Title: Analysis and Design of LowEnergy FlipFlops Dejan Markovic, Prof' Robert Brodersen, Prof' Borivoje Ni
1 Analysis and Design of Low-Energy
Flip-Flops Dejan Markovic, Prof.
Robert Brodersen, Prof. Borivoje Nikolic
- Energy per transition (0-0, 0-1, 1-0, 1-1)
- Clocked nodes
- Internal (non-clocked) nodes
- External load
- In low-energy, constant throughput systems,
supply voltage is often scaled down to minimize
energy consumption - Energy consumption of the clocking sub-system is
about 30 - 60 of the total system energy - Clock Distribution Network
- Buffers
- Wires
- Clocked Storage Elements
- The design of the clocking subsystem has to be
resistant to noise and timing failures for robust
circuit operation - Variety of flip-flop design techniques
- Conventional master-slave latch-pairs and
pulse-triggered latches - Other techniques, often derived from the
conventional techniques, use double-edge-triggerin
g, reduced-swing clock, or internal clock gating
- Basic metrics
- tCLK-Q
- Setup
- Hold
- System-level
- D tCLK-Q Setup
- R tCLK-Q - Hold
EAVG ?0-0E00 ?0-1E01 ?1-0E10
?1-1E11
- E ?CswVswingVDD
- Reduce each term in the product expression
- delay is overlooked
- Circuit sizing that yields an optimal EDP
- Minimize clocked capacitances to compensate for
increased switching activity - Size circuits to optimally drive output load
equivalent to 4 standard loads - Sizing methodology based on Logical Effort
- Quantifies driving capability of a logic gate
relative to a standard inverter - Correlation can be established between transistor
sizes and computed logical effort - Difficult to size flip-flops to minimize EDP
directly ? derive limit cases of minimizing delay
for given energy - Limit to minimization of transistor sizes is set
by the substrate noise immunity - Key to minimizing circuit speed is active circuit
that is responsible for flip-flops performance
- Pulse-Triggered are fastest but exhibit small
internal race immunity - TGFF suitable for large-scale designs with high
clock skew - Gating introduces big penalty in delay
a) Clock-on-Demand FF COD-FF (Kuroda, ISSCC00)
b) Transmission-Gate FF with Internal
Gating GTGFF
- Flip-flop characterization metrics that offer
novel insights into flip-flop behavior at both
the circuit and system levels are presented - Systematic approach to the transistor sizing
issue completes the basic principles in
low-energy flip-flop design for voltage-scaled
digital systems - Internal clock gating is effective for low input
switching probabilities, when added to the TGFF - TGFF is the best choice for low-energy digital
design - good energy-delay trade-off
- good race margin
- good noise robustness
- small energy required to drive its data and clock
inputs
The key trade-off in energy saving capabilities
of FFs w/ internal clock gating is the balance
between the energy overhead in the internal
clock gating and energy savings in clocked
nodes Internal clock gating is effective when
the clocked transistors are large and/or when
data activity rates are low
- D and R show very little variation with clock
slope - Clock skew specification is a linear function
of the mismatch in - clock slopes of two back-to-back connected
flip-flops
Increase in size of clocked transistors changes
energy saving capability of FFs with internal
clock gating