Title: Lecture 19 MOS Amplifier Design
1Lecture 19MOS Amplifier Design
- Comparison of MOS and bipolar amps
- Current sources
- MOS single stage amplifiers
- Various amplifier types
- Summary
- Michael L. Bushnell
- CAIP Center and WINLAB
- ECE Dept., Rutgers U., Piscataway, NJ
2Discrete Component Audio Amp
3Typical CMOS OPAMP
4MOS Vs. Bipolar Amps
MOS Lower transconductance Higher differential
offsets in differential amps Infinite input
impedance Zero offset as switch Stores signal
voltage on monolithic C senses continuously and
non-destructively On-chip sample hold
Bipolar Finite input impedance Cannot do
that
5MOS Single Stage Amplifiers
6Source-Coupled Pair
- Fig 3.50
- Assume identical devices, neglect body effect
O/P resistance
7Equations
Cox W 2L
- Id1 mn (Vgs1 Vt)2
- ID2 mn (Vgs2 Vt)2
- DVi Vi1 Vi2
- Id common mode current
- DId differential current
- Solve quadratic to get
- DId mn (DVi)
Cox W 2L
Cox W 2L
2 Iss mn (Cox W / 2L)
- (DVi)2
8Concluding Equations
- Id Id1 Id2
- 2
- DId Id1 Id2
- Correct only if both transistors saturated
- DV
- Limiting input behavior when an input exceeds a
value - Excursion causing cutoff -- function of device
size, bias current - Behaves like bipolar emitter coupled pair with
degeneration resistors - Select to give desired I/P voltage range
ISS mn (Cox W / 2L)
9Differential I/P Voltage to Turn Off One
Transistor
- 2 (Vgs Vt) value when balanced
- Increase input range by
- Increasing bias current
- Increasing L
- Decreasing W
- Usually operate with (Vgs Vt) at several
hundred mV
10Differential Output Current Vs. Differential
Input Voltage
11Transconductance
d DId d DVi
)
(
- Gm
- Gm Iss (mn Cox W / L) gm1 gm2
- NOT independent of device size, as in bipolar case
DVi 0
(
d DId mn Cox W 2 Iss
- DVi2 d DVi 2L
mn (Cox W / 2L)
(
)
)
(
)
- mn Cox W DVi2
2L 2Iss -
(DVi)2 mn (Cox W
/ 2L))
(
)
12Input Offset Voltages
- Due to mismatches in
- Load resistor value
- Transistor W/L ratios
- Vts
- VOS VGS1 - VGS2
- Vt1 2 ID1
- mn Cox (W/L)1
- -- Vt2 2 ID2
- mn Cox (W/L)2
(
)
(
)
13Circuit of Input Offset Coupled Pair
14Equations
- DID ID1 ID2
- ID ID1 ID2
- 2
- D (W/L) (W/L)1 - (W/L)2
- W/L (W/L)1 (W/L)2
- 2
- DVt Vt1 Vt2
- Vt Vt1 Vt2
- 2
- DRL RL1 RL2
- RL RL1 RL2
- 2
15Differential Input Parameters
- VOS Differential input V needed to make
differential output V - exactly 0
- ID1 RL1 ID2 RL2
- Substitute, neglect higher-order terms, get
- VOS DVt (VGS Vt) - DRL D (W/L)
- 2
RL (W/L) - MOS Offset scales directly with VGS Vt
- Bipolar Mismatch terms multiplied by kT/q,
usually smaller than VGS Vt - MOS has higher VOS for same mismatch or process
gradient - Mismatch because ratio of bias current to
transconductance much lower than for bipolar
(
(
)
)
16Offset Improvement
- Operate MOS amp at low VGS
- I/gm affects slew rate for class A input stage
transient performance needs will limit I/gm as
well - New mismatch peculiar only to MOS
- Vt mismatch gives a constant offset that is bias
current independent - Strong function of process cleanliness
- Large centroid (common centroid) structures get
Vt mismatch distributions with s 2 mV
17MOSFET Current Sources
- Ratio of reference current to output current set
by device W/L ratios - Most accurate ratioing when devices have same L,
but different Ws - L varies substantially due to etching variations
- Important parameters
- Small-signal output resistance r0
- Voltage range over which output resistance is
maintained - Matching of current sources
18Equivalent Open-Circuit Voltage VThev ID-Source
Value
(
)
(
-1
-1
)
- r0 ID Leff d Cd
- VDS ID d VDS
- VThev r0 ID 1 d Cd VA
1 - Leff d VDS
l - Derivative is f (substrate doping, tox, gate
voltage) - Given a process and (VGS Vt), it is constant,
so L determines r0
(
-1
)
19Bob Widlar Current Source
20Behavior
- M2 stays in saturation as long as VGD lt - Vt
- Happens as long as VDS gt VDSsat (VGS Vt)
- If not true, transistor enters linear (triode)
region
21Current Source Behavior
