ION BEAM ANALYSIS

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ION BEAM ANALYSIS

• Madalina BADEA1
• Daniela Adriana LACATUS1
• Alin Razvan PARASCHIV1
• Katarzyna ZIELINSKA2
• Supervisor Alexander Pavlovich KOBZEV
• 1 Research Center for Atomic Physics and
  Astrophysics,Faculty of Physics, University of
  Bucharest, Bucharest, Romania
• 2 Nicolaus Copernicus University, Poland

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Overview
Ion Beam Analysis (IBA) is based on the
interaction, at both the atomic and the nuclear
level, between accelerated charged particles and
the bombarded material. When a charged particle
moving at high speed strikes a material, it
interacts with the electrons and nuclei of the
material atoms, slows down and possibly deviates
from its initial trajectory. This can lead to the
emission of particles or radiation whose energy
is characteristic of the elements which
constitute the sample material.
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Van de Graaff Accelerator
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Van de Graaff Accelerator

• Parameters of the EG-5 Accelerator
• Energy region 0.9 3.5 MeV
• Beam intensity 30 µA for H, 10 µA for He
• Energy spread lt500 eV
• Precision of energy 2 keV
• Number of beam lines 6

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Ion beam techniques
TECHNIQUE ION BEAM SIGNAL DETECTED
RBS (Rutherford Backscattering Spectrometry) 4He, H elastically scattered ions
ERD (Elastic Recoil Detection) 4He recoiled target nuclei
PIXE (Particle-induced X-ray Emission) H X-rays
NRA (Nuclear Reaction Analysis) H, 4He prompt product particles or gamma-rays
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RBS (Rutherford Backscattering Spectrometry)
RBS demonstrates the electrostatic repulsion
between high energy incident ions and target
nuclei. The specimen is bombarded with a
monoenergetic beam of 4He particles and the
backscattered particles are detected.
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Equations RBS
The kinematic factor
 
The differential cross-section of the solid angle
unit
 
Energy loss
 
Channel energy thickness
 
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RBS (Rutherford Backscattering Spectrometry)
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RBS (Rutherford Backscattering Spectrometry)
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RBS (Rutherford Backscattering Spectrometry)
Thickness Element concentrations (at.) Element concentrations (at.) Element concentrations (at.) Element concentrations (at.) Element concentrations (at.)
nm Cu O C Fe Si
26.30 55.00 20.00 25.00 0.00 0.00
32.9 0.00 0.00 0.00 90.00 0.00
18.6 90.00 10.00 0.00 0.00 0.00
37.1 0.00 10.00 0.00 90.00 0.00
18.6 90.00 10.00 0.00 0.00 0.00
40.4 0.00 5.00 0.00 85.00 10.00
18083.2 0.00 0.00 0.00 0.00 100.00
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NRA (Nuclear Reaction Analysis)
NRA (Nuclear Reaction Analysis) is based on
nuclear reactions and the analysis is performed
with charged particles. NRA has demonstrated its
usefulness in the study of the oxidation and
deposition of hydrocarbon residue on metallic
surfaces.
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ERD (Elastic Recoil Detection)
ERD is a technique for a quantitative analysis of
light elements in solids. Heavy ions collide with
a sample and atoms (H, He) are ejected from the
sample. The incident energetic ions typically
have MeV of energy, enough to kick out the atoms
being struck. For ERD, the mass of the incident
particle must be greater than that of the target
nucleus.
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Setup
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ERD (Elastic Recoil Detection)
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PIXE (Particle-induced X-ray Emission)
Particle-induced X-ray emission or proton-induced
X-ray emission (PIXE) is a technique used in the
determining of the elemental make-up of a
material or sample. When a material is exposed to
an ion beam, atomic interactions occur that give
off EM radiation of wavelengths in the x-ray part
of the electromagnetic spectrum specific to an
element. PIXE is a powerful yet non-destructive
elemental analysis technique now used routinely
in different fields of research.
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PIXE (Particle-induced X-ray Emission)
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PIXE (Particle-induced X-ray Emission)
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PIXE (Particle-induced X-ray Emission)
Element Concentration At. Method Element Concentration At. Method
C 41 RBS K 0.1 PIXE
N 20.5 RBS Ca 0.53 RBS
O 28 RBS Mn 0.007 PIXE
F 2.6 RBS Fe 0.14 RBS
Na 2.5 RBS Cu 0.002 PIXE
Mg 1.3 RBS Zn 0.01 PIXE
Al 1.3 RBS As 0.001 PIXE
Si 1.8 PIXE Sr 0.0006 PIXE
S 0.2 RBS Zr 0.005 PIXE
Cl 0.01 PIXE Ba 0.01 PIXE
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Conclusions

• Non-destructive methods
• Depths profile of elements from H to heavier
  using relatively low energies (1-3 MeV)
• Thickness from 1015-1019 at/cm2
• High sensitivity of measurement (precision of 5
  concentration of heavy and 10 for lighter in the
  case of RBS NRA precision for lighter of 1)
• PIXE exact determination of elements present in
  sample with extremely high accuracy
• Applicable in different fields of research

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THANK YOU FOR YOUR ATTENTION !