Title: Multianvil at the NSLS
1Multi-anvil at the NSLS
Michael Vaughan Liping Wang Jiuhua Chen Baosheng
Li Carey Koleda Bill Huebsch Ken Baldwin Chris
Young
2Personnel
- Michael Vaughan
- Liping Wang
- Jiuhua Chen
- Baosheng Li
- Carey Koleda
- Bill Huebsch
- Ken Baldwin
- Chris Young
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4Cost breakdown
- Stony Brook University 50,000
- CHiPR 160,000
- NSLS 1,440,000
5High Pressure x-ray Studies
Details of SAM 85
High P High T large volume Energy dispersive
diffraction Angle dispersive diffraction Sample
length Ultrasonic interferrometry
6Deformation-DIA
- Deformation device to operate to 12 GPa and 2000K
- Measure stress, strain rate, up to 50 strain
- First device built by Livermore (Durham)
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9Rotational Drickamer Cell, Yale group
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11Two detector strain measure
etot ev eh etot(111) ?? S44/2etot(100)
?? (S11 S12)
12Li Li et al, 2004
13Li Li, 2003
14Stress state in NaCl
Max. T500 ?C
Stress, kbar
RT
Kung et al, 2004
15Study of Molten Materials under High Pressures
and Temperatures
- Opportunities at
- Synchrotron X-ray Beamlines
16Bulk Properties of Melts
- Viscosity
- Density
- Acoustic Velocity
17Jiuhua Chen
18open press
1.7 GPa
4.0 GPa
4.0 GPa 1300oC
Jiuhua Chen
19Ultrasonic Velocity Measurements
Buffer Rod
Sample
Transducer
- Reflection/Transmission Interferometry
- Resonance Ultrasonic Spectroscopy
- GHz Ultrasonic Interferometry
- Precision 10-5
Baosheng Li
20Input Signal in Frequency and Time Domain
Baosheng Li
21End of Run
3 GPa 400C
Baosheng Li
22Solid
Melts
Baosheng Li
23Bi (III)
Solids
Melts
Bi (I)
Baosheng Li
24Material Sciences at X17B2 of NSLS
- Phase equilibria at high P and T (e.g., Si, Ge,
Zr, Hf) - Thermal equations of state (e.g., Si, Ge, Zr, Hf,
Os, U) - Reaction kinetics (e.g., Si melts diamond
SiC) - Strength of nano materials (Si, SiC, diamond)
- Rheology at high P and T (e.g., Ta)
Phase diagram of the elemental Zr
Voronin et al. (2003)
Zhang et al. (2004)