Storage is limited
- 131,072 sites in RAM (217)
- Acquisition speed is limited
- ADC internal clock must make about 72 cycles per
conversion - High speed high bandwidth
- High speed short capture time
40Optimize the Circuit
- You have a design goal for how you want your
circuit to function - If necessary to meet this goal
- Adjust the ADC internal clock frequency
- Adjust the on-board (555) clock
41Test the Circuit
- Display analog input (sine or ramp) and analog
output on scope - During the RAM WRITE cycle, the data on the bus
comes from the ADC - The DAC automatically converts it back to analog.
- At low frequencies, the DAC output should be
identical to the analog input
42Test the Circuit
- Display analog input (sine or ramp) and analog
output on scope - During the RAM READ cycle, the data on the bus
comes from the RAM - The DAC automatically converts it back to analog
- The DAC output should be identical to the analog
input of the previous acquisition cycle
43Test the Circuit
- Note the length of the acquisition (WRITE) cycle.
Does it equal 131,072 times the period of the
on-board clock? - Note the length of the READ cycle. Does it equal
131,072 times the period of the on-board clock? - If you want to see if the circuit is really
working, pull the RAM chip - Your output should be 0 during the READ cycle
44Experimental Results
45Deliverables
- Test 1 - Bandwidth
- Analog in, analog out
- Determine failure frequency
- A (Goal - Measured)/Goal
- A 0 (measured exceeds goal) 20 pts
- 0.95 A lt 1 18 pts
- 0.90 A lt 0.95 16 pts
- A lt 0.90 14 pts
46Deliverables
- Test 2 - Address Generator
- Working 17 bits 20 pts
- Working 17 bits, novel design 22 pts
- Working 16 bits 16 pts
- lt 16 bits 10 pts
47Deliverables
- Test 3 - RAM/ADC Control
- Working and in sync 20 pts
- Working not in sync 15 pts
- Not working 10 pts
48Deliverables
- Test 4 - Timing
- ADC internal clock period
- INTR period
- 555 timer period
- Record time
- Playback time
49Deliverables
- Test 4 - Timing
- For record time
- R (Calculated - Measured)/Calculated
- If R 0.9 10 pts
- If R lt 0.9 5 pts
50Deliverables
- Test 5 - Playback
- Is DAC output from stored data?
- Yes 20 pts
- No 10 pts
51Deliverables
- Test 6 - Construction
- Has the circuit been constructed neatly and with
a reasonable floorplan? - 0 to 10 pts
52Deliverables
- Test 7 - Return Board
- Has the circuit been returned in good condition?
- Good Condition multiplier 1.0
- Damaged multiplier 0.8
- Not Returned multiplier 0.0
53Deliverables
- Write up your control design
- Design criteria
- what were the specs you wanted
- sketch the desired output waveforms
- Sketch the control schematic
- Show any equations used, and define terms if
necessary
54Deliverables
- Write up your control design
- Discuss what changes were made to the circuit to
optimize performance - How effective were they?
- Document the performance change
55Deliverables
- Have your circuit functionality verified
- Comment on your observations and provide
conclusions on the entire experiment - Any improvements to this Step?
- Any improvement to the lab course?
- Yes, we do have class next week
56Quiz Next Week
- ADC operation
- Sampling rate vs internal clock
- Resolution
- DAC
- Resolution
- Wire Wrapping
- Basic Instrument Operation
- Quiz will be in Bossone 303 starting at 6pm and
ending at 645pm promptly, no exceptions