Title: IC ProcessingTechnology
1IC ProcessingTechnology
- Hacettepe Universitesi
- Elektrik ve Elektronik Mühendisligi Böümü
- Ankara
2Silikon Yapimi
3Silikon olusumu
4Silikondan diea
5Modern MOS tasarim
6MOS üretim kisaca
7MOS Fabrikasyon
- CMOS transistors are fabricated on silicon wafer
- Lithography process similar to printing press
- On each step, different materials are deposited
or etched
8Photo-Lithographic Süreç
oxidation
Optical mask
stepper exposure
photoresist coating
photoresist
removal (ashing)
Photoresist developmen
acid etch
Process step
spin, rinse, dry
Typical operations in a single photolithographic
cycle (from Fullman).
9Inverter Mask Set
- Transistors and wires are defined by masks
- Cross-section taken along dashed line
10Detailed Mask Views
- Six masks
- n-well
- Polysilicon
- n diffusion
- p diffusion
- Contact
- Metal
11Fabrication Steps
- Start with blank wafer
- Build inverter from the bottom up
- First step will be to form the n-well
- Cover wafer with protective layer of SiO2 (oxide)
- Remove layer where n-well should be built
- Implant or diffuse n dopants into exposed wafer
- Strip off SiO2
12Oxidation
- Grow SiO2 on top of Si wafer
- 900 1200 C with H2O or O2 in oxidation furnace
13Oxidation
14Photoresist
- Spin on photoresist
- Photoresist is a light-sensitive organic polymer
- Softens where exposed to light
15Lithography
- Expose photoresist through n-well mask
- Strip off exposed photoresist
16Lithography Sequence
17SiO2 sekillendirme
Chemical or plasma
etch
Si-substrate
Hardened resist
SiO
2
(a) Silicon base material
Si-substrate
Photoresist
SiO
2
(d) After development and etching of resist,
chemical or plasma etch of SiO
2
Si-substrate
Hardened resist
(b) After oxidation and deposition
SiO
of negative photoresist
2
Si-substrate
UV-light
Patterned
(e) After etching
optical mask
Exposed resist
SiO
2
Si-substrate
Si-substrate
(f) Final result after removal of resist
(c) Stepper exposure
18Etch
- Etch oxide with hydrofluoric acid (HF)
- Seeps through skin and eats bone nasty stuff!!!
- Only attacks oxide where resist has been exposed
19Strip Photoresist
- Strip off remaining photoresist
- Use mixture of acids called piranah etch
- Necessary so resist doesnt melt in next step
20n-well
- n-well is formed with diffusion or ion
implantation - Diffusion
- Place wafer in furnace with arsenic gas
- Heat until As atoms diffuse into exposed Si
- Ion Implanatation
- Blast wafer with beam of As ions
- Ions blocked by SiO2, only enter exposed Si
21n-well
22Strip Oxide
- Strip off the remaining oxide using HF
- Back to bare wafer with n-well
- Subsequent steps involve similar series of steps
23Polysilicon
- Deposit very thin layer of gate oxide
- lt 20 Ã… (6-7 atomic layers)
- Chemical Vapor Deposition (CVD) of silicon layer
- Place wafer in furnace with Silane gas (SiH4)
- Forms many small crystals called polysilicon
- Heavily doped to be good conductor
24Polysilicon Patterning
- Use same lithography process to pattern
polysilicon
25Self-Aligned Process
- Use oxide and masking to expose where n dopants
should be diffused or implanted - N-diffusion forms nMOS source, drain, and n-well
contact
26N-diffusion
- Pattern oxide and form n regions
- Self-aligned process where gate blocks diffusion
- Polysilicon is better than metal for self-aligned
gates because it doesnt melt during later
processing
27N-diffusion cont.
- Historically dopants were diffused
- Usually ion implantation today
- But regions are still called diffusion
28N-diffusion cont.
- Strip off oxide to complete patterning step
29P-Diffusion
- Similar set of steps form p diffusion regions
for pMOS source and drain and substrate contact
30Channel Stop Implant
31Channeling in Ion Implantation
32Self Aligned Structure
33Back end processing
34Contacts
- Now we need to wire together the devices
- Cover chip with thick field oxide
- Etch oxide where contact cuts are needed
35Metallization
- Sputter on aluminum over whole wafer
- Pattern to remove excess metal, leaving wires
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37Active Spiking
38Inverter Cross-section
- Typically use p-type substrate for nMOS
transistors - Requires n-well for body of pMOS transistors
39Well and Substrate Taps
- Substrate must be tied to GND and n-well to VDD
- Metal to lightly-doped semiconductor forms poor
connection called Schottky Diode - Use heavily doped well and substrate contacts /
taps
40Layout
- Chips are specified with set of masks
- Minimum dimensions of masks determine transistor
size (and hence speed, cost, and power) - Feature size f distance between source and
drain - Set by minimum width of polysilicon
- Feature size improves 30 every 3 years or so
- Normalize for feature size when describing design
rules - Express rules in terms of l f/2
- E.g. l 0.3 mm in 0.6 mm process
41Simplified CMOS Inverter Process
cut line
p well
42P-Well Mask
43Active Mask
44Poly Mask
45P Select Mask
46N Select Mask
47Contact Mask
48Metal Mask
49Advanced Metallization
50Simplified Design Rules
- Conservative rules to get you started
51Summary
- MOS Transistors are stack of gate, oxide, silicon
- Can be viewed as electrically controlled switches
- Build logic gates out of switches
- Draw masks to specify layout of transistors
- Now you know everything necessary to start
designing schematics and layout for a simple chip!
