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The George Washington University School of Engineering and Applied Science Department of Electrical

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Gate Delay is measured from the 50% point on the input signal to the 50% point on the output. ... Is the rise time and fall time of each gate same, if no then why? ... – PowerPoint PPT presentation

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Title: The George Washington University School of Engineering and Applied Science Department of Electrical


1
The George Washington UniversitySchool of
Engineering and Applied ScienceDepartment of
Electrical and Computer Engineering
  • ECE122 30
  • Lab 2 NAND gate design using CMOS

Jason Woytowich Ritu Bajpai September 15, 2006
2
Gate Delay
  • Gate Delay is the amount of time it takes a
    change of input to appear as a change on the
    output.
  • Gate Delay is measured from the 50 point on the
    input signal to the 50 point on the output.

Input
Output
tp
3
Gate Delay
  • We also characterize the transition time of a
    signal. In this case we use the 10 and 90
    points.

90
10
tpLH
90
10
tpHL
4
Gate Delay
  • The load capacitance severely affects the gate
    delay.

Inv1
Inv2
5
SCMOS Library
  • Scalable CMOS Library
  • Contains (just about) every digital logic
    component you need to build anything.
  • And, Or, Xor, Nand, Nor, Xnor, Inv, Buf,
    Flip-flops, Pads, Capacitors, Resistors
  • Each of these components has a specific layout
    mapped to it.
  • It does not layout individual transistors.

6
Objective for our simulation
  • Create a NAND gate using p and n MOSFET and
    testing its performance.
  • Testing the performance of a NAND gate form SCMOS
    library.
  • Comparing the performance of the two NAND gates.

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Analysis/Result
  • Record the rise time and fall time of both the
    NAND gates.
  • Is the rise time and fall time of each gate same,
    if no then why?
  • Is the rise time and fall time of both the gates
    similar to each other, if no then what could be
    the probable reasons for the difference?

19
Analysis/Result
  • Repeat the simulation to create a NOR gate using
    CMOS.
  • In the test circuit, replace your NOR gate by the
    NOR gate in SCMOS library.
  • Record the waveform in the two cases and make the
    similar observations as you made for NAND gate.
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