Diapositiva 1

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ALICE - SDD Roma Physicists S. Di Liberto M.
A. Mazzoni F. Meddi G. M. Urciuoli Technic
ians A. Ruggieri S. Sestito Students F.
Maccioni M. Cogliolo Guest Engin. R.
Arteche Diaz (CEADEN, CUBA) ?
Until February 2006
? S.D.D. - F.E.E. PASCAL and AMBRA ASICs
validation.
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http//www.lecc2005.uni-hd.de/
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ROMA?WSI?TORINO status 1of2 _at_ 10october2005

mean
Data on 1 wafer broken by WSI not included
1.8 Wafer / Month
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ROMA?WSI?TORINO status 2of2 _at_ 10october2005
mean
1 Wafer 128 Pascal 110 Ambra GOOD
? DATABASE of measurements done on PascAm wafers
available also on web site http//www.roma1.inf
n.it/exp/alice/PascAm/
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SDD-FEE-ROMA measurement status _at_ 08november2005
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Conclusions
? The yield of GOOD chips from PasAm wafers is
stable. ? Before the end of november we
foresee to send to WSI for processing 3 more
tested PASCAM wafers reaching a total of 17
tested wafers. (The tested wafer damaged by WSI
is not included) ? We stay in line to reach 22
tested wafers by the end of february. ?
.......Testing is going on ........
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ADDENDUM details
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PASCAL measurements status _at_ 10june2005
Sent to WSI
MEAS GOOD GREY BAD
()
()
()
EU4GBCX 141 131 4 6 93
3 4 Y/1 EB4GADX 147 121 18
8 74 22 4
Y/2 EM4GC1X 142 125 14 3 88
10 2 Y/2 SK8MQHX 131 94 28
9 72 21 7
Y/2 SA8MT8X 145 139 2 4
96 1 3 Y/3 AXEQFNX 147
119 15 13 81 10 9
Y/3 AWEQ9ZX 145 125 14 6
86 10 4 Y/3
ASEQAKX 147 134 8 5 91
6 3 Y/4 ATEQAJX 146 127 8
11 87 5 8
Y/4 AMEQAQX 147 134 5 8 91
3 6 Y/4 TOTAL 1291
1128 98 65 87 8
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Eng. Run
Prod. Run
Data on wafer EB4GADX (Broken by WSI) are not
included in the TOTAL
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PASCAL measurements addendum _at_ 08november2005
Sent to WSI
MEAS GOOD GREY BAD
()
()
()
S98MSSX 147 133 6 8 91 4
5 Y/5 SG8MSKX AVEQAHX APEQF3X AOEQFSX 13
9 124 10 5 89 7 4
Y/6 AZEQFTX 147 134 10 3 91 7
2 Y/6 ALEQARX 147 133 5 9 91
3 6 Y/5 ATEQFZX 147 138
3 6 94 2 4
Y/5 AYEQFUX 147 132 7 8 90 5
5 A1EQFRX 147 134 11 2 91 8
1 TOTAL(Add.only) 1021 928 52 41 91
5 4
Prod. Run
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AMBRA measurements status _at_ 10june2005
Sent to WSI
MEAS GOOD GREY BAD
()
()
()
EU4GBCX 133 78 13 42 59
10 31 Y/1 EB4GADX 151 115 8
28 77 5 18
Y/2 EM4GC1X 150 129 10 11 86
7 7 Y/2 SK8MQHX 147 63 21
63 43 14 43
Y/2 SA8MT8X 147 111 16 20
75 11 14 Y/3 AXEQFNX 151 114
13 24 75 9 16
Y/3 AWEQ9ZX 151 109 10 32 72
7 21 Y/3 ASEQAKX 148 125 9
14 85 6 9
Y/4 ATEQAJX 148 101 28 19 68
19 13 Y/4 AMEQAQX 148 121 9
18 82 6 12
Y/4 TOTAL 1323 951 129 243
72 10 18
Eng. Run
Prod. Run
Data on wafer EB4GADX (Broken by WSI) are not
included in the TOTAL
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AMBRA measurements addendum _at_ 25october2005
Sent to WSI
MEAS GOOD GREY BAD
()
()
()
S98MSSX 148 104 21 23 70 14
16 Y/5 SG8MSKX AVEQAHX 148 128 7 13
86 5 9 APEQF3X 148 132 7
9 89 5
6 AOEQFSX 148 125 11 12 85 7
8 Y/6 AZEQFTX 148 119 11 18 81
7 12 Y/6 ALEQARX 148 124 9 15
84 6 10
Y/5 ATEQFZX 148 117 10 21 79 7
14 Y/5 AYEQFUX 148 104 16 28 70
11 19 A1EQFRX 148 127 10 11 86
7 7 TOTAL(Add.only) 1332
1080 102 150 81 8
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Prod. Run