52Design Rules
533D Perspective
Polysilicon
Aluminum
54Design Rules
- Interface between designer and process engineer
- Guidelines for constructing process masks
- Unit dimension Minimum line width
- scalable design rules lambda parameter
- absolute dimensions (micron rules)
55Olasi Hatalar
- Maske hizalama hatasi
- Toz
- Proses parametereleri
- Engebeler
56CMOS Process Layers
57Poly Kontakt Diff Kontakt
58Intra-Layer Design Rules
4
Metal2
3
59Inter-Layer Design Rule Origins
- Transistor rules transistor formed by overlap
of active and poly layers
Transistors
Catastrophic error
Unrelated Poly Diffusion
Thinner diffusion, but still working
60Inter-Layer Design Rule Origins,
M1 contact to p-diffusion
M1 contact to n-diffusion
Contact Mask
M1 contact to poly
Mx contact to My
Via Masks
mask misaligned
0.3
both materials
Contact 0.58 x 0.58
0.14
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62Transistor Layout
63Metal baglantilari
64Via metal baglantilar
65Select Layer
66P diff n diff arasi
67CMOS Inverter Layout
68Layout Editor
69Design Rule Checker DRC
poly_not_fet to all_diff minimum spacing 0.14
um.
70Hatali DRC sonuçlari
71Kullanilan yazilim Mentor Graphics IC programi
72Passive Devices
73 74(No Transcript)
75Passive Devices
76Passive Devices
77Capacitor mask necessity
78Issues with poly sub cap
79Simplest capacitor
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81Paralel Plate and Fringe Cap
82Latch up
83Antenna Effect
84Analog Layout Techniques
85Folding
86 87Symmetry
88Symmetry
89Paketleme
90Paketleme Gereksinimleri
- Electrical Low parasitics
- Mechanical Reliable and robust
- Thermal Efficient heat removal
- Economical Cheap
91Bonding - Baglanti Teknikleri
92Tape-Automated Bonding (TAB)
93Flip-Chip Bonding
94Package-to-Board Interconnect
95Package Parameters
96Packages
- Package functions
- Electrical connection of signals and power from
chip to board - Little delay or distortion
- Mechanical connection of chip to board
- Removes heat produced on chip
- Protects chip from mechanical damage
- Compatible with thermal expansion
- Inexpensive to manufacture and test
97Package Types
98Package Types
- Through-hole vs. surface mount
99Multichip Modules
- Pentium Pro
- Fast connection of CPU to cache
- Expensive,
100Chip-to-Package Bonding
- Traditionally, chip is surrounded by pad frame
- Metal pads on 100 200 mm pitch
- Gold bond wires attach pads to package
- Lead frame distributes signals in package
- Metal heat spreader helps with cooling
101Heat Dissipation
- 60 W light bulb has surface area of 120 cm2
- Itanium 2 die dissipates 130 W over 4 cm2
- Chips have enormous power densities
- Cooling is a serious challenge
- Package spreads heat to larger surface area
- Heat sinks may increase surface area further
- Fans increase airflow rate over surface area
- Liquid cooling used in extreme cases ()
102Input / Output
- Input/Output System functions
- Communicate between chip and external world
- Drive large capacitance off chip
- Operate at compatible voltage levels
- Provide adequate bandwidth
- Limit slew rates to control di/dt noise
- Protect chip against electrostatic discharge
- Use small number of pins (low cost)
103I/O Pad Design
- Pad types
- VDD / GND
- Output
- Input
- Bidirectional
- Analog
104Output Pads
- Drive large off-chip loads (2 50 pF)
- With suitable rise/fall times
- Requires chain of successively larger buffers
- Guard rings to protect against latchup
- Noise below GND injects charge into substrate
- Large nMOS output transistor
- p inner guard ring
- n outer guard ring
- In n-well
105Input Pads
- Level conversion
- Higher or lower off-chip V
- May need thick oxide gates
- Noise filtering
- Schmitt trigger
- Hysteresis changes VIH, VIL
- Protection against electrostatic discharge
106ESD Protection
- Static electricity builds up on your body
- Shock delivered to a chip can fry thin gates
- Must dissipate this energy in protection circuits
before it reaches the gates - ESD protection circuits
- Current limiting resistor
- Diode clamps
- ESD testing
- Human body model
- Views human as charged capacitor
107Bidirectional Pads
- Combine input and output pad
- Need tristate driver on output
- Use enable signal to set direction
- Optimized tristate avoids huge series transistors
108Analog Pads
- Pass analog voltages directly in or out of chip
- No buffering
- Protection circuits must not distort voltages
109MOSIS I/O Pad
- 1.6 mm two-metal process
- Protection resistors
- Protection diodes
- Guard rings
- Field oxide clamps
110Multi-Chip Modules