22Cascode Current Sources
23Current Source Behavior
24Transistor Behavior
- Often need higher r0 values VThev to improve
amplifier voltage gain with higher r0 - Cascode current source can achieve this
- M2 shields M1 from voltage variations at O/P
terminal - R0 r02 (1 gm2 r01)
(12.29) - Increases r0, VThev by (1 gm2 r01) factor
- Get VThev of several thousand V
25Small-Signal Equivalent Circuit of Cascode
Current Source
26Accounting for Body Effect
- ix is test current source
- ix flows in r01, so Vsb2 ix r01
- vgs for dependent sources is ix r01,
- vx S voltages across r01 r02
- ix r01 r02 (ix gm2 (ix r01) gmb2
(ix r01)) - vx R0 r01 1 (gm2 gmb2) r02 r02
- ix
r01 - R0 r02 (1 (gm2 gmb2) r01) r01
- Body effect of M2 slightly increases R0
)
(
27Bipolar Vs. MOS Current Source
- Bipolar current source cannot get R0 gt b0 r0
-
2 - Due to base current in cascode transistor
- MOS can get arbitrarily high impedances with
more stacked cascode devices
28Double Cascode Current Source
29Cascode Current Source Problems
- Serious drawback of stacked devices
- Range of voltage swing at output node where both
transistors are saturated is smaller than for
simple current source - Minimum V across current source to saturate both
devices - (Vt 2 VDSSat)
- Make VDSSat small
- Use large W values in M1 M2
- Bias transistors at low current
- However, Vt represents significant loss of
voltage swing
30Refined Wilson Current Source
31Method
- Bias M1 at edge of saturation (EOS) with drain
one Vt more negative than gate - Use voltage level shifting device
32Alternate Method
- Use source follower M5 to provide voltage drop
- Fig 12.9b (old book)
33Method
- Reduce W/L of M4 by a factor of 4 to compensate
for (VGS Vt) of M5 - Now, need only have 2 VDSSat to saturate both
devices - However, MOSFETs have indistinct transitions from
triode to saturation regions - Must increase M1 drain voltage several hundred mV
to get desired R0 (Eqn. 12.29)
34Wilson Current Source
- Use negative feedback in M3 to increase output
resistance R0 by nearly same amount as the
cascode source - Fig 4.15
35Mathematics
- For large Vt, drain of M3 is higher than drain of
M2 by gt 1 V - Gives a large drain current mismatch between M2
M3 due to finite device output resistance - Therefore, need M4 as follows to equalize drain
voltages
36Transistor Mismatch Effects
- Mismatch in transistor pairs in current sources
- Determines offset voltage of differential
amplifiers with current source loads - Limits accuracy of digital-analog converters
(DACs) - Fig 4.52
37Assume Mismatched Transistors
(W/L)1
- ID1 mn Cox (VGS Vt1)2
- 2
- ID2 mn Cox (VGS Vt2)2
- 2
- Using average and difference equations
- ID ID1 ID2 DID ID1 ID2
- 2
- W (W/L)1 (W/L)2
- L 2
- DW W W
- L L L
- Vt Vt1 Vt2 DVt Vt1 Vt2
- 2
(W/L)2
)
(
)
(
-
2
1
38Mismatch Results
- Leads to DID - 2 DVt
- I (VGS Vt)
- Mismatch components
- Geometry dependent, fractional current mismatch
independent of bias - Dependent on Vt mismatch, increases as (VGS Vt)
reduces - Fixed threshold mismatch progressively becomes a
larger fraction of the total gate drive
39Mismatch Problem
- Vt has a significant gradient with distance
across the wafer - Must bias current sources from the same bias line
when they are physically far apart - Large errors result in current source outputs
if widely separated devices have small (VGS Vt)
40MOS Single-Stage Amplifiers
- Poly or diffused Rs have low R , so they must
be large when designed as an amplifier load - Instead, use a MOSFET as the passive amplifier
load - Common source amp with enhancement-mode load
- Fig 4.22 a
41Amplifier Load
42Common-Source Amplifier Load Characteristic
43Mathematical Analysis
- When Vi lt 1 Vt, M1 is off no current flow
- When Vi gt 1 Vt, M1 turns on, M1 M2 saturate
- Effective Z Seen looking into source terminal of
load - Roughly 1 /gm
- Same calculation as for Bipolar emitter follower
44Bipolar Emitter Follower
45Interesting Resistance Parameters
46Input Resistance Calculation
