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Title: Epitaxial Deposition


1
Epitaxial Deposition
  • M.H.Nemati
  • Sabanci University

2
Outline
  • Introduction
  • Mechanism of epitaxial growth
  • Methods of epitaxial deposition
  • Applications of epitaxial layers

3
Epitaxial Growth
  • Deposition of a layer on a substrate which
    matches the crystalline order of the substrate
  • Homoepitaxy
  • Growth of a layer of the same material as the
    substrate
  • Si on Si
  • Heteroepitaxy
  • Growth of a layer of a different material than
    the substrate
  • GaAs on Si

Ordered, crystalline growth NOT epitaxial
Epitaxial growth
4
Motivation
  • Epitaxial growth is useful for applications that
    place stringent demands on a deposited layer
  • High purity
  • Low defect density
  • Abrupt interfaces
  • Controlled doping profiles
  • High repeatability and uniformity
  • Safe, efficient operation
  • Can create clean, fresh surface for device
    fabrication

5
General Epitaxial Deposition Requirements
  • Surface preparation
  • Clean surface needed
  • Defects of surface duplicated in epitaxial layer
  • Hydrogen passivation of surface with water/HF
  • Surface mobility
  • High temperature required ?heated substrate
  • Epitaxial temperature exists, above which
    deposition is ordered
  • Species need to be able to move into correct
    crystallographic location
  • Relatively slow growth rates result
  • Ex. 0.4 to 4 nm/min., SiGe on Si

6
General Scheme
7
Thermodynamics
  • Specific thermodynamics varies by process
  • Chemical potentials
  • Driving force
  • Process involves High temperature process is mass
    transport controlled, not very sensitive to
    temperature changes
  • Close enough to equilibrium that chemical forces
    that drive growth are minimized to avoid creation
    of defects and allow for correct ordering
  • Sufficient energy and time for adsorbed species
    to reach their lowest energy state, duplicating
    the crystal lattice structure
  • Thermodynamic calculations allow the
    determination of solid composition based on
    growth temperature and source composition

8
Kinetics
  • Growth rate controlled by kinetic considerations
  • Mass transport of reactants to surface
  • Reactions in liquid or gas
  • Reactions at surface
  • Physical processes on surface
  • Nature and motion of step growth
  • Controlling factor in ordering
  • Specific reactions depend greatly on method
    employed

9
Methods of epitaxial deposition
  • Vapor Phase Epitaxy
  • Liquid Phase Epitaxy
  • Molecular Beam Epitaxy

10
Vapor Phase Epitaxy
  • Specific form of chemical vapor deposition (CVD)
  • Reactants introduced as gases
  • Material to be deposited bound to ligands
  • Ligands dissociate, allowing desired chemistry to
    reach surface
  • Some desorption, but most adsorbed atoms find
    proper crystallographic position
  • Example Deposition of silicon
  • SiCl4(g) 2H2(g) ? Si(s) 4HCl(g),
  • SiCl4 introduced with hydrogen
  • Forms silicon and HCl gas
  • SiH4 breaks via thermal decomposition
  • Reversible and possible to do negative (etching)

11
Precursors for VPE
  • Must be sufficiently volatile to allow acceptable
    growth rates
  • Heating to desired T must result in pyrolysis
  • Less hazardous chemicals preferable
  • Arsine highly toxic use t-butyl arsine instead
  • VPE techniques distinguished by precursors used

12
Liquid Phase Epitaxy
  • Reactants are dissolved in a molten solvent at
    high temperature
  • Substrate dipped into solution while the
    temperature is held constant
  • Example SiGe on Si
  • Bismuth used as solvent
  • Temperature held at 800C
  • High quality layer
  • Fast, inexpensive
  • Not ideal for large area layers or abrupt
    interfaces
  • Thermodynamic driving force relatively very low

13
Molecular Beam Epitaxy
  • Very promising technique
  • Beams created by evaporating solid source in UHV
  • Evaporated beam of particle travel through very
    high vaccum and then condense to shape the layer
  • Doping is possible to by adding impurity to
    source gas by(e.g arsine and phosphors)
  • Deposition rate is the most important aspect of
    MBE
  • Thickness of each layer can be controlled to that
    of a single atom
  • development of structures where the electrons can
    be confined in space, giving quantum wells or
    even quantum dots
  • Such layers are now a critical part of many
    modern semiconductor devices, including
    semiconductor lasers and light-emitting diodes.

14
Doping of Epitaxial Layers
  • Incorporate dopants during deposition(advantages)
  • Theoretically abrupt dopant distribution
  • Add impurities to gas during deposition
  • Arsine, phosphine, and diborane common
  • Low thermal budget results(disadvantages)
  • High T treatment results in diffusion of dopant
    into substrate
  • Cant independently control dopant profile and
    dopant concentration

15
Applications
  • Engineered wafers
  • Clean, flat layer on top of less ideal Si
    substrate
  • On top of SOI structures
  • Ex. Silicon on sapphire
  • Higher purity layer on lower quality substrate
    (SiC)
  • In CMOS structures
  • Layers of different doping
  • Ex. p- layer on top of p substrate to avoid
    latch-up

16
More applications
  • Bipolar Transistor
  • Needed to produce buried layer
  • III-V Devices
  • Interface quality key
  • Heterojunction Bipolar Transistor
  • LED
  • Laser

http//www.search.com/reference/Bipolar_junction_t
ransistor
http//www.veeco.com/library/elements/images/hbt.j
pg
17
Summary
  • Deposition continues crystal structure
  • Creates clean, abrupt interfaces and high quality
    surfaces
  • High temperature, clean surface required
  • Vapor phase epitaxy a major method of deposition
  • Epitaxial layers used in highest quality wafers
  • Very important in III-V semiconductor production

18
References
  • P. O. Hansson, J. H. Werner, L. Tapfer, L. P.
    Tilly, and E. Bauser, Journal of Applied Physics,
    68 (5), 2158-2163 (1990).
  • G. B. Stringfellow, Journal of Crystal Growth,
    115, 1-11 (1991).
  • S. M. Gates, Journal of Physical Chemistry, 96,
    10439-10443 (1992).
  • C. Chatillon and J. Emery, Journal of Crystal
    Growth, 129, 312-320 (1993).
  • M. A. Herman, Thin Solid Films, 267, 1-14 (1995).
  • D. L. Harame et al, IEEE Transactions on Electron
    Devices, 42 (3), 455-468 (1995).
  • G. H. Gilmer, H. Huang, and C. Roland,
    Computational Materials Science, 12, 354-380
    (1998).
  • B. Ferrand, B. Chambaz, and M. Couchaud, Optical
    Materials, 11, 101-114 (1999).
  • R. C. Cammarata, K. Sieradzki, and F. Spaepen,
    Journal of Applied Physics, 87 (3), 1227-1234
    (2000).
  • R. C. Jaeger, Introduction to Microelectronic
    Fabrication, 141-148 (2002).
  • R. C. Cammarata and K. Sieradzki, Journal of
    Applied Mechanics, 69, 415-418 (2002).
  • A. N. Larsen, Materials Science in Semiconductor
    Processing, 9, 454-459 (2006).
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