47Equations
- Apply known input current source ix
- RL current is i0 ix b0 ix
- vx ix rp RL (ix b0 ix)
- Ri vx rp RL (b0 1)
- ix
48Output Resistance Calculation
49Mathematics
- Apply known vx to output
- v1 - vx rp (voltage divider)
- rp RS
- ix vx gm vx
rp - rp Rs
rp Rs - 1 1 gm rp 1 gm rp
- R0 rp Rs rp Rs rp Rs
- b0 gm rp
- R0 vx rp Rs 1 Rs
- ix 1 b0 gm 1 b0
(
)
(
)
)
(
(
)
50Analysis
- For a MOSFET, Rs is not there, so
- R0 1 , gm k W (VGS Vt)
2 k W ID - gm L
L
D
G
51Analysis
- Neglect body effect and channel length modulation
- Av - gm1 (common source) - (W/L)1
- gm2 (load)
(W/L)2 - Limits Av to 10 to 20
- Use
- Broadband, low-gain amplifiers with high
linearity - Because Av independent of DC operating point
52Equivalent Model
53MOSFET Model
- Fig 4.23
- Incorporate body effect and r0
- Apply KCL at output node
- 0 - gm2 vs2 - vs2 - gmb2 vs2 - gm1 vgs1 -
vs2 - r02
r01 - v0 vs2 - gm1
- vi vgs1 g01 g02 gm2 gmb2
- g01 1 , g02 1
- r01 r02
- If gm2 gtgt g01, g02, or gmb2 get simpler equation
54Important Consideration
- Load remains saturated only if the output
terminal is 1 Vt below the power supply - Otherwise, the load cuts off malfunctions
- Amp cannot produce an output gt VDD - Vt
55CMOS Common Source Amp
- Connect a pFET as a current source
- Fig 12.19 (old book)
56Current Source Modeling
57Features
- Load does not suffer from body-effect degradation
of incremental resistance - Load remains saturated as long as drain more
negative than source by VDSSat VGS Vt - Both transistors saturated for almost the entire
range of output voltages - Better O/P voltage swing than nMOS inverter
- Provides high Av to within a few hundred mV of
either supply - If bias currents device sizes chosen so that
(VGS - Vt) of the two devices is in this range
58Circuit for Small-Signal Analysis
59Mathematics
- KCL at v0
- v0 gm1 vi v0 0
- r01 r02
- Collect terms
- v0 1 1 -gm1 vi
- r01 r02
- Av v0 - gm1 - gm1
- vi 1/r01 1/r02 g01
g02 - NB gm / g0 much lower for MOS than for bipolar
devices usually 10 - 40 X lower
(
)
60Assumptions
- Graduate channel approximation
- Constant mn in channel
- Strong inversion in saturation
- gm mn Cox W (VGS Vt) 2 ID
- Leff
VGS Vt - Cd width of depletion region between channel
end drain - g0 ID d Cd (output conductance)
- Leff d VDS
- gm 2 Leff d Cd
- g0 VGS Vt d VDS
-1
(
)
61Observations
- For constant ID, decreasing L or decreasing W
(VGS increases) decreases gain. - This determines transistor sizes needed to
achieve a given DC gain in a single stage - If device geometry kept constant,
- Av a 1 , since VGS Vt a ID
- ID
62Constant Gain in Subthreshold Current Range
63More Observations
- If device size bias current kept constant, gain
increases with substrate doping, because Cd
decreases with substrate doping - Open-circuit gain not degraded by reducing
transistor dimensions, - As long as tox and Cd and Cj are proportionally
reduced. - Must reduce gate drain voltages in proportion
to tox - Must increase substrate doping NA proportionately
to scale depletion region thickness - Analog circuits in scaled technologies limited
only by reduction in signal swing in dynamic
range, not by reductions in Av due to shorter
channels
64Source-Follower Amplifier
- Common drain configuration
- Used to lower impedance level in signal path
- Low frequency input Z very high
- Low frequency output Z 1 / gm
- Can also be used as a level shifter
- DC voltage drop between gate source can be made
large -- controlled by device geometry bias
current
65Source-Follower Amplifier
66Small-Signal Circuit
67Analysis
- Body effect makes threshold vary with v0 -- makes
gain lt 1 - KCL at current source nodes
- (vi - v0 ) gm - gmb (- v0)
- -v0 vBS
- vi gm v0 (gm gmb)
- v0 gm 1 1
- vi gm gmb 1 gmb / gm 1 C
- Use device in well as source follower and tie
well to source eliminates body effect, Av 1
68Summary
- Comparison of MOS and bipolar amps
- Current sources
- MOS single stage amplifiers
- Various amplifier types